Abstract:
Sense amplifier circuit for non-volatile memories, of the type apt to compare a voltage relating to a memory cell current, flowing in a bitline of a memory cell, to a reference voltage, by means of the use of an amplifying means, comprising bias means apt to define a bias voltage on the bitline for the sensing operation. According to the invention, there are provided further quick biasing means (C2) of the bitline (BL), apt to cooperate with said bias means (CB) in defining the bias voltage (VBL) of the bitline (BL), supplying a current substantially greater than the memory cell current (ICELL), in reply to a disabling signal (DIS), said quick biasing means (C2) being also apt to disable itself before the said bias voltage (VBL) is reached.
Abstract:
Biasing system of a bitline in a sense circuit for a non-volatile wide supply voltage range memory, in particular an EEPROM type memory, comprising an amplifier with two inputs to which two current sensing branches are connected, one current being relative to the memory cell and the other one taken from a reference circuit, of the type using a transistor for defining a biasing voltage onto a bitline, said transistor being biased through a voltage obtained by means of a feedback circuit connected to the relevant bitline. According to the invention, in order to supply the said biasing voltage (VBL), said transistor (N1) is in turn biased by a voltage (VGN1), which is in turn obtained through a circuit wherein a stable current (IP) flows, independent from the supply voltage (VDD) value, so that said biasing voltage (VBL) is independent from the supply voltage (VDD) value.
Abstract:
A voltage down converter (200) includes voltage regulator means (205) receiving a first voltage (Vdd) and having a regulation node for providing a regulated second voltage (Vr) lower than the first voltage, and having a control node for providing a control voltage (Vg) corresponding to the second voltage; and a voltage driver circuit branch (220) receiving the first voltage and including a variable-conductivity element (Tsb) having a control terminal coupled to the control node for controlling a current sunk by the variable-conductivity element from the first voltage; The voltage driver circuit branch has a voltage supply node (Vo), for supplying a down-converted voltage (Vo) corresponding to the second voltage, which is decoupled from the regulation node. At least one additional voltage driver circuit branch (225-1 - 225-N) is provided, receiving the first voltage and coupled to the voltage supply node, and including: a further variable-conductivity element (T-1 - T-N) having a control terminal coupled to the control node for controlling a current sunk by the further variable-conductivity element from the first voltage; and switching means (SW-1 - SW-N) for selectively enabling the further variable-conductivity element so as to keep the down-converted voltage at a prescribed value depending on the regulated second voltage.
Abstract:
The present invention refers to a generator circuit (3) for voltage ramps having an improved dynamic operation of the type comprising a differential stage (4) of a first output which controls a p-channel transistor (M1). A positive feedback branch is provided between the drain of the p-channel transistor (M1) and a first input of the differential stage and comprises a capacitor (C1). A current generator (G1) provides current to the first input of the differential stage. The drain of the p-channel transistor (M1) is also connected at an output terminal (OUT) of said ramp generator circuit (3) to a capacitative charge (C1) to be biased with voltage ramps. Advantageously, the ramp generator circuit comprises a second n-channel output transistor (N3) parallel connected to said p-channel transistor (P3) and having the control terminal connected to a second output (X1) of said differential stage (4).
Abstract:
Sense amplifier circuit for non-volatile memories, of the type apt to draw a reference current from a reference bitline and a cell current from a cell array bitline, and compare them by means of current-voltage converting means and an amplifying stage, said current-voltage converting means comprising also fixing means of a determined voltage on the reference bitline and on the cell array bitline, load circuit means for the reference bitline and the cell array bitline, current mirror circuits for mirroring the reference current into a input node of the amplifying stage and the cell current into a further input of said amplifying stage. According to the invention the load circuit means of the reference bitline (BLREF) and the mirroring means (MR) of the reference current are different circuits and the reference bitline load circuit means are represented by a transistor (P3) which mirrors a predetermined current (IP), generated outside of the sense amplifier circuit (3), in order to have a lower voltage drop on said load circuit means (P3).