Invention Grant
- Patent Title: Cross-section processing-and-observation method and cross-section processing-and-observation apparatus
- Patent Title (中): 截面加工观察方法和横截面加工观察装置
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Application No.: US14475046Application Date: 2014-09-02
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Publication No.: US09347896B2Publication Date: 2016-05-24
- Inventor: Xin Man , Tatsuya Asahata , Atsushi Uemoto
- Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
- Applicant Address: JP
- Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
- Current Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
- Current Assignee Address: JP
- Agency: Adams & Wilks
- Priority: JP2013-182586 20130903
- Main IPC: G01N23/225
- IPC: G01N23/225 ; H01J37/28 ; H01J37/305 ; G01N23/22 ; G01N23/20 ; G01N1/32

Abstract:
A cross-section processing-and-observation method, including a cross-section exposure step in which a sample is irradiated with a focused ion beam to expose a cross-section of the sample, and a cross-sectional image acquisition step in which the cross-section is irradiated with an electron beam to acquire a cross-sectional image of the cross-section. The cross-section exposure step and the cross-sectional image acquisition step are repeatedly performed along a predetermined direction of the sample at a setting interval to acquire multiple cross-sectional images of the sample. The method also includes a specific observation target detection step in which a predetermined specific observation target from the cross-sectional image acquired a the cross-sectional image acquisition step is detected. In the specific observation target detection step, after a predetermined specific observation target is detected, the setting interval of the cross-section exposure step is set to be shorter than that before the specific observation target is detected.
Public/Granted literature
- US20150060664A1 CROSS-SECTION PROCESSING-AND-OBSERVATION METHOD AND CROSS-SECTION PROCESSING-AND-OBSERVATION APPARATUS Public/Granted day:2015-03-05
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