Abstract:
Sense amplifier circuit for non-volatile memories, of the type apt to draw a reference current from a reference bitline and a cell current from a cell array bitline, and compare them by means of current-voltage converting means and an amplifying stage, said current-voltage converting means comprising also fixing means of a determined voltage on the reference bitline and on the cell array bitline, load circuit means for the reference bitline and the cell array bitline, current mirror circuits for mirroring the reference current into a input node of the amplifying stage and the cell current into a further input of said amplifying stage. According to the invention the load circuit means of the reference bitline (BLREF) and the mirroring means (MR) of the reference current are different circuits and the reference bitline load circuit means are represented by a transistor (P3) which mirrors a predetermined current (IP), generated outside of the sense amplifier circuit (3), in order to have a lower voltage drop on said load circuit means (P3).
Abstract:
A method of sensing a ferroelectric non-volatile information storage units ( 103 ) comprising two ferroelectric storage capacitors ( Cc,Ct ) in mutually opposite polarization states, and a sensing circuit for actuating the method. The method comprises the steps of: making a voltage applied across the two storage capacitors substantially zero ( Ph1 ); starting from this condition, progressively increasing the voltage applied thereacross ( Ph2 ) by supplying a prescribed current, until a first one ( Ct ) of the two storage capacitors approaches a condition of polarization state reversal, thereby the voltage applied across said first storage capacitor starts to decrease with respect to the voltage applied across the second storage capacitor ( Cc ); and amplifying a voltage difference between the voltages applied across the two storage capacitors by making the voltage applied across the first storage capacitor substantially zero and the voltage applied across the second storage capacitor substantially equal to a non-zero voltage ( VDD ) corresponding to a logic state opposite to a logic state corresponding to the zero voltage.
Abstract:
A circuit for sensing a ferroelectric non-volatile information storage unit (103,403) comprises a pre-charge circuit (113;413t,413c) for applying a prescribed pre-charge voltage (Vprch) to a storage capacitor (C;Ct,Cc) of the information storage unit. The pre-charge voltage causes a variation in a polarization charge of the storage capacitor, depending on an initial polarization state of the storage capacitor. A charge integration circuit (115,CAP;115t,115c,CAPt,CAPc) is provided for integrating an electric charge proportional to the variation in polarization charge experienced by the storage capacitor. The charge integration circuit thus provides an output voltage (Voutsw,Voutln) depending on the polarization state of the storage capacitor. The charge integration circuit may comprises an integration capacitor (CAP;CAPt,CAPc) and current mirror circuit (115;415t,415c) , with a first mirror branch (115a) coupled to the pre-charge circuit and a second mirror branch (115b) coupled to the integration capacitor, for mirroring into the second mirror branch an electric charge (Qsw,Qln) supplied to the information storage unit to compensate for the variation in the polarization charge experienced by the storage capacitor.
Abstract:
Sense amplifier circuit for non-volatile memories, of the type apt to compare a voltage relating to a memory cell current, flowing in a bitline of a memory cell, to a reference voltage, by means of the use of an amplifying means, comprising bias means apt to define a bias voltage on the bitline for the sensing operation. According to the invention, there are provided further quick biasing means (C2) of the bitline (BL), apt to cooperate with said bias means (CB) in defining the bias voltage (VBL) of the bitline (BL), supplying a current substantially greater than the memory cell current (ICELL), in reply to a disabling signal (DIS), said quick biasing means (C2) being also apt to disable itself before the said bias voltage (VBL) is reached.
Abstract:
A sensing circuit (120) for sensing currents, including at least one sense amplifier (122), comprising: a measure circuit branch (132i), having a measure node for receiving an input current (Ic) to be sensed, for converting the input current into a corresponding input voltage (V-); at least one comparison circuit branch (132o), having a comparison node for receiving a comparison current (Igs), for converting the comparison current into a corresponding comparison voltage (V+); and at least one voltage comparator (140) for comparing the input and comparison voltages, and means (N3s,135; N3s,135';N3s,135" ) for generating the comparison current based on a reference current (Ir), said means comprising: at least one voltage generator (135;135';135'') for receiving the reference current and for generating a corresponding sense amplifier biasing voltage (Vsab); and means (N3s) for converting the sense amplifier biasing voltage into the comparison current. The at least one voltage generator includes a first circuit branch (232i), having a first node for receiving the reference current, for converting the reference current into a corresponding reference voltage (Vref), a second circuit branch (232o), having a second node for receiving a regulation current (Ii), in current mirror configuration with the first circuit branch for mirroring a current (Img) corresponding to the reference current, the second circuit branch generating by conversion a non-regulated voltage (Vgen) corresponding to the mirrored current and to the regulation current, and voltage regulator means (N3g,240) receiving the reference voltage and the non-regulated voltage for regulating the sense amplifier biasing voltage by controlling the non-regulated voltage through the regulation current.
Abstract:
Memory sense amplifier, specifically EEPROM memories, operating in an extended supply voltage range, comprising a comparator that on an input receives a signal available on a bit line representative of the current flowing through the read memory cell and on another input it receives a signal representative of a reference current available on another bit line, and a bit lines polarization system. According to this invention the comparator comprises a stage in common source configuration (N2) and an active load (P5) for said stage. Moreover, the bit lines polarization system releases a polarization value (VBL) independent from the supply voltage value (VDD).
Abstract:
Biasing system of a bitline in a sense circuit for a non-volatile wide supply voltage range memory, in particular an EEPROM type memory, comprising an amplifier with two inputs to which two current sensing branches are connected, one current being relative to the memory cell and the other one taken from a reference circuit, of the type using a transistor for defining a biasing voltage onto a bitline, said transistor being biased through a voltage obtained by means of a feedback circuit connected to the relevant bitline. According to the invention, in order to supply the said biasing voltage (VBL), said transistor (N1) is in turn biased by a voltage (VGN1), which is in turn obtained through a circuit wherein a stable current (IP) flows, independent from the supply voltage (VDD) value, so that said biasing voltage (VBL) is independent from the supply voltage (VDD) value.