Abstract:
A method for improving the measurement of semiconductor wafers is disclosed. In the past, the repeatability of measurements was adversely affected due to the unpredictable growth of a layer of contamination over the intentionally deposited dielectric layers. Repeatability can be enhanced by removing this contamination layer prior to measurement. This contamination layer can be effectively removed in a non-destructive fashion by subjecting the wafer to a cleaning step. In one embodiment, the cleaning is performed by exposing the wafer to microwave radiation. Alternatively, the wafer can be cleaned with a radiant heat source. These two cleaning modalities can be used alone or in combination with each other or in combination with other cleaning modalities. The cleaning step may be carried out in air, an inert atmosphere or a vacuum. Once the cleaning has been performed, the wafer can be measured using any number of known optical measurement systems.
Abstract:
Described herein is a spectroscopic system and method for measuring and monitoring the chemical composition and/or impurity content of a sample or sample stream using absorption light spectroscopy. Specifically, in certain embodiments, this invention relates to the use of sample pressure variation to alter the magnitude of the absorption spectrum (e.g., wavelengthdependent signal) received for the sample, thereby obviating the need for a reference or zero sample. Rather than use a reference or zero sample, embodiments described herein obtain a spectrum/signal from a sample-containing cell at both a first pressure and a second (different) pressure.
Abstract:
The invention relates to an inspection and repair module for an internal side wall of a vertically erected structure, with the module including a carrier for supporting at least one data recording mechanism and being securable to a hoist, and for an inspection and repair module for an internal wall of a conduit with the module including propulsion means comprising a set of driven tracked wheels controllable by a controller carried by the carrier and configured to provide, within a conduit, longitudinal forward and reverse motion.
Abstract:
The invention relates to an inspection and repair module for an internal side wall of a vertically erected structure, with the module including a carrier for supporting at least one data recording mechanism and being securable to a hoist, and for an inspection and repair module for an internal wall of a conduit with the module including propulsion means comprising a set of driven tracked wheels controllable by a controller carried by the carrier and configured to provide, within a conduit, longitudinal forward and reverse motion.
Abstract:
Thermally controlled enclosures that can be used with gas analyzers are described. The enclosures incorporate one or more phase changing materials that buffer ambient and internal heat loads to reduce the power consumption demand of mechanical or electronic heating apparatus. Maintenance of gas analyzer equipment at a consistent temperature can be important to achieving stable and reproducible results. Related systems, apparatus, methods, and/or articles are also described.
Abstract:
Die vorliegende Erfindung betrifft eine Interferometeranordnung und ein Verfahren zu deren Betrieb. Die Interferometeranordnung umfasst ein Interferometer mit einer Interferometer-Lichtquelle, deren emittierte Strahlung in einen Mess- und einen Referenzarm aufteilbar ist, wobei ein Messobjekt im Messarm angeordnet ist und das Interferometer von der Position des Messobjekts abhängige Interferometersignale liefert. Ferner sind Erfassungsmittel zur Erfassung von Fluktuationen des Brechungsindexes der Luft im Mess- und/oder Referenzarm vorgesehen. Hierbei umfassen die Erfassungsmittel eine Spektrometereinheit; die Spektrometereinheit weist mindestens eine Spektrometer-Lichtquelle sowie mindestens eine Spektrometer-Detektoreinheit auf. Die von der Spektrometer-Lichtquelle emittierten Strahlenbündel werden den Strahlenbündeln der Interferometer-Lichtquelle überlagert, wobei die Spektrometer-Lichtquelle Strahlung mit einer Wellenlänge emittiert, die im Bereich einer Absorptionslinie mindestens eines bestimmten Luftbestandteils liegt. Die Spektrometer-Detektoreinheit dient zur Erzeugung von Spektrometersignalen, die die Absorption des Luftbestandteils bzgl. der Spektrometer-Lichtquellenwellenlänge im Mess- und/oder Referenzarm charakterisieren.
Abstract:
To provide an NDIR gas sensor having high responsiveness and less noise. A gas sensor 5 includes a radiating section 50 arranged to radiate an infrared ray, a detecting section 51 arranged to detect the infrared ray radiated by the radiating section 50, and a sample cell 6 extending between the radiating section 50 and the detecting section 51 along a route of the infrared ray and covering the entire circumference of the route of the infrared ray. The sample cell 6 includes a plurality of cell elements 60 and 61 extending along the route of the infrared ray. Side portions of the cell elements 60 and 61 adjacent to each other overlap at an interval from each other.
Abstract:
Described herein is a spectroscopic system and method for measuring and monitoring the chemical composition and/or impurity content of a sample or sample stream using absorption light spectroscopy. Specifically, in certain embodiments, this invention relates to the use of sample pressure variation to alter the magnitude of the absorption spectrum (e.g., wavelength-dependent signal) received for the sample, thereby obviating the need for a reference or ‘zero’ sample. Rather than use a reference or ‘zero’ sample, embodiments described herein obtain a spectrum/signal from a sample-containing cell at both a first pressure and a second (different) pressure.
Abstract:
A method and apparatus for testing an engine component, e.g. a turbine blade, guide vane or exhaust duct, for blockage of one or more through-holes (114) in at least a portion of a wall (104) thereof, wherein the portion of the wall (104) comprises a known pattern of through-holes (114) therein extending between first and second sides of the wall (104), the method comprising: (i) providing in a first region to the first side of the wall (104) a supply (130) of a test fluid, wherein the test fluid comprises a material able to scatter electromagnetic radiation incident thereon; (ii) causing or permitting a flow of the test fluid to occur from the first region to a second region to the second side of the wall (104); (iii) illuminating the second region with electromagnetic radiation (155) to cause scattering of electromagnetic radiation by material (160) exiting substantially non-blocked through-holes (114) in the wall portion (104) having passed therethrough from the first side to the second side; (iv) detecting said scattering of electromagnetic radiation from said substantially non-blocked through-holes (114); and (v) comparing said detected scattering of electromagnetic radiation from said substantially non-blocked holes (114) with the known pattern of through-holes in the component wall portion (104) to determine the presence and/or location and/or identity of any blocked or partially blocked through-holes (114B) in the component wall portion (104).