Abstract:
PROBLEM TO BE SOLVED: To disclose a technique for detecting water vapor in a natural gas background. SOLUTION: This device includes a light source (519) emitting light approximately within wavelength ranges such as 920 to 960 nm, 1.877 to 1.901, or 2.711 to 2.786. The light source emits light which passes through a specimen of natural gas and is detected by a detector (523). In one embodiment, the light source is a tunable diode laser and the moisture level is determined by harmonic spectroscopy. In other embodiments, a VCSEL, a color center laser, or a quantum cascade laser is utilized. COPYRIGHT: (C)2011,JPO&INPIT
Abstract in simplified Chinese:半导体激光芯片之第一接触表面可经形成至第一目标表面粗糙度且载体装设之第二接触表面可经形成至第二目标表面粗糙度。包含第一金属之第一结合制备层可视情况涂覆至所形成之第一接触表面,且包含第二金属之第二结合制备层可视情况涂覆至所形成之第二接触表面。第一接触表面可与第二接触表面接触,且无焊固定制程可将半导体激光芯片固定至载体装设。本案亦描述相关系统、方法、制品等。
Abstract:
A sample cell (100) can be designed to minimize excess gas volume. Described features can be advantageous in reducing an amount of gas required to flow through the sample cell during spectroscopic measurements, and in reducing a time (e.g. a total volume of gas) required to flush the cell (100) between sampling events. In some examples, contours of the inner surfaces (202) of the sample cell that contact the contained gas can be shaped, dimensioned, etc. such that a maximum clearance distance (120) is provided between the inner surfaces (202) at one or more locations. A device, method and an apparatus are described.
Abstract:
A valid state of an analytical system that includes a light source (102) and a detector (106) can be verified by determining that deviation of first light intensity data quantifying a first intensity of light received at the detector from the light source after the light has passed at least once through each of a reference gas in a validation cell (114) and a zero gas from a stored data set does not exceed a pre-defined threshold deviation. The stored data set can represent at least one previous measurement collected during a previous instrument validation process performed on the analytical system. The reference gas can include a known amount of an analyte. A concentration of the analyte in a sample gas in a measurement cell (112) can be determined by correcting second light intensity data quantifying a second intensity of the light received at the detector after the light passes at least once through each of the reference gas in the validation cell and a sample gas containing an unknown concentration of the analyte compound. Related systems, methods, and articles of manufacture are also described.
Abstract:
Intensity measurements characterizing at least two absorption lines for a molecule of interest within at least one sample of gas may be used to calculate at least one ratio which may be associated with a level of an environmental parameter of interest. Related apparatuses, techniques, systems, computer program products are also described.
Abstract:
A method for implementation by a laser spectrometer is provided. The method includes first scanning, by a control unit using a first set of laser spectrometer operating parameters, a first wavelength range by adjusting a wavelength of light of a beam emitted by a laser light source and passing through a sample gas. The first wavelength range encompasses a first spectral feature corresponding to a first constituent. The method also includes at least one second scanning, by the control unit using a second set of laser spectrometer operating parameters, a second wavelength range by adjusting the wavelength of light emitted from the laser light source and passing through the sample gas. The second wavelength range has a second spectral feature corresponding to at least one second constituent. The control unit also determines a first concentration of the first constituent and a second concentration of the at least one second constituent.
Abstract:
A spectrometer includes a light source that emits a beam into a sample volume comprising an absorbing medium. Thereafter, at least one detector detects at least a portion of the beam emitted by the light source. It is later determined, based on the detected at least a portion of the beam and by a controller, that a position and/or an angle of the beam should be changed. The beam emitted by the light source is then actively steered by an actuation element under control of the controller. In addition, a concentration of the absorbing media can be quantified or otherwise calculated (using the controller or optionally a different processor that can be local or remote). The actuation element(s) can be coupled to one or more of the light source, a detector or detectors, and a reflector or reflectors intermediate the light source and the detector(s).
Abstract:
Detector data representative of an intensity of light that impinges on a detector after being emitted from a light source and passing through a gas over a path length can be analyzed using a first analysis method to obtain a first calculation of an analyte concentration in the volume of gas and a second analysis method to obtain a second calculation of the analyte concentration. The second calculation can be promoted as the analyte concentration upon determining that the analyte concentration is out of a first target range for the first analysis method.
Abstract:
A spectrometer includes a light source that emits a beam into a sample volume comprising an absorbing medium. Thereafter, at least one detector detects at least a portion of the beam emitted by the light source. It is later determined, based on the detected at least a portion of the beam and by a controller, that a position and/or an angle of the beam should be changed. The beam emitted by the light source is then actively steered by an actuation element under control of the controller. In addition, a concentration of the absorbing media can be quantified or otherwise calculated (using the controller or optionally a different processor that can be local or remote). The actuation element(s) can be coupled to one or more of the light source, a detector or detectors, and a reflector or reflectors intermediate the light source and the detector(s).