• Patent Title: Specimen loading method, specimen stage, and charged particle beam device
  • Application No.: US15320912
    Application Date: 2015-06-18
  • Publication No.: US09916963B2
    Publication Date: 2018-03-13
  • Inventor: Noriyuki InoueYoshiko Takashima
  • Applicant: JEOL Ltd.
  • Applicant Address: JP Tokyo
  • Assignee: JEOL Ltd.
  • Current Assignee: JEOL Ltd.
  • Current Assignee Address: JP Tokyo
  • Agency: The Webb Law Firm
  • Priority: JP2014-132377 20140627; JP2015-100252 20150515
  • International Application: PCT/JP2015/067646 WO 20150618
  • International Announcement: WO2015/198968 WO 20151230
  • Main IPC: G01F23/00
  • IPC: G01F23/00 H01J37/20 G01N1/36 H01J37/16
Specimen loading method, specimen stage, and charged particle beam device
Abstract:
A specimen loading method for loading a specimen that contains water into a specimen chamber of a charged particle beam device, includes: a step (S100) of mounting the specimen on a specimen support; a step (S102) of covering a predetermined area of the specimen with a water retention material; a step (S104) of evacuating the specimen chamber in which the specimen having the predetermined area covered with the water retention material is placed; and a step (S106) of exposing the predetermined area covered with the water retention material.
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