Abstract:
PURPOSE: An auto focus control unit of a microscope is provided to perform an automatic focus control function within a short period of time by converting directly displacement of slit beams to distance information of a probe by using resultants obtained from a single image recognition unit. CONSTITUTION: An objective lens(11), an optical division tube(12), a zoom lens having a zoom motor, an image forming lens(14), and a light receiving element array(15) are arranged on the same optical axis. A light source(16) is installed at one side of the optical division tube. A slit beam generator(17) is installed on a focal length of the objective lens. A driving sensor(3) is used for sensing a driving motor(18) and a moving distance. An image/control unit(2) includes an image receiver(21) for receiving and processing digital signals of the light receiving element array, a drive controller(22) for controlling a driving state of a probe, a zoom drive controller(23) for controlling a zoom motor, a slit beam controller(24) for controlling intensity of the slit beam generator, and a coaxial illumination controller(25) for controlling intensity of coaxial illumination.
Abstract:
Disclosed are a method and a system for measuring the surface profile of an object having a large-area. The present invention relates to a method and a system for measuring a profile of a surface by obtaining and analyzing interference patterns generated on an object, the patterns of which are formed by installing two-point light sources to the object to be measured. The measuring system includes an optical path changing unit for controlling an optical path of one of the two optical beam sources installed in the optical probe, and a number of (three or six) optical probes disposed according to applied measurement algorithms, thereby measuring the profile of the object.
Abstract:
Disclosed is a phase-shifting diffraction grating interferometer using diffraction grating. When a light source incident to the diffraction grating is resolved into several diffraction lights, one of them having a diffraction element is selected as a reference light, and other part having the diffraction element or another light having other diffraction element is selected as a light directing to an object to be measured. The light directing to the object to be measured is reflected from the object and is incident to the diffraction grating and then diffracted, and object lights made by the diffraction generates the reference light and an interference pattern. When the diffraction grating is moved in a longitudinal direction, the object light or the reference light is phase-shifted, a number of interference patterns are obtained, and the interference patterns are analyzed to obtain a shape of the measured object. The present invention relates to an improved diffraction grating interferometer capable of being used in an optical metrology field, and the interferometer includes interferometers of various types, which is capable of measuring various kinds of objects to be measured. The phase-shifting diffraction grating interferometer includes a light source part, a beam splitter or a light direction controller, a phase-shifting generator, an interference pattern generator, an interference pattern obtaining part, a central processing unit and a result displaying part. The light source part includes a light source and a lens, a pinhole, a collimator or an optical fiber. The optical elements can be removed according to characteristics of this system or replaced by other optical elements.
Abstract:
Disclosed are a system and a method for determining coordinates of a three-dimensional measurer probe using a beam phase interference method. Two optical fibers are mounted inside the probe, and detecting means obtains an interference pattern generated by beam emitted from a point beam source mounted at ends of the optical fibers. After that, wave front of the interference pattern is measured and a location of the point beam source is determined through a nonlinear optimization from the wave front, and thereby the coordinates of the three-dimensional measurer probe are set. Because the two optical fibers of the inside of the probe to be measured are located in close vicinity to the three-dimensional object, the present measuring system and method can reduce a measurement error, make a structure of the system simple, and thereby reduce a manufacturing cost.
Abstract:
PURPOSE: A point-diffractive interferometer by using an optical fiber light source and a measurement method thereof are provided to improve measuring preciseness while removing an error of the point-diffractive interferometer. CONSTITUTION: A point-diffractive interferometer includes a beam splitter for splitting beam radiated from a beam source into measuring beam and reference beam. A measuring beam optical fiber(26) is provided to transfer measuring beam and a reference beam optical fiber(28) is provided to transfer reference beam. An optical fiber mounting member(30) is provided to install the reference beam optical fiber(28) and an end of the measuring beam optical fiber(26). A phase converting device is provided to convert phase of measuring beam or reference beam. An image obtaining device(42) is provided to obtain an image of an interference pattern created by reference beam and measuring beam.
Abstract:
This invention is on a measurement method and apparatus for measuring the accurate height of a very small step composed of two different flat materials. In this method, two wavelength-white light interferometry is used and the measuring error caused by the change in phase difference by two materials is compensated by a unique equation.
Abstract:
The present invention relates to a high power optical fiber femtosecond laser resonator generated by the combination mode locking of nonlinear polarization rotation and saturable absorption. An optical fiber femtosecond laser resonator, which is an optical fiber based resonator of a ring-type structure, includes a nonlinear polarization rotation mode locking part which is formed on the resonator and generates an UHF pulse by pulse shaping, and a saturable absorption mode locking part which performs the nonlinear filtering of pulse amplitude, prevents the excess nonlinear phenomenon of the inner part of the resonator, generates an initial pulse, and removes a dispersive wave generated in a soliton pulse.