Invention Grant
- Patent Title: Semiconductor device having metal gate structure
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Application No.: US15644850Application Date: 2017-07-10
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Publication No.: US09825144B2Publication Date: 2017-11-21
- Inventor: Shih-Fang Tzou , Chien-Ming Lai , Yi-Wen Chen , Hung-Yi Wu , Tong-Jyun Huang , Chien-Ting Lin , Chun-Hsien Lin
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsin-Chu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu
- Main IPC: H01L29/76
- IPC: H01L29/76 ; H01L29/49 ; H01L29/66 ; H01L21/8238 ; H01L29/423

Abstract:
A metal gate transistor includes a substrate, a metal gate on the substrate, and a source/drain region in the substrate adjacent to the metal gate. The metal gate includes a high-k dielectric layer, a bottom barrier metal (BBM) layer comprising TiSiN on the high-k dielectric layer, a TiN layer on the BBM layer, a TiAl layer between the BBM layer and the TiN layer, and a low resistance metal layer on the TiN layer.
Public/Granted literature
- US20170309722A1 SEMICONDUCTOR DEVICE HAVING METAL GATE STRUCTURE Public/Granted day:2017-10-26
Information query
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