公开(公告)号：KR20090061175A

公开(公告)日：2009-06-16

申请号：KR20070128074

申请日：2007-12-11

Applicant: KOREA RES INST OF STANDARDS

Inventor： LEE TAE GEOL ,  MIN HYE GEUN ,  MOON DAE WON

IPC: G01N33/53 ,  G01N33/48

CPC classification number: G01N33/54346 ,  G01N33/54353 ,  H01J49/0004 ,  Y10T436/143333 ,  Y10T436/24

Abstract: A method for evaluating bond between materials through imaging of time-of-flight secondary ion mass spectrometry(TOF-SIMS) is provided to evaluate the bond between organic, inorganic or bio material with nanoparticle and perform quantitative and qualitative analysis. A method for evaluating bond between materials using time-of-flight secondary ion mass spectrometry(TOF-SIMS) comprises: a step of forming the pattern of nanoparticle which is bonded with bio, organic or inorganic material on a substrate; a step of measuring the ion detection pattern of bond between nanoparticle and bond material on the substrate using the TOF-SIMS; and a step of comparing detection pattern of bio, organic or inorganic material and nanoparticle and determining the bond between bio, organic or inorganic material with nanoparticle.

Abstract translation: 提供了通过飞行时间二次离子质谱（TOF-SIMS）成像来评估材料之间的结合的方法，以评估有机，无机或生物材料与纳米颗粒之间的键，并进行定量和定性分析。 使用飞行时间二次离子质谱法（TOF-SIMS）评估材料之间的结合的方法包括：在基材上形成与生物，有机或无机材料结合的纳米颗粒图案的步骤; 使用TOF-SIMS测量衬底上的纳米颗粒和键合材料之间的键的离子检测图案的步骤; 以及比较生物，有机或无机材料和纳米颗粒的检测模式并确定生物，有机或无机材料与纳米颗粒之间的键的步骤。