Invention Grant
- Patent Title: Calibrating dual ADC acquisition system
- Patent Title (中): 校准双ADC采集系统
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Application No.: US14401738Application Date: 2013-05-16
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Publication No.: US09324545B2Publication Date: 2016-04-26
- Inventor: Martin Raymond Green , Jason Lee Wildgoose
- Applicant: Micromass UK Limited
- Applicant Address: GB Wilmslow
- Assignee: Micromass UK Limited
- Current Assignee: Micromass UK Limited
- Current Assignee Address: GB Wilmslow
- Agency: Diederiks & Whitelaw, PLC
- Priority: GB1208841.5 20120518
- International Application: PCT/GB2013/051270 WO 20130516
- International Announcement: WO2013/171500 WO 20131121
- Main IPC: H01J49/40
- IPC: H01J49/40 ; H01J49/02 ; H01J49/00 ; G01N30/72 ; H03M1/18 ; H03M1/08

Abstract:
A method of calibrating a dual gain ADC detector system is disclosed comprising passing a test signal through a high gain signal path to produce a first signal and passing a test signal through a low gain signal path to produce a second signal. A time difference between the first signal and the second signal is then determined. Data from the two ADCs is then stitched to form a composite mass spectrum without needing to correct the phase between the two ADCs.
Public/Granted literature
- US20150136971A1 Calibrating Dual ADC Acquisition System Public/Granted day:2015-05-21
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