Invention Grant
- Patent Title: Mass spectrometer and mass analyzing method for efficiently ionizing a sample with less carry-over
- Patent Title (中): 质谱分析方法，用于有效地离子化样品，携带较少
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Application No.: US13562435Application Date: 2012-07-31
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Publication No.: US09543135B2Publication Date: 2017-01-10
- Inventor: Shun Kumano , Masuyuki Sugiyama , Yuichiro Hashimoto , Hideki Hasegawa , Masuyoshi Yamada , Kazushige Nishimura , Hidetoshi Morokuma
- Applicant: Shun Kumano , Masuyuki Sugiyama , Yuichiro Hashimoto , Hideki Hasegawa , Masuyoshi Yamada , Kazushige Nishimura , Hidetoshi Morokuma
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Baker Botts L.L.P.
- Priority: JP2011-184266 20110826
- Main IPC: H01J49/00
- IPC: H01J49/00 ; H01J49/04
Abstract:
A mass spectrometer for efficiently ionizing a sample with less carry-over. The ratio of the amount of sample gas to that of a whole headspace gas is increased by decreasing the pressure inside of a sample vessel in which the sample is sealed thereby efficiently ionizing the sample.
Public/Granted literature
- US20130048851A1 MASS SPECTROMETER AND MASS ANALYZING METHOD Public/Granted day:2013-02-28
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