Invention Grant
- Patent Title: Universal multidetection system for microplates
- Patent Title (中): 微孔板通用多检测系统
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Application No.: US13485446Application Date: 2012-05-31
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Publication No.: US09557217B2Publication Date: 2017-01-31
- Inventor: Oleg Zimenkov , Xavier Amouretti , Michael Kontorovich , Ben Norris , Richard N. Sears , Dan J. Venditti, Jr. , Christopher Many , Bill Anderson , Ben Knight , James Piette , Ross Piette , Joe Tobey , Brian Ferris
- Applicant: Oleg Zimenkov , Xavier Amouretti , Michael Kontorovich , Ben Norris , Richard N. Sears , Dan J. Venditti, Jr. , Christopher Many , Bill Anderson , Ben Knight , James Piette , Ross Piette , Joe Tobey , Brian Ferris
- Applicant Address: US VT Winooski
- Assignee: BTI HOLDINGS, INC.
- Current Assignee: BTI HOLDINGS, INC.
- Current Assignee Address: US VT Winooski
- Agency: Sughrue Mion, PLLC
- Main IPC: G01J3/42
- IPC: G01J3/42 ; G01J3/02 ; G01J3/443 ; G01N21/64 ; G01N21/76 ; G01J3/10 ; G01J3/44
Abstract:
An apparatus for optically analyzing a sample may include an imaging subsystem that images the sample, one or more analyzing subsystems that analyze the sample, a temperature control subsystem that controls a temperature of the atmosphere within the apparatus, a gas control subsystem that controls a composition of the atmosphere within the apparatus, and a control module that controls the various subsystems of the apparatus.
Public/Granted literature
- US20120300194A1 UNIVERSAL MULTIDETECTION SYSTEM FOR MICROPLATES Public/Granted day:2012-11-29
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