公开(公告)号：DE60220975T2

公开(公告)日：2008-03-13

申请号：DE60220975

申请日：2002-09-03

Applicant: ST MICROELECTRONICS SA

Inventor： WUIDART SYLVIE ,  WUIDART LUC ,  BARDOUILLET MICHEL ,  BALLTHAZAR PIERRE

IPC: G01K7/00 ,  G06K19/073 ,  G06F12/14 ,  G06F13/42 ,  G06F21/06 ,  H01L21/822 ,  H01L27/04

Abstract: Method for detection of variations of an evironmental parameter (V,T) in an integrated circuit (1): (a) evaluate a propagation delay for retarding parts (21) sensitive to variations parameters environment, and; compare the delay current with respect to a reference value (REF). The measured delay current is compared to two predetermined minimum and maximum levels or a unique reference value defining a authorized operating range for the integrated circuit. The value from programmable retarder is determined as a function of the difference between the current value and reference value. The range of possible variation being predetermined.

公开(公告)号：DE60220975D1

公开(公告)日：2007-08-16

申请号：DE60220975

申请日：2002-09-03

Applicant: ST MICROELECTRONICS SA

Inventor： WUIDART SYLVIE ,  WUIDART LUC ,  BARDOUILLET MICHEL ,  BALLTHAZAR PIERRE

IPC: G01K7/00 ,  G06K19/073 ,  G06F12/14 ,  G06F13/42 ,  G06F21/06 ,  H01L21/822 ,  H01L27/04

Abstract: Method for detection of variations of an evironmental parameter (V,T) in an integrated circuit (1): (a) evaluate a propagation delay for retarding parts (21) sensitive to variations parameters environment, and; compare the delay current with respect to a reference value (REF). The measured delay current is compared to two predetermined minimum and maximum levels or a unique reference value defining a authorized operating range for the integrated circuit. The value from programmable retarder is determined as a function of the difference between the current value and reference value. The range of possible variation being predetermined.