Invention Grant
- Patent Title: Analyzer alignment, sample detection, localization, and focusing method and system
-
Application No.: US15016489Application Date: 2016-02-05
-
Publication No.: US09939383B2Publication Date: 2018-04-10
- Inventor: David R. Day
- Applicant: SciAps, Inc.
- Applicant Address: US MA Woburn
- Assignee: SciAps, Inc.
- Current Assignee: SciAps, Inc.
- Current Assignee Address: US MA Woburn
- Agency: Iandiorio Teska & Coleman, LLP
- Main IPC: G01J3/30
- IPC: G01J3/30 ; G01N21/71 ; G01J3/443

Abstract:
An analysis (e.g., LIBS) system includes a source of radiation, an optical emission path for the radiation from the source of radiation to a sample, and an optical detection path for photons emitted by the sample. A detector fiber bundle transmits photons to the spectrometer subsystem. At least one fiber of the fiber bundle is connected to an illumination source (e.g., an LED) for directing light via at least a portion of the detection path in a reverse direction to the sample for aligning, sample presence detection, localizing, and/or focusing based on analysis of the resulting illumination spot on the sample.
Public/Granted literature
- US20170227469A1 ANALYZER ALIGNMENT, SAMPLE DETECTION, LOCALIZATION, AND FOCUSING METHOD AND SYSTEM Public/Granted day:2017-08-10
Information query