Abstract:
An optical inspection system rapidly evaluates a substrate by illumination of an area of a substrate larger than a diffraction-limited spot using a coherent laser beam by breaking temporal or spatial coherence. Picosecond or femtosecond pulses from a modelocked laser source are split into a plurality of spatially separated beamlets that are temporally and/or frequency dispersed, and then focused onto a plurality of spots on the substrate. Adjacent spots, which can overlap by up to about 60-70 percent, are illuminated at different times, or at different frequencies, and do not produce mutually interfering coherence effects. Bright-field and dark-field detection schemes are used in various combinations in different embodiments of the system.
Abstract:
An optical inspection system rapidly evaluates a substrate by illumination of an area of a substrate larger than a diffraction-limited spot using a coherent laser beam by breaking temporal or spatial coherence. Picosecond or femtosecond pulses from a modelocked laser source are split into a plurality of spatially separated beamlets that are temporally and/or frequency dispersed, and then focused onto a plurality of spots on the substrate. Adjacent spots, which can overlap by up to about 60-70 percent, are illuminated at different times, or at different frequencies, and do not produce mutually interfering coherence effects. Bright-field and dark-field detection schemes are used in various combinations in different embodiments of the system.
Abstract:
The present invention resides in a method and apparatus for detecting a foreign particle, wherein an ultraviolet light beam is radiated in the form of a spot to a sample having a protective film formed on a circuit pattern or a wiring pattern; the spot and the sample are scanned relative to each other; the ultraviolet light is absorbed by the protective film; diffracted light produced from a foreign particle present on the protective film is condensed by an integrating sphere; the thus-condensed light is sensed by an optoelectro transducer to convert it into an electric signal; and the foreign particle present on the protective film formed on the circuit pattern or the wiring pattern is detected on the basis of the electric signal provided from the optoelectro transducer.
Abstract:
A vision inspection system and a method for inspecting a workpiece using the same are provided to obtain image data by simultaneously transferring the workpiece and a camera so as to be adjacent to each other through each operation of first and second transfer devices, thereby preventing generation of vibration by minimizing torque applied to an entire system of the camera, and significantly improving reliability of the image data. In upper both sides of a plate(20), first and second locations are provided. A first transfer unit(30) is installed in an upside of the plate, has a table(32) where a workpiece(2) is placed, and linearly moves the table between the first and second locations. A camera(40) is disposed in an upper part of the plate in order to photograph an image of the workpiece and output image data. A second transfer unit(50) is installed in the upside of the plate, and linearly moves the camera between the first and second locations. A computer(60) is connected to the first transfer unit, the camera and the second transfer unit and transfers the table from the first location to the second location by controlling operations of the first transfer unit. At the same time, the computer moves the camera from the second location to the first locations by controlling operations of the second transfer unit. In the computer, an image processing program for processing the image data inputted from the camera is installed.
Abstract:
간섭성 광원과; 수집 동공에서 광 분포의 실현을 산출하기 위해 상기 광원으로부터의 간섭성 광의 스폿을 이용하여 타겟 패턴을 스캐닝- 상기 스폿은 타겟 패턴의 일부를 커버하고 상기 스캐닝은 스캐닝 패턴에 따라 광학적으로 또는 기계적으로 수행되는 것임 -하도록 구성된 광학 시스템과; 동공 이미지를 결합함으로써 수집 동공 분포의 복합 이미지를 발생하도록 구성된 처리 유닛을 포함한 각도 분해형 반사율계 및 반사율 측정 방법이 제공된다. 개구 사이즈에 대한 측정 파라미터의 함수 종속성을 양적으로 산정하고 측정 조건과 관련한 측정 파라미터의 보정 항을 상기 개구 사이즈에 관한 함수 종속성의 식별된 회절 성분으로부터 도출함으로써 회절 오차를 감소시키는 계측 시스템 및 방법이 제공된다.
Abstract:
PROBLEM TO BE SOLVED: To prevent an optical member from being easily affected by heat generation of a drive unit of an optical head.SOLUTION: A scan module 9 is disposed on an upper side of a first plate 32, and a first motor 39 for moving the scan module 9 in a second scan direction and a second motor 49 for moving the scan module 9 in a first scan direction are disposed on a lower side of the first plate 32. In such a manner, the first motor 39 and the second motor 49 to be a heat source are installed on the opposite side of the side of the scan module 9 with the first plate 32 as a boundary, and a transmission amount of heat from the first motor 39 and the second motor 49 to the scan module 9 is reduced. As a result, decline of fluorescence detection accuracy due to thermal distortion of a detection optical system inside the scan module 9 is prevented.
Abstract:
PROBLEM TO BE SOLVED: To provide a small portable biochip scanner capable of performing multi-channel measurement by employing a rotating prism disc and a micro scanning mirror. SOLUTION: This biochip scanner comprises a surface plasmon resonance unit 44 of a rotatable disc shape, and an optical head 50 that scan light so that the light is made to come into the surface plasmon resonance unit within a predetermined angle and detects light fully reflected from the surface plasmon resonance unit. The optical head moves in the radial direction of the surface plasmon resonance unit of the disc shape. COPYRIGHT: (C)2006,JPO&NCIPI