HIGH-FREQUENCY PROBE
    1.
    发明专利

    公开(公告)号:JP2006343334A

    公开(公告)日:2006-12-21

    申请号:JP2006159061

    申请日:2006-06-07

    Abstract: PROBLEM TO BE SOLVED: To provide a probe capable of reducing a stray electromagnetic field in the vicinity of a probe tip part to reduce a crosstalk with a neighboring device, capable of making a sufficient current flow, and allowing probing at a high-frequency. SOLUTION: This high-frequency probe has a contact point end part positioned within an end part circumferential edge of a coaxial cable, and shielded by a grounding conductor of the coaxial cable. COPYRIGHT: (C)2007,JPO&INPIT

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