- Patent Title: Method and an apparatus for obtaining sample specific signatures
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Application No.: US14374933Application Date: 2013-09-02
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Publication No.: US09983136B2Publication Date: 2018-05-29
- Inventor: Siva Umapathy , Sanchita Sil , John Kiran
- Applicant: INDIAN INSTITUTE OF SCIENCE
- Applicant Address: IN Bangalore
- Assignee: INDIAN INSTITUTE OF SCIENCE
- Current Assignee: INDIAN INSTITUTE OF SCIENCE
- Current Assignee Address: IN Bangalore
- Agent Mark M. Friedman
- Priority: IN2312/CHE/2013 20130527
- International Application: PCT/IN2013/000538 WO 20130902
- International Announcement: WO2014/192007 WO 20141204
- Main IPC: G01N21/65
- IPC: G01N21/65 ; G01J3/44
Abstract:
The invention provides a method for obtaining sample specific signatures. The method comprises of irradiating the sample at a predefined location with an electromagnetic radiation of specific wavelength; selectively capturing a certain component of the scattered electromagnetic radiation to obtain a plurality of profiles; and filtering the profiles to obtain a sample specific signature. The invention provides an apparatus for obtaining sample specific signatures.
Public/Granted literature
- US20160103069A1 A METHOD AND AN APPARATUS FOR OBTAINING SAMPLE SPECIFIC SIGNATURES Public/Granted day:2016-04-14
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