Invention Grant
- Patent Title: Microscope and a method for examining a sample using a microscope
- Patent Title (中): 显微镜和使用显微镜检查样品的方法
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Application No.: US14436919Application Date: 2013-09-27
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Publication No.: US09411141B2Publication Date: 2016-08-09
- Inventor: Frank Schreiber , Lioba Kuschel , Patric Mrawek , Bernd Widzgowski
- Applicant: LEICA MICROSYSTEMS CMS GMBH
- Applicant Address: DE Wetzlar
- Assignee: LEICA MICROSYSTEMS CMS GMBH
- Current Assignee: LEICA MICROSYSTEMS CMS GMBH
- Current Assignee Address: DE Wetzlar
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: DE102012219136 20121019
- International Application: PCT/DE2013/200195 WO 20130927
- International Announcement: WO2014/059983 WO 20140424
- Main IPC: G01J1/58
- IPC: G01J1/58 ; G01T1/10 ; G02B21/00 ; G02B21/16 ; G02B21/36 ; G01N21/64

Abstract:
A microscope, in particular a confocal microscope, has one or more lasers for generating an illumination light for a sample and has a detection device for detected signals from the sample. The detection device includes multiple adjustable spectral detection channels for the detection of predefinable different wavelength regions, and is configured and refined in the interest of particularly versatile utilization in consideration of a wide variety of phenomena, with particularly good separation of the phenomena in the context of investigation, in such a way that multiple temporal detection windows are respectively settable for the spectral detection channels.
Public/Granted literature
- US20150286040A1 MICROSCOPE AND A METHOD FOR EXAMINING A SAMPLE USING A MICROSCOPE Public/Granted day:2015-10-08
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