公开(公告)号：EP1172643A1

公开(公告)日：2002-01-16

申请号：EP00940767.7

申请日：2000-06-21

Applicant: Japan Science and Technology Corporation

Inventor： WRIGHT, Oliver ,  HURLEY, David ,  MATSUDA, Osamu

IPC: G01N21/45 ,  G01B11/06

CPC classification number: G01N21/45 ,  G01B11/0675 ,  G01D5/266 ,  G01J11/00 ,  G01J2009/0276

Abstract: The invention provides an apparatus for measuring the physical properties of a sample by optically monitoring the response of the sample to illumination by ultrashort optical pulses.
The apparatus forms a common path optical interferometer of a Sagnac type that can measure physical properties at normal incidence. The interferometer is a single-arm Sagnac interferometer featuring two beam splitters. Measurement is performed in such a manner that a sample (14) is excited by a beam of ultrashort optical pulses, and variations in intensity and phase of another optical beam are detected. This enables a wide range of measurement of physical properties such as thickness, sound velocity, and thermal properties of substances.

Abstract translation: 本发明提供一种用于通过光学监测样品对超短光脉冲照明的响应来测量样品的物理性质的装置。 该装置形成了可以在正常入射时测量物理性质的Sagnac型公共路径光学干涉仪。 干涉仪是具有两个分束器的单臂Sagnac干涉仪。 以使得样品（14）被超短光脉冲束激发的方式进行测量，并且检测另一光束的强度和相位的变化。 这使得能够进行物理性质的广泛测量，例如物质的厚度，声速和热性质。