公开(公告)号：WO2008101732A1

公开(公告)日：2008-08-28

申请号：PCT/EP2008/001468

申请日：2008-02-25

Applicant: ESE EMBEDDED SYSTEM ENGINEERING GMBH ,  GRULER, Roman ,  FAULSTICH, Konrad

Inventor： GRULER, Roman ,  FAULSTICH, Konrad

IPC: G01N21/64

CPC classification number: G01N21/645 ,  G01N21/255 ,  G01N21/8483 ,  G01N2201/0228 ,  G01N2201/024

Abstract: The invention provides for an optical measuring instrument and measuring device. The optical measuring instrument for investigating a specimen contained in a sample comprises at least one source for providing at least one electromagnetic beam intended to irradiate the sample and to interact with the specimen within the sample, at least one sensor for detecting an output of the interaction between the specimen and the electromagnetic beam, an integrally formed mechanical bench for the optical and electronic components, a sample holder for holding the sample, wherein the at least one source, the at least one sensor, and the mechanical bench are integrated in one monolithic optoelectronic module and the sample holder can be connected to this module.

Abstract translation: 本发明提供一种光学测量仪器和测量装置。 用于调查包含在样品中的样本的光学测量仪器包括至少一个源，用于提供用于照射样品的至少一个电磁束并与样品内的样品相互作用，用于检测相互作用的输出的至少一个传感器 在样品和电磁束之间，用于光学和电子部件的整体形成的机械台，用于保持样品的样品保持器，其中所述至少一个源，所述至少一个传感器和所述机械台被集成在一个单片 光电模块和样品架可以连接到该模块。

公开(公告)号：WO2006092317A1

公开(公告)日：2006-09-08

申请号：PCT/EP2006/001952

申请日：2006-03-03

Applicant: ESE EMBEDDED SYSTEM ENGINEERING GMBH ,  GRULER, Roman

Inventor： GRULER, Roman

IPC: G01N21/64 ,  A61B3/10

CPC classification number: G01N21/6486 ,  B33Y80/00 ,  G01N21/645 ,  G01N2021/6419 ,  G01N2021/6421 ,  G01N2201/024

Abstract: Fluoreszenzmessgerät zur Untersuchung einer Probe (3), das einen Hauptstrahlengang (5) und mindestens ein optisches Modul aufweist und dazu ausgebildet ist, mindestens einen zur Anregung der Probe vorgesehenen elektromagnetischen Strahl (27) bereitzustellen sowie mindestens einen von der Probe emittierten elektromagnetischen Strahl (29, 31) zu empfangen, wobei mindestens zwei dieser elektromagnetischen Strahlen zumindest abschnittsweise in einer Ebene liegen und entlang de Hauptstrahlengang verlaufen.

Abstract translation: 荧光测量装置用于对样品（3）的调查，包括主光束路径（5）和至少一个光学组件，并且被配置为提供至少一个所规定的样品电磁束（27）和至少一个从所述样品电磁束发射的激发（29 接收31），其特征在于，至少部分至少两种这些电磁辐射位于一个平面内，并沿着德主束路径延伸。

公开(公告)号：WO2002079738A3

公开(公告)日：2002-10-10

申请号：PCT/EP2002/003182

申请日：2002-03-21

Applicant: ESE EMBEDDED SYSTEM ENGINEERING GMBH ,  HABERSTROH, Klaus

Inventor： HABERSTROH, Klaus

IPC: G01N21/64

Abstract: Es wird eine Vorrichtung (10) zur simultanen Detektion von Strahlungen unterschiedlicher Wellenlänge mit einer Anzahl von ubereinander angeordneten Basismodulen, einem Optikmodul (16) und einem Elektronikmodul beschrieben. In den Basismodulen ist jeweils eine Einrichtung zum Reflektieren bzw. Umleiten von Strahlung eines vorbestimrnbaren Wellenlängen bereichs vorgesehen. Die lichtdetektierenden Elemente korrespondieren jeweils mit einer der Einrichtungen. Des weiteren werden ein Basismodul, eine Ladeeinheit, ein Verfahren zum Einstellen der Vorrichtung (10) und eine Verwendung für die erfindungsgemässe Vorrichtung (10) beschrieben.

公开(公告)号：WO2002079738A2

公开(公告)日：2002-10-10

申请号：PCT/EP2002/003182

申请日：2002-03-21

Applicant: ESE EMBEDDED SYSTEM ENGINEERING GMBH ,  HABERSTROH, Klaus

Inventor： HABERSTROH, Klaus

IPC: G01J3/00

CPC classification number: A61B5/1455 ,  A61B5/0002 ,  A61B5/14532 ,  A61B5/1495 ,  A61B2560/0456 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/0237 ,  G01J3/0256 ,  G01J3/0272 ,  G01J3/0283 ,  G01J3/36 ,  G01J3/4406

Abstract: Es wird eine Vorrichtung (10) zur simultanen Detektion von Strahlungen unterschiedlicher Wellenlänge mit einer Anzahl von ubereinander angeordneten Basismodulen, einem Optikmodul (16) und einem Elektronikmodul beschrieben. In den Basismodulen ist jeweils eine Einrichtung zum Reflektieren bzw. Umleiten von Strahlung eines vorbestimrnbaren Wellenlängen bereichs vorgesehen. Die lichtdetektierenden Elemente korrespondieren jeweils mit einer der Einrichtungen. Des weiteren werden ein Basismodul, eine Ladeeinheit, ein Verfahren zum Einstellen der Vorrichtung (10) und eine Verwendung für die erfindungsgemässe Vorrichtung (10) beschrieben.

Abstract translation: 它是用于同时检测具有许多优于彼此定位的基本模块的不同波长的辐射的装置（10），光学组件（16）和电子模块进行说明。 在基本模块反射或转向以vorbestimrnbaren波长范围的辐射的装置在每一种情况下被提供。 光检测元件的每一个对应于所述设备中的一个。 此外，基本模块，充电单元，调整装置（10）和用于本发明的装置（10）中使用的方法进行说明。

公开(公告)号：CA2716575C

公开(公告)日：2015-09-29

申请号：CA2716575

申请日：2008-02-25

Applicant: ESE EMBEDDED SYSTEM ENGINEERING GMBH

Inventor： GRULER ROMAN ,  FAULSTICH KONRAD

IPC: G01N21/64

Abstract: The invention provides for an optical measuring instrument and measuring device. The optical measuring instrument for investigating a specimen contained in a sample comprises at least one source for providing at least one electromagnetic beam intended to irradiate the sample and to interact with the specimen within the sample, at least one sensor for detecting an output of the interaction between the specimen and the electromagnetic beam, an integrally formed mechanical bench for the optical and electronic components, a sample holder for holding the sample, wherein the at least one source, the at least one sensor, and the mechanical bench are integrated in one monolithic optoelectronic module and the sample holder can be connected to this module.

公开(公告)号：CA2599173C

公开(公告)日：2013-10-08

申请号：CA2599173

申请日：2006-03-03

Applicant: ESE EMBEDDED SYSTEM ENGINEERING GMBH

Inventor： GRULER ROMAN

IPC: G01N21/64 ,  A61B3/10

Abstract: Disclosed is a fluorescence meter for analyzing a sample (3), comprising a main beam path (5) and at least one optical module. The inventive fluorescence meter is embodied so as to provide at least one electromagnetic beam (27) for exciting the sample and receive at least one electromagnetic beam (29, 31) emitted by the sample, at least some sections of at least two of said electromagnetic beams being located on one plane while extending along the main beam path.

公开(公告)号：EP2115434A1

公开(公告)日：2009-11-11

申请号：EP08716013.1

申请日：2008-02-25

Applicant: ESE Embedded System Engineering GmbH

Inventor： GRULER, Roman ,  FAULSTICH, Konrad

IPC: G01N21/64

CPC classification number: G01N21/645 ,  G01N21/255 ,  G01N21/8483 ,  G01N2201/0228 ,  G01N2201/024

Abstract: The invention provides for an optical measuring instrument and measuring device. The optical measuring instrument for investigating a specimen contained in a sample comprises at least one source for providing at least one electromagnetic beam intended to irradiate the sample and to interact with the specimen within the sample, at least one sensor for detecting an output of the interaction between the specimen and the electromagnetic beam, an integrally formed mechanical bench for the optical and electronic components, a sample holder for holding the sample, wherein the at least one source, the at least one sensor, and the mechanical bench are integrated in one monolithic optoelectronic module and the sample holder can be connected to this module.

公开(公告)号：EP1856509A1

公开(公告)日：2007-11-21

申请号：EP06723196.9

申请日：2006-03-03

Applicant: ESE Embedded System Engineering GmbH

Inventor： GRULER, Roman

IPC: G01N21/64 ,  A61B3/10

CPC classification number: G01N21/6486 ,  B33Y80/00 ,  G01N21/645 ,  G01N2021/6419 ,  G01N2021/6421 ,  G01N2201/024

Abstract: Disclosed is a fluorescence meter for analyzing a sample (3), comprising a main beam path (5) and at least one optical module. The inventive fluorescence meter is embodied so as to provide at least one electromagnetic beam (27) for exciting the sample and receive at least one electromagnetic beam (29, 31) emitted by the sample, at least some sections of at least two of said electromagnetic beams being located on one plane while extending along the main beam path.

公开(公告)号：EP1379845B1

公开(公告)日：2007-08-15

申请号：EP02742863.0

申请日：2002-03-21

Applicant: ESE Embedded System Engineering GmbH

Inventor： HABERSTROH, Klaus

IPC: G01J3/00

CPC classification number: A61B5/1455 ,  A61B5/0002 ,  A61B5/14532 ,  A61B5/1495 ,  A61B2560/0456 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/0237 ,  G01J3/0256 ,  G01J3/0272 ,  G01J3/0283 ,  G01J3/36 ,  G01J3/4406

Abstract: The invention relates to a device (10) for the simultaneous detection of radiation of different wavelength, comprising a number of base modules arranged one on top of the other, an optical module (16) and an electronic module. One device each for reflecting and/or deflecting radiation of a determined wavelength range is provided in said base modules. The light-detecting elements are associated with one of the devices each. The invention further relates to a base module, to a charging unit, to a method for adjusting the device (10) and to the use of the inventive device (10).

公开(公告)号：EP1379845A2

公开(公告)日：2004-01-14

申请号：EP02742863.0

申请日：2002-03-21

Applicant: Ese Embedded System Engineering Gmbh

Inventor： HABERSTROH, Klaus

IPC: G01J3/00

CPC classification number: A61B5/1455 ,  A61B5/0002 ,  A61B5/14532 ,  A61B5/1495 ,  A61B2560/0456 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/0237 ,  G01J3/0256 ,  G01J3/0272 ,  G01J3/0283 ,  G01J3/36 ,  G01J3/4406

Abstract: The invention relates to a device (10) for the simultaneous detection of radiation of different wavelength, comprising a number of base modules arranged one on top of the other, an optical module (16) and an electronic module. One device each for reflecting and/or deflecting radiation of a determined wavelength range is provided in said base modules. The light-detecting elements are associated with one of the devices each. The invention further relates to a base module, to a charging unit, to a method for adjusting the device (10) and to the use of the inventive device (10).