Patent search ap:("APPLIED RES LAB INC") AND inv:"HERMANN NEUHAUS" Page 1

1.

发明授权
Position adjustment mechanism and X-ray spectrometer including it 失效
Title translation: 位置调整机构和X射线光谱仪

公开(公告)号：US3153144A

公开(公告)日：1964-10-13

申请号：US8696261

申请日：1961-02-03

Applicant: APPLIED RES LAB INC

Inventor： HERMANN NEUHAUS

IPC: G01N23/20

CPC classification number: G01N23/20008 , G01N2223/056 , G01N2223/1016 , G01N2223/32 , G01N2223/321

2.

发明授权
Hydraulically controllable spectroscopic slit apparatus for making precision adjustments of the slit width 失效
Title translation: 用于精确调节狭缝宽度的液压可控光谱切缝装置

公开(公告)号：US3346737A

公开(公告)日：1967-10-10

申请号：US39834264

申请日：1964-09-22

Applicant: APPLIED RES LAB INC

Inventor： HERMANN NEUHAUS

IPC: G01N23/20 , G21K1/04

CPC classification number: G01N23/20008 , G01N2223/316 , G21K1/04

3.

发明授权
Electron probe apparatus having an objective lens with an aperture for restricting fluid flow 失效
Title translation: 具有具有用于限制流体流动的孔径的物镜的电子探针装置

公开(公告)号：US3346736A

公开(公告)日：1967-10-10

申请号：US39828064

申请日：1964-09-22

Applicant: APPLIED RES LAB INC

Inventor： HERMANN NEUHAUS

IPC: G01N23/225 , H01J37/18 , H01J37/22 , H01J37/252 , H01J37/30 , H01J37/301 , H02G1/02

CPC classification number: G01N23/225 , H01J37/18 , H01J37/22 , H01J37/252 , H01J37/3005 , H01J37/301 , H02G1/02

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