Abstract:
A light source having first and second wire-grid polarizers and a laser that emits a beam of linearly polarized light that is characterized by a propagation direction is disclosed. The first wire-grid polarization filter is characterized by a first linear polarization pass direction and a first actuator for causing the first linear polarization pass direction to rotate relative to the beam of linearly polarized light. The second wire-grid polarization filter is characterized by a second linear polarization pass direction and a second actuator for causing the second linear polarization pass direction to rotate relative to the beam of linearly polarized light. A controller sets the first and second linear polarization pass directions to provide linearly polarized light having a specified polarization direction.
Abstract:
A light source having first and second wire-grid polarizers and a laser that emits a beam of linearly polarized light that is characterized by a propagation direction is disclosed. The first wire-grid polarization filter is characterized by a first linear polarization pass direction and a first actuator for causing the first linear polarization pass direction to rotate relative to the beam of linearly polarized light. The second wire-grid polarization filter is characterized by a second linear polarization pass direction and a second actuator for causing the second linear polarization pass direction to rotate relative to the beam of linearly polarized light. A controller sets the first and second linear polarization pass directions to provide linearly polarized light having a specified polarization direction.
Abstract:
A multiple wavelength ellipsometer system for use in thin film characterization is disclosed. The light source for the system may include sequentially scanned multiple light emitting diodes or laser diodes. The polarization state detector may comprise no moving parts, and utilizes economical uncoated glass plates as beam splitters. The system compensates for potential measurement errors induced by misalignment of the input beam angle to the polarization state detector via a paired arrangement of the beam splitters. To provide improved accuracy in the analysis of data acquired by the system, methods herein actively compensate for the relatively large bandwidth of a preferable light emitting diode source.
Abstract:
A polarimeter for measuring chirality of a material comprising an optical ring cavity comprising a plurality of reflective elements configured to promote bi-directional propagation of a laser beam within the cavity, a laser-emitting device configured to introduce a first input laser beam and a second input laser beam into the ring cavity, and a Faraday rotator and a phase compensator configured to suppress a birefringent background as the first and second laser beams pass through the ring cavity, wherein the plurality of mirrors, Faraday rotator, and phase compensator are configured such that light from the first and second laser beams passes through a chiral material located within the cavity a sufficient number of times for a measurement of optical rotary dispersion (ORD) and circular dichroism (CD) of light transmitted through the chiral material to be obtained. Particular implementations include monolithic ring cavities or microresonators or use of intra-cavity gain media.
Abstract:
A multiple wavelength ellipsometer system for use in thin film characterization is disclosed. The light source for the system may include sequentially scanned multiple light emitting diodes or laser diodes. The polarization state detector may comprise no moving parts, and utilizes economical uncoated glass plates as beam splitters. The system compensates for potential measurement errors induced by misalignment of the input beam angle to the polarization state detector via a paired arrangement of the beam splitters. To provide improved accuracy in the analysis of data acquired by the system, methods herein actively compensate for the relatively large bandwidth of a preferable light emitting diode source.
Abstract:
A system and method for detection and measurement of circular birefringences in materials that exhibit the Faraday effect. The method and apparatus permit detection of optical activities via the difference in the directions of propagation the left- and the right-circularly polarized light (components). A beam of light is directed at an interface formed by the optically active medium and another medium such that a difference in the angles of refraction and/or reflection and/or diffraction between the left- and the right-circularly polarized components of the light beam can be detected. The difference in the propagation directions between the two circularly polarized light components is measured on a position sensitive detector and/or is detected as an intensity difference.
Abstract:
A system and method for detection and measurement of circular birefringences in materials, such as optically active (chiral) liquids and materials that exhibit the Faraday effect. The method and apparatus permit the detection of optical activities via the difference in the directions of propagation the left- and the right-circularly polarized light (components). A beam of light is directed at an interface formed by the optically active medium and another medium such that a difference in the angles of refraction and/or reflection and/or diffraction between the left- and the right-circularly polarized components of the light beam can be detected. The difference in the propagation directions between the two circularly polarized light components is measured on a position sensitive detector and/or is detected as an intensity difference. The circular birefringence in isotropic liquids is a measure of their optical purity (enantiomeric excess) and hence the invention presents a method and apparatus to measure chirality. The invention is thus related to optical rotation (polarimetric) measurements, but has the advantage that it does not depend on path-length traversed through the sample.
Abstract:
System and methodology for setting, and compensating detected errors between intended and realized Angle-of-Incidence (AOI) and Plane-Of-Incidence (POI) settings in ellipsometer and the like systems during analysis of sample characterizing data.
Abstract:
An imaging polarimeter sensor includes an achromatic beam-splitting polarizer that receives a polychromatic image beam of a scene and simultaneously produces a first polarized polychromatic image beam and a second polarized polychromatic image beam. The second polarized polychromatic image beam is of a different polarization than the first polarized polychromatic image beam and is angularly separated from the first polarized polychromatic image beam. The achromatic beam-splitting polarizer preferably includes a Wollaston prism through which the polychromatic image beam passes, and at least one grating through which the polychromatic image beam passes either before or after it passes through the Wollaston prism. An imaging detector receives the first polarized polychromatic image beam and the second polarized polychromatic image beam and produces an output image signal responsive to the first polarized polychromatic image beam and the second polarized polychromatic image beam.
Abstract:
Each of a detection sample object and a non-detection sample object is illuminated with S-polarization light, for instance. S-polarization light and P-polarization light reflected from each sample object are detected by different photodetecting elements. Glossiness values and light quantities of the detection and non-detection sample objects are judged based on detection outputs of the photodetecting elements, and a glossiness difference and a light quantity difference are calculated. An evaluation function having at least one of the glossiness and the light quantity as a variable is determined by using the glossiness difference and the light quantity difference. Thresholds for object discrimination are calculated based on evaluation function values of the detection and non-detection sample objects.