Abstract:
PROBLEM TO BE SOLVED: To provide a probe capable of reducing a stray electromagnetic field in the vicinity of a probe tip part to reduce a crosstalk with a neighboring device, capable of making a sufficient current flow, and allowing probing at a high-frequency. SOLUTION: This high-frequency probe has a contact point end part positioned within an end part circumferential edge of a coaxial cable, and shielded by a grounding conductor of the coaxial cable. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
The effect of input signal frequency on the output of a differential amplifier is reduced by connecting the conductor of each of the input signal components to the respective conductor of the output signal component of opposite phase with a capacitor substantially equal to the parasitic capacitances interconnecting the terminals of the amplifier's transistors.
Abstract:
High frequency interconnect structures, electronic assemblies that utilize high frequency interconnect structures, and methods of operating the same. The high frequency interconnect structures include a plurality of dielectric waveguides and are configured to communicatively connect a plurality of transmitters with a plurality of receivers and to convey a plurality of signals therebetween. The plurality of signals may include a plurality of electromagnetic waves and may have a frequency of at least 200 GHz. The high frequency interconnect structures further may be configured to decrease a potential for crosstalk between a first signal that is conveyed by a first dielectric waveguide of the plurality of dielectric waveguides and a second signal that is conveyed by a second dielectric waveguide of the plurality of dielectric waveguides, such as through control of a passband of the first dielectric waveguide relative to the second dielectric waveguide and/or the use of a crosstalk mitigation structure.
Abstract:
The probe has a coaxial cable (50) terminated in an oblique terminal section and including an axially extending conductor and a coaxial conductor. A dielectric substrate is affixed to the coaxial cable with one side proximate to the section and another side remote from the section. A set of contact tips (28) is located within the periphery of the coaxial cable, and shielded by a ground conductor of the coaxial cable. A conductive unit connects the former conductor to a contact, where the contact is engagable with a device to be tested.