Invention Grant
- Patent Title: Interlacing to improve sampling of data when ramping parameters
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Application No.: US14443936Application Date: 2013-11-21
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Publication No.: US09620342B2Publication Date: 2017-04-11
- Inventor: David Michael Cox
- Applicant: DH TECHNOLOGIES DEVELOPMENT PTE. LTD.
- Applicant Address: SG Singapore
- Assignee: DH Technologies Development Pte. Ltd.
- Current Assignee: DH Technologies Development Pte. Ltd.
- Current Assignee Address: SG Singapore
- Agency: Kasha Law LLC
- Agent John R. Kasha; Kelly L. Kasha
- International Application: PCT/IB2013/002613 WO 20131121
- International Announcement: WO2014/096916 WO 20140626
- Main IPC: B01D59/44
- IPC: B01D59/44 ; H01J49/00 ; H01J49/42 ; H01J49/26

Abstract:
Systems and methods are provided for interlacing ramped mass spectrometer parameter values during data acquisition. Ions from a sample are acquired within a cycle time, Ct, using a mass spectrometer. Within each Ct, two or more scans of the acquired ions are performed using two or more ramped values for a parameter of the mass spectrometer. When it is determined that scans for a desired range of ramped parameter values cannot be performed within Ct, the desired range of ramped values is divided into at least two interlaced groups of ramped values. The mass spectrometer is instructed to perform scans for each of the interlaced groups within two or more cycle times. Spectra from the scans for each of the at least two interlaced groups are combined. The ramped parameter values of the combined spectra have the desired range and the desired effective step size.
Public/Granted literature
- US20150311051A1 Interlacing to Improve Sampling of Data When Ramping Parameters Public/Granted day:2015-10-29
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