公开(公告)号：US3893080A

公开(公告)日：1975-07-01

申请号：US37521173

申请日：1973-06-29

Applicant: IBM

Inventor： HO ALLEN P ,  LEE HUA-TUNG

IPC: G06K9/00 ,  G06K9/46 ,  G06K9/12

CPC classification number: G06K9/4638 ,  G06K9/00067

Abstract: A system for detecting bifurcations and ridge endings (minutiae) in a fingerprint or on similar patterns in which two lines merge into one. The print is optically scanned, converted into electrical signals and entered into a novel continuity logic network. The presence of a bifurcation in the network results in three distinct outputs on the periphery of the network from at least two sides. The split in the bifurcation may also be detected by reversing the polarity of the electrical signals and detecting a single output. Means are also provided for ensuring that a single bifurcation is detected only once. Ridge endings are treated as reverse-polarity bifurcations and can be detected by the same system elements.

Abstract translation: 用于检测指纹中的分叉和脊端（细节）的系统，或者将两条线合并成一个的相似图案。 打印件被光学扫描，转换成电信号并进入一个新颖的连续性逻辑网络。 在网络中存在分支，从至少两侧在网络的外围产生三个不同的输出。 也可以通过反转电信号的极性并检测单个输出来检测分叉中的分割。 还提供了用于确保单个分叉仅被检测到一次的手段。 脊线端点被视为反极性分岔，并且可以由相同的系统元件来检测。

公开(公告)号：US3859633A

公开(公告)日：1975-01-07

申请号：US37519173

申请日：1973-06-29

Applicant: IBM

Inventor： HO ALLEN P ,  TING YEE-MING

IPC: G06K9/00 ,  G06K9/46

CPC classification number: G06K9/00067 ,  G06K9/4638

Abstract: A system for detecting bifurcations and ridge endings (minutiae) in a fingerprint or on similar patterns in which two lines merge into one. The print is optically scanned, converted into electrical signals and entered into a novel continuity logic network. The presence of a bifurcation in the network results in three distinct outputs on the periphery of the network from at least two sides. The split in the bifurcation may also be detected by reversing the polarity of the electrical signals and detecting a single output. Means are also provided for ensuring that a single bifurcation is detected only once. Ridge endings are treated as reverse-polarity bifurcations and can be detected by the same system elements.

Abstract translation: 用于检测指纹中的分叉和脊端（细节）的系统，或者将两条线合并成一个的相似图案。 打印件被光学扫描，转换成电信号并进入一个新颖的连续性逻辑网络。 在网络中存在分支，从至少两侧在网络的外围产生三个不同的输出。 也可以通过反转电信号的极性并检测单个输出来检测分叉中的分割。 还提供了用于确保单个分叉仅被检测到一次的手段。 脊线端点被视为反极性分岔，并且可以通过相同的系统元件来检测。

公开(公告)号：CA1153830A

公开(公告)日：1983-09-13

申请号：CA370960

申请日：1981-02-16

Applicant: IBM

Inventor： HO ALLEN P ,  HORNG CHENG T

IPC: H01L29/73 ,  H01L21/033 ,  H01L21/331 ,  H01L29/417 ,  H01L29/732 ,  H01L21/70

Abstract: A POLYSILICON-BASE SELF-ALIGNED BIPOLAR TRANSISTOR PROCESS AND STRUCTURE of The Disclosure Disclosed is a process for forming an improved bipolar transistor in a silicon substrate of a first conductivity type, said silicon substrate having a planar surface, a subcollector region of a second conductivity type formed in said substrate, an epitaxial layer of said second conductivity type formed on said planar surface or said substrate, and first, second and third spaced apart recessed oxide isolation regions extending from the planar surface of said epitaxial layer into said substrate, a subcollector reach-through region positioned between said second and third recessed oxide isolation regions, said subcollector reach-through region extending from said planar surface of said epitaxial layer to said subcollector region, said process including the following steps: deposit, using chemical vapor deposition techniques, a layer of doped polysilicon on the exposed surface of said substrate said dopant being of said first conductivity type; deposit, using chemical vapor deposition techniques a first layer of silicon dioxide on said polysilicon layer; deposit a layer of photoresist on said first layer of silicon dioxide; utilizing photolithography, mask off an intended intrinsic base region, said intended intrinsic base region being spaced between said first and second recessed oxide isolation regions; utilizing the resist layer as a mask employ reactive ion etching to remove the silicon dioxide and polysilicon superimposed over the intended intrinsic base region; ion implant the exposed intrinsic base region with ions of said first conductivity type; chemically vapor deposit a relatively thick silicon dioxide conformal coating on the FI 9-79-022 exposed surface; reactive ion etch an emitter opening on the epitaxial surface above the implanted intrinsic base; ion implant the emitter region with ions of said second conductivity type; and utilize a single heat cycle to anneal the ion implantations and drive in the emitter, intrinsic base, extrinsic base and collector reach through. FI 9-79-022

公开(公告)号：CA1038498A

公开(公告)日：1978-09-12

申请号：CA203050

申请日：1974-06-21

Applicant: IBM

Inventor： HO ALLEN P ,  TING YEE-MING

IPC: G06K9/00 ,  G06K9/46

Abstract: IMPROVED MINUTIAE RECOGNITION SYSTEM A system for detecting bifurcations and ridge endings (minutiae) in a fingerprint or on similar patterns in which two lines merge into one. The print is optically scanned, converted into electrical signals and entered into a novel continuity logic network. The presence of a bifurcation in the network results in three distinct outputs on the periphery of the network from at least two sides. The split in the bifurcation may also be detected by reversing the polarity of the electrical signals and detecting a single output. Means are also provided for ensuring that a single bifurcation is detected only once. Ridge endings are treated as reverse-polarity bifurcations and can be detected by the same system elements.

公开(公告)号：CA1038497A

公开(公告)日：1978-09-12

申请号：CA203049

申请日：1974-06-21

Applicant: IBM

Inventor： HO ALLEN P ,  LEE HUA-TUNG

IPC: G06K9/00 ,  G06K9/46 ,  G06K9/62

Abstract: MINUTIAE RECOGNITION SYSTEM A system for detecting bifurcations and ridge endings (minutiae) in a fingerprint or on similar patterns in which two lines merge into one. The print is optically scanned, converted into electrical signals and entered into a novel continuity logic network. The presence of a bifurcation in the network results in three distinct outputs on the periphery of the network from at least two sides. The split in the bifurcation may also be detected by reversing the polarity of the electrical signals and detecting a single output. Means are also provided for ensuring that a single bifurcation is detected only once. Ridge endings are treated as reverse-polarity bifurcations and can be detected by the same system elements.