公开(公告)号：US20190269008A1

公开(公告)日：2019-08-29

申请号：US16408431

申请日：2019-05-09

Applicant: KINSUS INTERCONNECT TECHNOLOGY CORP.

Inventor： Chin-Kuan Liu ,  Chao-Lung Wang ,  Shuo-Hsun Chang ,  Yu-Te Lu ,  Chin-Hsi Chang

IPC: H05K1/02 ,  H05K3/46 ,  H05K3/06 ,  H05K1/09

Abstract: A manufacturing method for a multi-layer circuit board is provided. According to the multi-layer circuit board manufactured by the manufacturing method, the multi-layer circuit structure is disposed on the delivery loading plate through the bottom dielectric layer, the delivery loading plate and the patterned metal interface layer expose the conductive corrosion-barrier layer, and the top-layer circuit of the multi-layer circuit structure is electrically connected to the conductive corrosion-barrier layer through the bottom-layer circuit and the electrical connection layer. Therefore, before the multi-layer circuit board is delivered to the assembly company or before the multi-layer circuit board is packaged with chips, an electrical testing can be applied to the multi-layer circuit board to check if the multi-layer circuit board can be operated normally or not.

公开(公告)号：US10548214B2

公开(公告)日：2020-01-28

申请号：US15826694

申请日：2017-11-30

Applicant: KINSUS INTERCONNECT TECHNOLOGY CORP.

Inventor： Chin-Kuan Liu ,  Chao-Lung Wang ,  Shuo-Hsun Chang ,  Yu-Te Lu ,  Chin-Hsi Chang

IPC: H05K1/02 ,  H05K1/09 ,  H05K3/46 ,  H05K3/06

Abstract: A multi-layer circuit board capable of being applied with electrical testing includes a metallic delivery loading plate, a bottom-layer circuit structure, a conductive corrosion-barrier layer, and a multi-layer circuit structure. The bottom-layer circuit structure is overlapping on the delivery loading plate. The conductive corrosion-barrier layer is disposed on the bottom dielectric layer. The multi-layer circuit structure is overlapping on the bottom-layer circuit structure. The top-layer circuit of the multi-layer circuit structure is electrically connected to the conductive corrosion-barrier layer through the inner-layer circuit of the multi-layer circuit structure and the bottom-layer circuit of the bottom-layer circuit structure. The delivery loading plate and the bottom dielectric layer of the bottom-layer circuit structure expose the conductive corrosion-barrier layer.

公开(公告)号：US10455694B2

公开(公告)日：2019-10-22

申请号：US16408431

申请日：2019-05-09

Applicant: KINSUS INTERCONNECT TECHNOLOGY CORP.

Inventor： Chin-Kuan Liu ,  Chao-Lung Wang ,  Shuo-Hsun Chang ,  Yu-Te Lu ,  Chin-Hsi Chang

IPC: H01K3/10 ,  H05K1/02 ,  H05K3/46 ,  H05K1/09 ,  H05K3/06 ,  H01L21/48

Abstract: A manufacturing method for a multi-layer circuit board is provided. The multi-layer circuit structure is disposed on the delivery loading plate through the bottom dielectric layer, the delivery loading plate and the patterned metal interface layer expose the conductive corrosion-barrier layer, and the top-layer circuit of the multi-layer circuit structure is electrically connected to the conductive corrosion-barrier layer through the bottom-layer circuit and the electrical connection layer. Therefore, before the multi-layer circuit board is delivered to the assembly company or before the multi-layer circuit board is packaged with chips, an electrical testing can be applied to the multi-layer circuit board to check if the multi-layer circuit board can be operated normally or not.

公开(公告)号：US20190059153A1

公开(公告)日：2019-02-21

申请号：US15826692

申请日：2017-11-30

Applicant: KINSUS INTERCONNECT TECHNOLOGY CORP.

Inventor： Chin-Kuan Liu ,  Chao-Lung Wang ,  Shuo-Hsun Chang ,  Yu-Te Lu ,  Chin-Hsi Chang

IPC: H05K1/02 ,  H05K1/09 ,  H05K3/46 ,  H05K3/06

CPC classification number: H05K1/0268 ,  H05K1/09 ,  H05K3/064 ,  H05K3/4644 ,  H05K3/4661 ,  H05K3/467 ,  H05K2201/0302 ,  H05K2203/072 ,  H05K2203/0723

Abstract: A multi-layer circuit board capable of being applied with electrical testing includes a patterned metal-interface layer, a metallic delivery loading plate, an electrical connection layer, a conductive corrosion-barrier layer, a bottom dielectric layer, and a multi-layer circuit structure. The multi-layer circuit structure is disposed on the delivery loading plate through the bottom dielectric layer. The top-layer circuit of the multi-layer circuit structure is electrically connected to the conductive corrosion-barrier layer through the bottom-layer circuit and the electrical connection layer. The delivery loading plate and the patterned metal-interface layer expose the conductive corrosion-barrier layer. Therefore, before the multi-layer circuit board is packaged, an electrical testing can be applied to the multi-layer circuit board to check if it can be operated normally. Hence, costs for figuring out reasons of the unqualified electronic component can be reduced, and responsibilities for the unqualified electrical testing result of the electronic component can be clarified.

公开(公告)号：US11044806B2

公开(公告)日：2021-06-22

申请号：US16718100

申请日：2019-12-17

Applicant: KINSUS INTERCONNECT TECHNOLOGY CORP.

Inventor： Chin-Kuan Liu ,  Chao-Lung Wang ,  Shuo-Hsun Chang ,  Yu-Te Lu ,  Chin-Hsi Chang

IPC: H05K1/02 ,  H05K1/09 ,  H05K3/46 ,  H05K3/06 ,  H05K3/24

Abstract: A multi-layer circuit structure is disposed on the delivery loading plate through the bottom-layer circuit structure, the delivery loading plate exposes the conductive corrosion-barrier layer, and the top-layer circuit of the multi-layer circuit structure is electrically connected to the conductive corrosion-barrier layer through the bottom-layer circuit and the electrical connection layer. Therefore, before the multi-layer circuit board is delivered to the assembly company or before the multi-layer circuit board is packaged with chips, an electrical testing can be applied to the multi-layer circuit board.

公开(公告)号：US10334719B2

公开(公告)日：2019-06-25

申请号：US15826692

申请日：2017-11-30

Applicant: KINSUS INTERCONNECT TECHNOLOGY CORP.

Inventor： Chin-Kuan Liu ,  Chao-Lung Wang ,  Shuo-Hsun Chang ,  Yu-Te Lu ,  Chin-Hsi Chang

IPC: H05K1/02 ,  H05K1/09 ,  H05K3/46 ,  H05K3/06

Abstract: A multi-layer circuit board capable of being applied with electrical testing includes a patterned metal-interface layer, a metallic delivery loading plate, an electrical connection layer, a conductive corrosion-barrier layer, a bottom dielectric layer, and a multi-layer circuit structure. The multi-layer circuit structure is disposed on the delivery loading plate through the bottom dielectric layer. The top-layer circuit of the multi-layer circuit structure is electrically connected to the conductive corrosion-barrier layer through the bottom-layer circuit and the electrical connection layer. The delivery loading plate and the patterned metal-interface layer expose the conductive corrosion-barrier layer. Therefore, before the multi-layer circuit board is packaged, an electrical testing can be applied to the multi-layer circuit board to check if it can be operated normally. Hence, costs for figuring out reasons of the unqualified electronic component can be reduced, and responsibilities for the unqualified electrical testing result of the electronic component can be clarified.

公开(公告)号：US20190059154A1

公开(公告)日：2019-02-21

申请号：US15826694

申请日：2017-11-30

Applicant: KINSUS INTERCONNECT TECHNOLOGY CORP.

Inventor： Chin-Kuan Liu ,  Chao-Lung Wang ,  Shuo-Hsun Chang ,  Yu-Te Lu ,  Chin-Hsi Chang

IPC: H05K1/02 ,  H05K1/09 ,  H05K3/46 ,  H05K3/06

Abstract: A multi-layer circuit board capable of being applied with electrical testing includes a metallic delivery loading plate, a bottom-layer circuit structure, a conductive corrosion-barrier layer, and a multi-layer circuit structure. The bottom-layer circuit structure is overlapping on the delivery loading plate. The conductive corrosion-barrier layer is disposed on the bottom dielectric layer. The multi-layer circuit structure is overlapping on the bottom-layer circuit structure. The top-layer circuit of the multi-layer circuit structure is electrically connected to the conductive corrosion-barrier layer through the inner-layer circuit of the multi-layer circuit structure and the bottom-layer circuit of the bottom-layer circuit structure. The delivery loading plate and the bottom dielectric layer of the bottom-layer circuit structure expose the conductive corrosion-barrier layer. Therefore, before the multi-layer circuit board is packaged, an electrical testing can be applied to the multi-layer circuit board to check if it can be operated normally.