公开(公告)号：JP2002041323A

公开(公告)日：2002-02-08

申请号：JP2000206526

申请日：2000-07-07

Applicant: IBM

Inventor： MIYAMURA TSUYOSHI ,  KIMURA MASATOSHI ,  SHIRATORI TATSUJI

IPC: G06F11/22 ,  G05B23/02 ,  G11B5/00 ,  G11B5/008 ,  G11B20/18 ,  G11B27/36

Abstract: PROBLEM TO BE SOLVED: To provide a startup control method of a device, a self diagnostic test method of the device, a control board, equipment and an inspection system capable of enhancing production efficiency in a manufacturing process. SOLUTION: When a system for test is connected with a debug port or an SCSI bus of a tape driving device, a self diagnostic test for the manufacturing process (steps S200, S300, S400) is carried out and when the system for test is not connected, a self diagnostic test for normal operation (a step 100) is carried out. And a motor test, an MR Head resistance test as tests of a mechanical structure part are omitted in the test by a single card. In addition. the test contents are minimized prior to the adjustment of a tape head also in a box assembling process. In addition setting of a flag, etc., is changed according to a test to be performed in the next process in a test program.