Invention Grant
- Patent Title: Method of removing a hard mask on a gate
- Patent Title (中): 去除门上的硬掩模的方法
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Application No.: US14926003Application Date: 2015-10-29
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Publication No.: US09484263B1Publication Date: 2016-11-01
- Inventor: Chao-Hung Lin , Li-Wei Feng , Shih-Hung Tsai , Jyh-Shyang Jenq , Ching-Ling Lin , Yi-Wen Chen , Chen-Ming Huang
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsin-Chu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu; Scott Margo
- Main IPC: H01L21/8234
- IPC: H01L21/8234 ; H01L29/66 ; H01L21/3105 ; H01L21/02 ; H01L21/3213 ; H01L21/28 ; H01L29/06 ; H01L21/311

Abstract:
A method of removing a hard mask on a gate includes forming a first gate structure and a second gate structure. The first gate structure includes a first gate, a first hard mask disposed on the first gate and a first spacer surrounding the first gate and the first hard mask, wherein the second gate structure includes a second gate, a second hard mask disposed on the second gate and a second spacer surrounding the second gate and the second hard mask. Later, the first spacer surrounding the first hard mask and the second spacer surrounding the second hard mask are removed. After that, a dielectric layer is formed to cover the first hard mask and the second hard mask. Finally, the second dielectric layer, the first mask layer and the second mask layer are removed.
Information query
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