公开(公告)号：US20140186939A1

公开(公告)日：2014-07-03

申请号：US14198163

申请日：2014-03-05

Applicant: OndaVia, Inc.

Inventor： Mark C. Peterman ,  Merwan Benhabib ,  Samuel Kleinman

IPC: G01N21/47 ,  G01N21/49 ,  G01J3/44

CPC classification number: G01N21/65 ,  B01L3/502761 ,  B01L2200/0652 ,  B01L2200/12 ,  B01L2300/0627 ,  B01L2300/0636 ,  B01L2300/0654 ,  B01L2300/0681 ,  B01L2300/0867 ,  B01L2300/087 ,  B01L2400/0418 ,  B01L2400/0421 ,  G01J3/18 ,  G01J3/44 ,  G01N21/47 ,  G01N21/4785 ,  G01N21/658 ,  G01N27/44704 ,  G01N27/44791 ,  G01N30/6065 ,  G01N30/6095 ,  G01N33/18 ,  G01N2021/651 ,  G01N2030/0095 ,  G01N2201/0221 ,  G01N2201/13

Abstract: A hand-held microfluidic testing device is provided that includes a housing having a cartridge receiving port, a cartridge for input to the cartridge receiving port having a sample input and a channel, where the channel includes a mixture of Raman-scattering nanoparticles and a calibration solution, where the calibration solution includes chemical compounds capable of interacting with a sample under test input to the cartridge and the Raman-scattering nanoparticles, and an optical detection system in the housing, where the optical detection system is capable of providing an illuminated electric field, where the illuminating electric field is capable of being used for Raman spectroscopy with the Raman-scattering nanoparticles and the calibration solution to analyze the sample under test input to the cartridge.

Abstract translation: 提供了一种手持微流体测试装置，其包括具有盒接收端口的壳体，用于输入到具有样品输入和通道的盒接收端口的盒，其中该通道包括拉曼散射纳米颗粒的混合物和校准 解决方案，其中校准溶液包括能够与待测试输入的样品与拉曼散射纳米颗粒相互作用的化合物和壳体中的光学检测系统，其中光学检测系统能够提供照明电场 ，其中照明电场能够用于具有拉曼散射纳米颗粒的拉曼光谱和校准溶液以分析被测试的输入到盒的样品。

公开(公告)号：US11972960B2

公开(公告)日：2024-04-30

申请号：US16833903

申请日：2020-03-30

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Myungjun Lee ,  Wookrae Kim ,  Jaehwang Jung ,  Myoungki Ahn

IPC: H01L21/67 ,  G01N21/21 ,  G01N21/95 ,  G06T7/00 ,  H01L21/66 ,  G01N21/17

CPC classification number: H01L21/67288 ,  G01N21/211 ,  G01N21/9501 ,  G06T7/001 ,  H01L22/12 ,  G01N2021/1765 ,  G01N2201/12 ,  G01N2201/13 ,  G06T2207/30148

Abstract: Provided is an imaging ellipsometry (IE)-based inspection method including selecting a mode from among a first mode of an IE-based inspection device having a first field of view (FOV) and a second mode of an IE-based inspection device having a second FOV, measuring an inspection target by the IE-based inspection device based on the selected mode, and determining whether the inspection target is normal based on a result of the measuring, wherein the measuring of the inspection target comprises simultaneously measuring patterns included in a plurality of cells provided in a region of the inspection target, the region corresponding to an FOV of the selected mode.

公开(公告)号：US10082457B2

公开(公告)日：2018-09-25

申请号：US14945691

申请日：2015-11-19

Applicant: International Business Machines Corporation

Inventor： William M. Green ,  Lionel Tombez ,  Eric Zhang

IPC: G01N21/27 ,  G01N33/00 ,  G01N21/17 ,  G01N21/3504 ,  G01N21/39

CPC classification number: G01N21/27 ,  G01N21/274 ,  G01N21/3504 ,  G01N21/39 ,  G01N33/0047 ,  G01N2021/1748 ,  G01N2201/13

Abstract: Provided herein are techniques for improved optical absorption measurements in the presence of time-varying etalons. In one aspect, a method for dynamic etalon fitting for adaptive background noise reduction in an optical sensor is provided. The method includes the steps of: obtaining a zero-gas spectrum measured using the optical sensor; obtaining an analyte gas spectrum of a target trace gas measured using the optical sensor; comparing the zero-gas spectrum and the analyte gas spectrum using fit parameters that compensate for drifting etalons in the optical sensor; and dynamically extracting the drifting etalons from the analyte gas spectrum to retrieve concentration of the target trace gas.

公开(公告)号：US10062592B2

公开(公告)日：2018-08-28

申请号：US15418796

申请日：2017-01-30

Applicant: HITACHI KOKUSAI ELECTRIC INC.

Inventor： Junichi Kawasaki ,  Hajime Abiko

IPC: H01L21/67 ,  H01L21/677 ,  H01L21/02 ,  G01N21/95

CPC classification number: H01L21/67288 ,  G01N21/9501 ,  G01N2201/13 ,  H01L21/0226 ,  H01L21/31 ,  H01L21/67265 ,  H01L21/67703

Abstract: A substrate processing apparatus includes a substrate retaining mechanism; a detecting unit detecting a placed state of the substrate retained by the substrate retaining mechanism; a first determination unit comparing detection data of the substrate obtained by the detecting unit with master data that is a reference to determine if the detection data is within a first allowed value; a confirmation unit confirming substrate type; a second determination unit comparing the detection data of the substrate with the master data to determine if the detection data is within a second allowed value; and a transfer control unit controlling the substrate retaining mechanism depending on a determination result of the second determination unit when substrate type is confirmed as a predetermined type by the confirmation unit when it is determined that the detection data is not within the first allowed value as determined by the first determination unit.

公开(公告)号：US09911185B2

公开(公告)日：2018-03-06

申请号：US15021349

申请日：2014-09-11

Applicant: KOH YOUNG TECHNOLOGY INC.

Inventor： Seungwon Jung ,  Jongjin Choi ,  Heewook You

IPC: G06K9/00 ,  G06T7/00 ,  G01N21/93 ,  G01N21/956 ,  G01B11/00

CPC classification number: G06T7/001 ,  G01B11/002 ,  G01N21/93 ,  G01N21/956 ,  G01N21/95607 ,  G01N21/95684 ,  G01N2201/13 ,  G06T7/0004 ,  G06T7/0006 ,  G06T2207/10016 ,  G06T2207/30141 ,  G06T2207/30148

Abstract: The present invention relates to a method of generating reference data for inspecting a circuit board. The method comprises steps of scanning a bare circuit board to obtain image information of the bare circuit board, generating a compensation matrix using pad coordinate information extracted from the image information and pad coordinate information prestored in design data, and generating, by applying the compensation matrix to the image information, a reference data including coordinate information of a distinctive object. According to the method, inspection efficiency may optimized through quickly generating reference data without CAD information necessary for circuit board inspection.

公开(公告)号：US09797839B2

公开(公告)日：2017-10-24

申请号：US14738134

申请日：2015-06-12

Applicant: OLYMPUS CORPORATION

Inventor： Mitsushiro Yamaguchi

IPC: G01D18/00 ,  G01N21/64 ,  G01M11/00 ,  G01N21/27 ,  G02B21/00 ,  G02B21/34 ,  G01M11/02

CPC classification number: G01N21/645 ,  G01M11/00 ,  G01M11/02 ,  G01N21/274 ,  G01N21/276 ,  G01N21/278 ,  G01N21/6458 ,  G01N2201/06113 ,  G01N2201/127 ,  G01N2201/13 ,  G02B21/0076 ,  G02B21/008 ,  G02B21/34

Abstract: An optical system of an optical analysis device is easily evaluated with high accuracy.There is provided a method of evaluating an optical analysis device including an optical system A capable of forming a confocal volume C at a focal position by condensing excitation light B, the method including the steps of: placing, at the focal position of the optical system A, a phantom sample in which two or more types of solid members having different fluorescent substance concentrations are arranged adjacent to each other; irradiating the phantom sample 1 with excitation light through the optical system A while relatively moving the confocal volume C formed by the optical system A and the phantom sample in an arrangement direction of the solid members; detecting fluorescent light generated in the solid members placed in the confocal volume C; and evaluating the optical system A based on the detected fluorescent light.

公开(公告)号：US20170299507A1

公开(公告)日：2017-10-19

申请号：US15516987

申请日：2015-10-07

Applicant: OSAKA UNIVERSITY

Inventor： Hideo ITOZAKI ,  Hideo AKABA

IPC: G01N21/359 ,  G08B7/06 ,  G01N21/3577 ,  G01N29/024 ,  G01N29/44 ,  G01N21/17

CPC classification number: G01N21/359 ,  G01N21/3577 ,  G01N29/024 ,  G01N29/4409 ,  G01N29/4427 ,  G01N29/4436 ,  G01N33/227 ,  G01N2021/1748 ,  G01N2201/13 ,  G01N2291/022 ,  G01V5/0008 ,  G08B7/06

Abstract: Provided is an examination technique that can quickly and reliably examine, from the outside of a container, whether a liquid which fills the container contains an explosive or the like, without being influenced by such things as the light transmissivity or size of the container, or the amount of liquid remaining in the container or the position of a label. In the present invention, a liquid examination device is formed by integrating the following: a near infrared-light examination device that examines whether a liquid which fills a container contains an explosive, an explosive raw material, and/or an illicit drug by projecting near infrared light into the liquid from outside of an optically transparent container, receiving the near infrared light which passed through the liquid or the near infrared light which was scattered by the liquid, and analyzing the absorption spectrum of such light; and an ultrasonic wave examination device that examines whether a liquid which fills a container contains an explosive, an explosive raw material, and/or an illicit drug by receiving the reflected waves of ultrasonic waves projected towards the liquid from outside of a metal container, and analyzing the ultrasonic wave speed of such waves.

公开(公告)号：US20170184487A1

公开(公告)日：2017-06-29

申请号：US15459291

申请日：2017-03-15

Applicant: Tokyo Electric Power Company Holdings, Incorporate

Inventor： Noboru KOBAYASHI ,  Tamotsu OGAWA ,  Chikara MOROOKA ,  Yuki MATSUOKA ,  Hideharu ONIKI

IPC: G01N17/00 ,  G01N21/93

CPC classification number: G01N17/006 ,  G01M99/004 ,  G01N21/93 ,  G01N2201/13 ,  G05B23/0283

Abstract: A method is used for selecting a boundary sample. The method includes acquiring a deterioration trend of a new device by performing a deterioration acceleration treatment to the new device, acquiring deterioration trends of a plurality of repaired devices which have been repaired after long-term use by performing a deterioration acceleration treatment to the plurality of repaired devices, calculating an upper limit of deterioration of the repaired device based on the deterioration trend of the new device, and selecting a boundary sample indicating a limit state in which the device can be reused as a standard of reuse of the device by specifying a repaired device having the largest deterioration among the repaired devices having a deterioration not larger than the upper limit.

公开(公告)号：US20170122879A1

公开(公告)日：2017-05-04

申请号：US14930069

申请日：2015-11-02

Applicant: THE BOEING COMPANY

Inventor： Michael J. SCHAFFER

IPC: G01N21/93 ,  G01N21/88

CPC classification number: G01N21/93 ,  G01N21/8803 ,  G01N21/954 ,  G01N2201/13 ,  G02B27/62

Abstract: A borescope calibration device is provided that includes a base having a planar surface and a plurality of reference surfaces on a side of the base opposing the planar surface, each of the plurality of reference surfaces having a height that decreases along a length of the base, a fixture that positions an optical head along a reference line that is parallel to the planar surface and providing a fixed distance between the reference surfaces and the optical head, the fixture being movable along a length of the base, and a target pattern formed on each of the reference surfaces.

公开(公告)号：US09568432B2

公开(公告)日：2017-02-14

申请号：US14497384

申请日：2014-09-26

Applicant: Intel Corporation

Inventor： Amit S. Baxi ,  Vincent S. Mageshkumar

IPC: G01N21/78 ,  G01N21/25 ,  G01N21/80 ,  G01N21/01 ,  G01N21/77

CPC classification number: G01N21/78 ,  G01N21/251 ,  G01N21/255 ,  G01N21/80 ,  G01N2021/0181 ,  G01N2021/7773 ,  G01N2201/0627 ,  G01N2201/0635 ,  G01N2201/125 ,  G01N2201/13

Abstract: Apparatus and methods may provide for determining a value of chemical parameter. One or more light emitters may be positioned within a housing to emit light through an aperture of the housing. The emitted light may illuminate a color area of a structure that is separable from the housing, such as a test strip, a printed color reference, and so on. A color sensor may be positioned within the housing to capture reflected light and to convert the reflected light to an initial digitized color space that may be usable to determine a color shade of a color area. The reflected light may, for example, be captured independently at least of a dimension (e.g., predetermined size, shape, etc.) of the color area.

Abstract translation: 装置和方法可以提供用于确定化学参数的值。 一个或多个光发射器可以定位在壳体内以通过壳体的孔发光。 发射的光可以照亮可与壳体分离的结构的颜色区域，例如测试条，印刷的颜色基准等。 颜色传感器可以定位在壳体内以捕获反射光并将反射光转换成可用于确定颜色区域的色调的初始数字化颜色空间。 反射光可以例如至少独立地捕捉颜色区域的尺寸（例如，预定尺寸，形状等）。