Abstract:
An apparatus for detecting electromagnetic radiation within a target frequency range is provided. The apparatus includes a substrate and one or more resonator structures disposed on the substrate. The substrate can be a dielectric or semiconductor material. Each of the one or more resonator structures has at least one dimension that is less than the wavelength of target electromagnetic radiation within the target frequency range, and each of the resonator structures includes at least two conductive structures separated by a spacing. Charge carriers are induced in the substrate near the spacing when the resonator structures are exposed to the target electromagnetic radiation. A measure of the change in conductivity of the substrate due to the induced charge carriers provides an indication of the presence of the target electromagnetic radiation.
Abstract:
A totally integrated imaging system has a housing including imaging optics, a scanning mirror and a curved detector array. The imaging optics constitute a meniscus lens and a spherical focusing mirror. The scanning mirror scans the image, and the spherical mirror focuses the scanned image onto the detector array. The meniscus lens advantageously corrects aberrations. A detector support provides access, if desired, for cryogenic cooling of the detector, and individual cold shielding of the detector elements is made possible by the telecentricity of the optics. Processing electronics, at least a portion of which may also be disposed on the detector support, process the detector signals to display an image. The integrated structure advantageously eliminates any need for separate scanner, imager, and electronics modules and the scanning optical system obtains highly desirable image quality over a wide field of view.
Abstract:
An image sensing device has an optical shield (170), in front of an image sensing array (110) of the device, with a multi-aperture structure. The optical shield (170) has many shield elements (177) forming a grid-like or cellular structure. With such a structure, the solid angle of the field of view is almost the same for each sensing element (120) of a sensing array (110), resulting in the reduction of 'shading' effects and an improvement in signal or noise ratio. The distance (H) between the shield (170) and the array (110) can be reduced as compared with previous devices. The sensing elements (120) are not shielded individually, so the pitch of the shield elements (177) can be larger than that of the sensing elements (120), which makes it easier and less costly to fabricate the shield.
Abstract:
An apparatus for detecting electromagnetic radiation within a target frequency range is provided. The apparatus includes a substrate and one or more resonator structures disposed on the substrate. The substrate can be a dielectric or semiconductor material. Each of the one or more resonator structures has at least one dimension that is less than the wavelength of target electromagnetic radiation within the target frequency range, and each of the resonator structures includes at least two conductive structures separated by a spacing. Charge carriers are induced in the substrate near the spacing when the resonator structures are exposed to the target electromagnetic radiation. A measure of the change in conductivity of the substrate due to the induced charge carriers provides an indication of the presence of the target electromagnetic radiation.
Abstract:
According to embodiments of the present invention, a semiconductor substrate is formed on at least a portion of a surface of a semiconductor substrate. The emitting layer is excited for a first predetermined time period. A first luminescent intensity value of the emitting layer is determined. In response to exposing the semiconductor substrate and the emitting layer to a condition for a second predetermined time period, a second luminescent intensity value of the emitting layer is determined. A thermal profile of at least the portion of the surface of the semiconductor substrate is determined utilizing the first luminescent intensity value and the second luminescent intensity value of the emitting layer. The thermal profile at least reflects information about one or more of the condition and the semiconductor substrate subsequent to exposure to the condition.
Abstract:
An apparatus for detecting electromagnetic radiation within a target frequency range is provided. The apparatus includes a substrate and one or more resonator structures disposed on the substrate. The substrate can be a dielectric or semiconductor material. Each of the one or more resonator structures has at least one dimension that is less than the wavelength of target electromagnetic radiation within the target frequency range, and each of the resonator structures includes at least two conductive structures separated by a spacing. Charge carriers are induced in the substrate near the spacing when the resonator structures are exposed to the target electromagnetic radiation. A measure of the change in conductivity of the substrate due to the induced charge carriers provides an indication of the presence of the target electromagnetic radiation.
Abstract:
A low temperature solid state light detecting system is disclosed. The same incorporates a source of cooling and an electrical light detector. A heat conducting member extends from the detector chip to the source of cooling. A vacuum chamber contains the light detector. The chamber has a window for permitting light to fall on the electrical light detector. A plurality of electrical feedthrough devices are mounted on the chamber for coupling electricity from inside the chamber to the outside of the chamber. A plurality of bare wires extends from the detector to the feedthrough devices positioned on the housing.
Abstract:
The invention uses a strip of infra-red detectors comprising a cold screen of the type that provides a constant viewing angle for all the directors in a direction that is prependicular to the axis of the strip. Two cylindrical mirrors are set at the ends of the strip and placed in the heated part of the cryostat containing the strip and the cold screen. The shape and dimensions of the mirrors as well as their positions are chosen so that the detector placed in the center of the strip detects, through reflection in two mirrors, only cold surfaces while the other detectors detect heated surfaces, through reflection in the two mirrors, in a proportion that increases with distance from the central detector of the strip, so that, along the axis of the strip, every detector has a substantially constant viewing angle. Applications: large-sized strips, for example in space applications.
Abstract:
A radiant-energy temperature measuring apparatus of a scanning type having a linear array of light-sensitive elements which generate photoelectric signals corresponding to respective amounts of radiant energy produced at different points of an object and vicinities thereof on a straight line corresponding to the above linear array, and further having a device for determining a temperature of the object at desired one of its different points, based on the photoelectric signal generated by one of the light-sensitive elements which optically matches the desired one point of the object. The apparatus includes an edge detector for detecting an edge of the object, based on the photoelectric signals generated by the light-sensitive elements, and a selector for selecting the desired one point of the object, by designating a number of the light-sensitive elements as counted from the element corresponding to the detected edge of the object, to the element which corresponds to the above-indicated desired one point. The selector applies to the temperature determining device the photoelectric signal from the light-sensitive element corresponding to the selected point.