Invention Grant
- Patent Title: Charged particle beam instrument and sample container
- Patent Title (中): 带电粒子束仪器和样品容器
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Application No.: US14520754Application Date: 2014-10-22
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Publication No.: US09449784B2Publication Date: 2016-09-20
- Inventor: Tatsuo Naruse
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: JP2013-223337 20131028
- Main IPC: H01J37/00
- IPC: H01J37/00 ; H01J37/20 ; H01J37/18 ; H01J37/26

Abstract:
A charged particle beam instrument is offered which can introduce cooled samples easily into a sample chamber. The charged particle beam instrument (100) of the present invention has: a sample container (10) that accommodates samples (S) and a refrigerant (6) for cooling the samples (S); an evacuated sample chamber (20); a sample exchange chamber (30) connected with the sample chamber (20); a partition valve (40) disposed between the sample exchange chamber (30) and the sample container (10); and vacuum pumping equipment (50) for evacuating the sample container (10). The sample container (10) can be connected with the sample exchange chamber (30) via the partition valve (40). The sample container (10) is evacuated by the vacuum pumping equipment (50) while the partition valve (40) is closed.
Public/Granted literature
- US20150137000A1 Charged Particle Beam Instrument and Sample Container Public/Granted day:2015-05-21
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