Invention Grant
- Patent Title: Silicon germanium heterojunction bipolar transistor structure and method
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Application No.: US13852013Application Date: 2013-03-28
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Publication No.: US09450069B2Publication Date: 2016-09-20
- Inventor: Oleg Gluschenkov , Rajendran Krishnasamy , Kathryn T. Schonenberg
- Applicant: Ultratech, Inc.
- Applicant Address: US CA San Jose
- Assignee: Ultratech, Inc.
- Current Assignee: Ultratech, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Peters Verny, LLP
- Main IPC: H01L21/336
- IPC: H01L21/336 ; H01L29/66 ; H01L29/08 ; H01L29/737

Abstract:
Disclosed is an improved semiconductor structure (e.g., a silicon germanium (SiGe) hetero-junction bipolar transistor) having a narrow essentially interstitial-free SIC pedestal with minimal overlap of the extrinsic base. Also, disclosed is a method of forming the transistor which uses laser annealing, as opposed to rapid thermal annealing, of the SIC pedestal to produce both a narrow SIC pedestal and an essentially interstitial-free collector. Thus, the resulting SiGe HBT transistor can be produced with narrower base and collector space-charge regions than can be achieved with conventional technology.
Public/Granted literature
- US20130210210A1 SILICON GERMANIUM HETEROJUNCTION BIPOLAR TRANSISTOR STRUCTURE AND METHOD Public/Granted day:2013-08-15
Information query
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