Invention Grant
- Patent Title: Measuring and adjusting system and method on uniformity of light intensity of light source
- Patent Title (中): 光源光强均匀度测量调节系统及方法
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Application No.: US14236264Application Date: 2013-06-18
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Publication No.: US09448108B2Publication Date: 2016-09-20
- Inventor: Yangkun Jing
- Applicant: HEFEI BOE OPTOELECTRONICS TECHNOLOGY CO., LTD. , BOE TECHNOLOGY GROUP CO., LTD.
- Applicant Address: CN Beijing
- Assignee: BOE Technology Group Co., Ltd.
- Current Assignee: BOE Technology Group Co., Ltd.
- Current Assignee Address: CN Beijing
- Agency: Banner & Witcoff, Ltd.
- Priority: CN201310081790 20130314
- International Application: PCT/CN2013/077405 WO 20130618
- International Announcement: WO2014/139231 WO 20140918
- Main IPC: G01J1/42
- IPC: G01J1/42 ; G01J1/44 ; G01J3/50 ; G01J1/16 ; G01J1/32 ; G01J1/50

Abstract:
A measuring and adjusting system and method on uniformity of light intensity of a light source. The measuring and adjusting system on uniformity of light intensity of a light source includes: a light intensity measuring plate; a light source, irradiating light to the light intensity measuring plate; an image acquisition module, acquiring color difference variation image on the light intensity measuring plate; a microprocessor, connected with the image acquisition module and connected with the light source through a control module, wherein the microprocessor compares the color difference variation image with colorimetric criterion internally stored, and obtains the light intensity distribution on the whole surface of the light intensity measuring plate, so as to judge the uniformity situation, and performs adjustment on the light intensity of the light source.
Public/Granted literature
- US20150330833A1 MEASURING AND ADJUSTING SYSTEM AND METHOD ON UNIFORMITY OF LIGHT INTENSITY OF LIGHT SOURCE Public/Granted day:2015-11-19
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