Invention Grant
- Patent Title: Photon detector and process for detecting a single photon
- Patent Title (中): 光子探测器和检测单个光子的过程
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Application No.: US14547189Application Date: 2014-11-19
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Publication No.: US09401448B2Publication Date: 2016-07-26
- Inventor: Joshua C. Bienfang , Alan Migdall , Alessandro Restelli , William H. Farr
- Applicant: NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY , CALIFORNIA INSTITUTE OF TECHNOLOGY , UNIVERSITY OF MARYLAND, COLLEGE PARK
- Applicant Address: US MD Gaithersburg US CA Pasadena US MD College Park
- Assignee: NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY,CALIFORNIA INSTITUTE OF TECHNOLOGY,UNIVERSITY OF MARYLAND, COLLEGE PARK
- Current Assignee: NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY,CALIFORNIA INSTITUTE OF TECHNOLOGY,UNIVERSITY OF MARYLAND, COLLEGE PARK
- Current Assignee Address: US MD Gaithersburg US CA Pasadena US MD College Park
- Agent Toby D. Hain
- Main IPC: G01J1/00
- IPC: G01J1/00 ; H01L31/107
Abstract:
A photon detector article includes a photon detector configured to receive a primary waveform, the photon detector includes a multiplication region; a photon absorption region; a punch through voltage range; and a breakdown voltage; a source in electrical communication with the photon detector and configured to provide the primary waveform that includes a first voltage that is: less than a maximum value of the punch through voltage range, or effective to maintain a charge carrier in the absorption region; and a second voltage that is greater than the breakdown voltage; and a reference member in electrical communication with the source and configured to provide a reference waveform in response to receiving the primary waveform.
Public/Granted literature
- US20150076361A1 PHOTON DETECTOR AND PROCESS FOR DETECTING A SINGLE PHOTON Public/Granted day:2015-03-19
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