Abstract:
An apparatus for detecting electromagnetic radiation within a target frequency range is provided. The apparatus includes a substrate and one or more resonator structures disposed on the substrate. The substrate can be a dielectric or semiconductor material. Each of the one or more resonator structures has at least one dimension that is less than the wavelength of target electromagnetic radiation within the target frequency range, and each of the resonator structures includes at least two conductive structures separated by a spacing. Charge carriers are induced in the substrate near the spacing when the resonator structures are exposed to the target electromagnetic radiation. A measure of the change in conductivity of the substrate due to the induced charge carriers provides an indication of the presence of the target electromagnetic radiation.
Abstract:
Consolidation of active and passive detectors (26, 28, 34) on a single coldfinger (20) in a dewar (10) is made possible by interposing between the detectors (26, 28, 34) an electromagnetic interference shield (64, 68) which acts as a waveguide filter blocking any interfering frequencies. The waveguide is formed by a pair of spaced interleaved shields (64, 68) one of which (64) is associated with the dewar envelope and is externally grounded, and the other of which is associated with the coldfinger (20). Photons which penetrate through the waveguide (64, 68) are deflected to the outside of the dewar (10) by a flanged narcissus shield (40) surrounding the passive detector (34). Alignment of the detectors (26, 28, 34) and assembly of the dewar (101) is greatly facilitated by constructing the envelope in several generally cylindrical sections (14, 16, 18), the lowermost one of which (14) is shorter than the coldfinger (20); and by fusing the coldfinger (20) and lowermost envelope section (14 ) to a metal mounting base (12) prior to the final assembly of the dewar (10).
Abstract:
An apparatus for detecting electromagnetic radiation within a target frequency range is provided. The apparatus includes a substrate and one or more resonator structures disposed on the substrate. The substrate can be a dielectric or semiconductor material. Each of the one or more resonator structures has at least one dimension that is less than the wavelength of target electromagnetic radiation within the target frequency range, and each of the resonator structures includes at least two conductive structures separated by a spacing. Charge carriers are induced in the substrate near the spacing when the resonator structures are exposed to the target electromagnetic radiation. A measure of the change in conductivity of the substrate due to the induced charge carriers provides an indication of the presence of the target electromagnetic radiation.
Abstract:
An infrared rays detecting apparatus is disclosed wherein the area of a loop provided by an element line and a grounding line formed on an inner tube is minimized to reduce an induced electromotive force to minimize production of noises so that correct detection can be accomplished. A grounding line is interposed for each arbitrary number of element lines on a surface of the inner tube, and the element lines are individually connected to output electrodes of an infrared rays sensor of the multi-element type while the individual grounding lines are connected to a common grounding electrode of the infrared rays sensor.
Abstract:
An infrared ray detector includes, an infrared ray detection element farbicated in a water which is produced by growing a semiconductor responsive to infrared ray on a high resistance substrate, a metal submount provided with two lead terminals insulated from each other, to which submount the infrared ray detection element is mechanically fixed, an adiabatic vacuum vessel for containing and cooling the infrared ray detection element, to which vessel the metal submount is mechanically fixed, the infrared ray detection element and the metal submount. The metal submount and the adiabatic vacuum vessel are respectively adhered to each other by solder.
Abstract:
An apparatus for detecting electromagnetic radiation within a target frequency range is provided. The apparatus includes a substrate and one or more resonator structures disposed on the substrate. The substrate can be a dielectric or semiconductor material. Each of the one or more resonator structures has at least one dimension that is less than the wavelength of target electromagnetic radiation within the target frequency range, and each of the resonator structures includes at least two conductive structures separated by a spacing. Charge carriers are induced in the substrate near the spacing when the resonator structures are exposed to the target electromagnetic radiation. A measure of the change in conductivity of the substrate due to the induced charge carriers provides an indication of the presence of the target electromagnetic radiation.
Abstract:
An apparatus for detecting electromagnetic radiation within a target frequency range is provided. The apparatus includes a substrate and one or more resonator structures disposed on the substrate. The substrate can be a dielectric or semiconductor material. Each of the one or more resonator structures has at least one dimension that is less than the wavelength of target electromagnetic radiation within the target frequency range, and each of the resonator structures includes at least two conductive structures separated by a spacing. Charge carriers are induced in the substrate near the spacing when the resonator structures are exposed to the target electromagnetic radiation. A measure of the change in conductivity of the substrate due to the induced charge carriers provides an indication of the presence of the target electromagnetic radiation.
Abstract:
An apparatus for detecting electromagnetic radiation within a target frequency range is provided. The apparatus includes a substrate and one or more resonator structures disposed on the substrate. The substrate can be a dielectric or semiconductor material. Each of the one or more resonator structures has at least one dimension that is less than the wavelength of target electromagnetic radiation within the target frequency range, and each of the resonator structures includes at least two conductive structures separated by a spacing. Charge carriers are induced in the substrate near the spacing when the resonator structures are exposed to the target electromagnetic radiation. A measure of the change in conductivity of the substrate due to the induced charge carriers provides an indication of the presence of the target electromagnetic radiation.
Abstract:
An apparatus for detecting electromagnetic radiation within a target frequency range is provided. The apparatus includes a substrate and one or more resonator structures disposed on the substrate. The substrate can be a dielectric or semiconductor material. Each of the one or more resonator structures has at least one dimension that is less than the wavelength of target electromagnetic radiation within the target frequency range, and each of the resonator structures includes at least two conductive structures separated by a spacing. Charge carriers are induced in the substrate near the spacing when the resonator structures are exposed to the target electromagnetic radiation. A measure of the change in conductivity of the substrate due to the induced charge carriers provides an indication of the presence of the target electromagnetic radiation.
Abstract:
An apparatus for detecting electromagnetic radiation within a target frequency range is provided. The apparatus includes a substrate and one or more resonator structures disposed on the substrate. The substrate can be a dielectric or semiconductor material. Each of the one or more resonator structures has at least one dimension that is less than the wavelength of target electromagnetic radiation within the target frequency range, and each of the resonator structures includes at least two conductive structures separated by a spacing. Charge carriers are induced in the substrate near the spacing when the resonator structures are exposed to the target electromagnetic radiation. A measure of the change in conductivity of the substrate due to the induced charge carriers provides an indication of the presence of the target electromagnetic radiation.