Invention Grant
- Patent Title: Charged particle beam device, method for adjusting charged particle beam device, and method for inspecting or observing sample
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Application No.: US14850085Application Date: 2015-09-10
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Publication No.: US09673020B2Publication Date: 2017-06-06
- Inventor: Yusuke Ominami , Tomohisa Ohtaki , Sukehiro Ito
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2011-205499 20110921
- Main IPC: H01J37/18
- IPC: H01J37/18 ; H01J37/28 ; H01J37/06 ; H01J37/244

Abstract:
A charged particle beam device capable of observing a sample in an air atmosphere or gas atmosphere has a thin film for separating the atmospheric pressure space from the decompressed space. A vacuum evacuation pump evacuates a first housing; and a detector detects a charged particle beam (obtained by irradiation of the sample) in the first housing. A thin film is provided to separate the inside of the first housing and the inside of a second housing at least along part of the interface between the first and second housings. An opening part is formed in the thin film so that its opening area on a charged particle irradiation unit's side is larger than its opening area on the sample side; and the thin film which covers the sample side of the opening part transmits or allows through the primary charged particle beam and the charged particle beam.
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