公开(公告)号：KR1020170138827A

公开(公告)日：2017-12-18

申请号：KR1020160071149

申请日：2016-06-08

Applicant: 포항공과대학교 산학협력단

Inventor： 김재남 ,  진영술

IPC: G01N23/201 ,  C23C2/06 ,  C23C2/14

CPC classification number: G01N23/201 ,  C23C2/06 ,  C23C2/14

Abstract: 본발명은고내식아연-마그네슘-알루미늄합금용융도금강판도금층상함량측정방법에관한것으로, 도금에사용된아연--마그네슘-알루미늄-(기타원소)의조성에따른열역학적평형상태또는비평형상태에서의표준상분율을계산하는표준상분율계산단계(S1단계)와; X선회절기에의해도금강판도금층의회절피크를수집하는도금층의회절피크수집단계(S2단계)와; 수집된회절피크의 (002)Zn과 (00 4)Zn의강도에따라아연상, 마그네슘상, 알루미늄상의특정회절피크들의조합으로부터아연상, 마그네슘상, 알루미늄상의분율을계산하는분율계산단계(S3단계) 및; 상기측정된평형, 비평형조성별표준상분율과계산된아연상, 마그네슘상, 알루미늄상의분율을비교검증하여도금층의상함량을측정하는도금층상함량측정단계(S4단계)로이루어져고내식아연-알루미늄-마그네슘-(기타원소) 용융도금강판도금층상함량을측정하는데종래의전자선미소부탐침기(EPMA) 또는전자선후방산란회절(EBSD)에의한측정법의 2차원마이크로미터영역분석의한계를극복하여 3차원밀리미터영역분석데이터를제공할 수있으며, 더욱중요한효과로서는열역학적계산에의한표준상분율검증단계를포함하므로보다신뢰성있는정량분석결과를제공할수 있는각별한장점이있는유용한발명이다.

Abstract translation: 本发明和耐腐蚀锌上（其它元素）热力学平衡或根据状态 - 镁 - 铝合金热浸镀涉及一种钢板的组合物非平衡镀层中的含量的测定方法，用于电镀 - 镁 - 铝锌 计算标准相分数的标准相分数计算步骤（S1步骤） 在X射线季节收集电镀钢板镀层的衍射峰的衍射峰收集步骤（S2步骤） 根据所收集的衍射峰（S3）的（002）Zn和（004）Zn的强度，结合锌，镁和铝相的特定衍射峰的镁馏分和铝馏分 步骤），和; （S4），用于通过比较所测量的平衡和非平衡类型标准的分数和计算的锌，镁和铝的分数来测量镀层的含量， 镁（和其它元件）熔化涂覆钢板层测量的在三维空间中的内容，以克服由常规电子船尾烘烤探针组（EPMA）或电子背散射衍射（EBSD）测量二维微米区域分析的局限性 毫米区域，以提供分析数据，并且在特定的优点，即可以提供定量的结果更可靠的一个有用的发明，以便包含根据热力学计算的标准验证步骤中的部分的更显著效果。

公开(公告)号：KR1020160140378A

公开(公告)日：2016-12-07

申请号：KR1020160056366

申请日：2016-05-09

Applicant: 스미토모 고무 고교 가부시키가이샤

Inventor： 마스이도모미 ,  기시모토히로유키

IPC: G01N23/04 ,  G01N33/44 ,  C08J3/24 ,  C08J3/26

CPC classification number: G01N23/202 ,  C08F212/08 ,  G01N23/201 ,  G01N33/445 ,  G01N2223/054 ,  G01N2223/1016 ,  G01N2223/106 ,  G01N2223/345 ,  G01N23/043 ,  C08J3/248 ,  C08J3/26 ,  G01N2203/0092

Abstract: 가교고무의가교소밀(疎密)을평가하는방법을제공한다. 본발명은, 가교고무를상이한팽윤도로팽윤시킴으로써제조한측정시료를이용하여, 소각 X선산란법또는소각중성자산란법에의해가교고무의가교소밀을평가하는방법에관한것이다.

Abstract translation: 提供了评价交联橡胶中的交联浓度的方法。 本发明涉及通过使用通过使交联橡胶膨胀到不同程度的膨胀而制备的测量样品，通过小角度X射线散射或小角度中子散射来评估交联橡胶中的交联浓度的方法。

公开(公告)号：KR1020160137951A

公开(公告)日：2016-12-02

申请号：KR1020167019645

申请日：2015-02-02

Applicant: 가부시키가이샤 리가쿠

Inventor： 오모떼가즈히꼬 ,  이또가즈끼

IPC: G01N23/201 ,  G21K1/06 ,  G21K1/10

CPC classification number: G01N23/201 ,  G01N2223/054 ,  G01N2223/056 ,  G01N2223/315 ,  G21K1/06 ,  G21K1/10

Abstract: 콤팩트한구성이며또한높은신호백그라운드비로비등방의상을동시에찍을수 있는미소빔 생성유닛및 X선소각산란장치를제공한다. 1차원검출기또는 2차원검출기에의해회절 X선을검출하기위해서, 시료에조사하는미소한스폿사이즈의 X선을생성하는미소빔 생성유닛(110)으로서, X선광로상에형성되며, X선을평행빔으로정형하는슬릿(115)과, (+, -, -, +)로배치되며, 슬릿에의해정형된평행빔의기생산란을제거하는 2개의채널커트모노크로메이터결정(117, 118)을구비한다. 이에의해, 콤팩트한구성이며또한높은신호백그라운드비로비등방의상을동시에얻을수 있다.

Abstract translation: 提供了一种能够以紧凑型配置和X射线小角度散射装置同时捕获高信号到背景比的各向异性图像的微光束产生单元。 为了通过一维检测器或二维检测器检测衍射X射线，微光束产生单元110产生具有照射样品的微点尺寸的X射线。 微光束产生单元110包括设置在X射线光路上并将X射线成为平行光束的狭缝115，以及排列成（+， - ， - ）的两个通道切割单色仪晶体117和118， - ，+），并消除由狭缝重新形成的平行光束的寄生散射。 因此，可以以紧凑的结构同时获得高信号到背景比的各向异性图像。

公开(公告)号：KR101378757B1

公开(公告)日：2014-03-27

申请号：KR1020120095298

申请日：2012-08-30

Applicant: 한국원자력연구원

Inventor： 하장호 ,  김영수 ,  김한수 ,  여순목

IPC: G01N23/04 ,  G01N23/20

CPC classification number: G01N23/201 ,  G01N23/04 ,  G01N23/06 ,  G01N23/083 ,  G01N23/087 ,  G01N23/20 ,  G01N23/202

Abstract: 본 발명은 물질 원소 정보 획득 및 영상 차원의 선택이 가능한 방사선 영상화 장치에 관한 것으로, 본 발명의 목적은 방사선 및 물질 간 상호 작용 방식을 모두 이용하여 영상을 얻음으로써 영상 해상도 및 검출 효율을 향상하는, 물질 원소 정보 획득 및 영상 차원의 선택이 가능한 방사선 영상화 장치를 제공함에 있다. 본 발명의 다른 목적은, 특히 단일 광자 3차원 추적 기술을 이용함으로써 단일 에너지의 방사선원으로도 3차원 영상을 얻을 수 있음과 동시에 피사체의 원소를 구분할 수 있게 하는, 물질 원소 정보 획득 및 영상 차원의 선택이 가능한 방사선 영상화 장치를 제공함에 있다.

公开(公告)号：KR1020060044295A

公开(公告)日：2006-05-16

申请号：KR1020050018206

申请日：2005-03-04

Applicant: 가부시키가이샤 리가쿠

Inventor： 이또,요시야스

IPC: G01N23/20 ,  G01N9/24

CPC classification number: G01N23/201 ,  G01N15/088 ,  G01N2015/086

Abstract: A void or particle content is determined using the X-ray small angle scattering measurement for a sample made of a thin film (10) having voids (14) or particles (16) disorderly dispersed in the matrix (12), the diffraction peaks being not available for such a sample. The invention includes three aspects. The first aspect is that a equipment constant is determined and an unknown void or particle content is calculated based on the equipment constant. The second aspect is that a plurality of samples having unknown matrix densities are prepared, the matrix densities are determined so that the difference in the matrix densities among the samples become a minimum, and a void or particle content is calculated based on the matrix density and the scale factor of the X-ray small angle scattering. The third aspect is for a plurality of samples having unknown particle densities and executes procedures similar to those of the second aspect.

公开(公告)号：KR1020040020915A

公开(公告)日：2004-03-09

申请号：KR1020037015865

申请日：2002-06-17

Applicant: 가부시끼가이샤 리가쿠

Inventor： 오모테카즈히코

IPC: G01N23/20

CPC classification number: G01N23/20 ,  G01N23/201 ,  G01N23/203

Abstract: 밀도불균일 시료 내의 입자형상물의 분포상태를 해석하는 밀도불균일 시료 해석방법에 있어서, 실측 X선 산란곡선이 면내 회절측정에 의한 면내 X선 산란곡선이고, 그 면내 X선 산란곡선과 시뮬레이트 X선 산란곡선의 피팅을 행하여, 시뮬레이트 X선 산란곡선과 면내 X선 산란곡선이 일치하였을 때의 피팅 파라미터의 값을 밀도불균일 시료 내의 입자형상물의 면내방향의 분포상태로 함으로써, 이방성이 있는 밀도불균일 시료 내에 있어서의 입자형상물의 면내방향의 분포상태를 간이하고 또한 고정밀도로 해석할 수 있는, 밀도불균일 시료 해석방법, 장치 및 시스템을 제공한다.

公开(公告)号：US12085521B2

公开(公告)日：2024-09-10

申请号：US18307823

申请日：2023-04-27

Applicant: Bruker Technologies Ltd.

Inventor： Alex Dikopoltsev ,  Matthew Wormington ,  Yuri Vinshtein ,  Alexander Krokhmal

IPC: G01N23/201 ,  G01N23/207 ,  G01N23/223 ,  G01T1/166

CPC classification number: G01N23/201 ,  G01N23/207 ,  G01N23/223 ,  G01T1/166 ,  G01N2223/6116

Abstract: A method for evaluating a sample that includes an array of structural elements. The method includes obtaining a first small angle x-ray scattering (SAXS) pattern for a first angular relationship between the sample and an x-ray beam that exhibits a first collimation value and has a given cross-sectional area on a first side of the sample. A second SAXS pattern is obtained for a second angular relationship between the sample and the x-ray beam, while the x-ray beam exhibits a second collimation value that differs from the first collimation value while maintaining the given cross-sectional area of the x-ray beam on the first side of the sample, wherein the second angular relationship differs from the first angular relationship.

公开(公告)号：US20240255403A1

公开(公告)日：2024-08-01

申请号：US18587732

申请日：2024-02-26

Applicant: CANON KABUSHIKI KAISHA

Inventor： RYO OGAWA ,  TAKAYUKI HIRATANI ,  KANA SATO ,  MASAHIRO WATANABE ,  TETSUO HINO

IPC: G01N3/42 ,  B08B1/16 ,  G01N23/201 ,  G03G21/00

CPC classification number: G01N3/42 ,  B08B1/16 ,  G01N23/201 ,  G01N2203/0082 ,  G03G21/0017

Abstract: The molded body is a non-foamed molded body including a polyurethane, wherein a Martens hardness measured at a point on the surface of the molded body positioned at a shortest distance from the center of gravity G is 1.0 N/mm2 or more, and three points of Martens hardness measured in a cross-section of the molded body satisfies a specific relational expression, wherein an index value Kω from a scattering profile obtained by allowing a characteristic X-ray from a Cu tube to incident on a surface region to be evaluated of the molded body satisfies a specific relational expression, and wherein the molded body has an erosion rate E of 0.6 μm/g or less, which is measured with spherical alumina particles having an average particle diameter (D50) of 3.0 μm in the surface region to be evaluated.

公开(公告)号：US20240248050A1

公开(公告)日：2024-07-25

申请号：US18562508

申请日：2022-05-24

Applicant: XENOCS SAS

Inventor： Peter HOGHOJ ,  Karsten JOENSEN ,  Pierre PANINE

IPC: G01N23/201 ,  G01N23/20008

CPC classification number: G01N23/201 ,  G01N23/20008 ,  G01N2223/33

Abstract: An X-ray scattering apparatus has a sample vacuum chamber, a sample holder placed inside the sample vacuum chamber for aligning and/or orienting a sample to be analyzed by X-ray scattering, an X-ray beam delivery system having a 2D X-ray source and a 2D monochromator and being arranged upstream of the sample holder for generating and directing an X-ray beam along a beam path in a propagation direction towards the sample holder. An X-ray detector placed inside a diffraction chamber connected to the sample vacuum chamber where the X-ray detector is arranged downstream of the sample holder and is movable, in a motorized way, along the propagation direction so as to detect the X-ray beam and X-rays scattered at different scattering angles, where the X-ray beam delivery system is configured to focus the X-ray beam onto a focal spot on or near the X-ray detector when placed at its distal position.

公开(公告)号：US11994454B2

公开(公告)日：2024-05-28

申请号：US17605065

申请日：2020-04-24

Applicant: Hitachi, Ltd. ,  TOYOTA JIDOSHA KABUSHIKI KAISHA

Inventor： Akinori Asahara ,  Hidekazu Morita ,  Takuya Kanazawa ,  Kanta Ono ,  Masao Yano ,  Tetsuya Shoji

IPC: G01N15/0205 ,  G01N23/201

CPC classification number: G01N15/0211 ,  G01N23/201

Abstract: Automated analysis of particle beam measurement results is facilitated by a device that calculates a spatial parameter distribution representing spatial structure of a sample based on a scattering pattern corresponding to projection of the spatial structure of the sample to wavenumber space, the projection being obtained by detecting scattering of a particle beam which enters the sample and intersects with the sample. The device includes a section to provide estimates for signals on the scattering pattern in association with at which point on a spatial parameter distribution of the sample interactions occur during scattering; a section to aggregate estimation results of the interaction estimation section to calculate a spatial parameter distribution of a sample matching an aggregated result; and a section to perform alternately and repeatedly estimation in the interaction estimation section and calculation in the parameter distribution calculation section in order to improve estimation accuracy in spatial parameter distributions.