Abstract:
A method of fabricating a polymer or resist pattern over a substrate includes coating a photosensitive polymer or resist over the substrate to form a polymer or resist layer, determining a portion of the polymer or resist layer to be exposed to light, placing a light adjusting layer in an optical path of light shone on the polymer or resist layer, and adjusting the light adjusting layer to adjust a direction or intensity of the light shone on the polymer or resist layer. Based on the method, it is easy to fabricate a polymer or resist pattern, a metal film pattern, metal pattern structure, and a polymer mold, each having three-dimensional structures with various slopes or shapes by adjusting a direction or intensity of incident light when performing a lithography process.
Abstract:
The present invention relates to polymer patterns of various shapes formed using modifications of means and methods used in the prior lithography process, and the metal film patterns, metal patterns and plastic molds using the polymer patterns, as well as methods of forming these patterns and molds. The method of forming the polymer patterns comprises the steps of: (a) depositing a photosensitive polymer on the substrate to form a polymer film; (b) placing a photomask on the polymer film; and (c) irradiating the polymer film with a light moving in random direction through the photomask, so as to form at least one pattern which is concave from the surface of the polymer film in a direction perpendicular to the substrate and extends in a direction parallel to the substrate. The inventive polymer patterns have at least one pattern which is concave from the surface of the polymer film in a direction perpendicular to the substrate and extends in a direction parallel to the substrate. The vertical cross-section of the concave patterns has at least one curved surface.
Abstract:
An exposure unit and method for imaging a photosensitive material includes a source of radiation for exposing the photosensitive material to actinic radiation such that the radiation strikes the photosensitive material at a plurality of angles of incidence, and apparatus for moving the radiation source relative to and in a plane parallel to the photosensitive material. The exposure unit also has a reflector for controlling (1) the proportion of (a) radiation having perpendicular angles of incidence to (b) radiation having non-perpendicular angles of incidence, such that the radiation having non-perpendicular angles is increased, and (2) the distribution of non-perpendicular angles of incidence.
Abstract:
A method and a device for transferring minute patterns (12) on the mask (11) to the substratum (17) by means of illuminating optical system (1-10) projecting beams of illuminating light onto the mask (11) and a projection aligner having a projection optical system (13) for projecting images of minute patterns (12) on the substratum (17). Beams of said illuminating light are thrown, as at least a pair of luminous fluxes slantwise facing the mask (11), through a pair of light transmitting windows (6a, 6b) of a spatial filter (6) onto the minute patterns (12), and, as a result, one of diffracted beams of the light of +/- first orders caused by minute patterns (12) of the illuminated mask (11) and diffracted beams of zero order pass portions, equidistantly spaced apart from the optical axis of the projection optical system, of or near the Fourier transform surface (14) in the projection optical system (13) for minute patterns (12) on the mask (11) so that projected images may be formed to be sharp in contrast and high in resolution on the substratum (17) at a large focal depth.
Abstract:
A method includes measuring properties of a three-dimensional topography of a lithographic patterning device, the patterning device including a pattern and being constructed and arranged to produce a pattern in a cross section of a projection beam of radiation in a lithographic projection system, calculating wavefront phase effects resulting from the measured properties, incorporating the calculated wavefront phase effects into a lithographic model of the lithographic projection system, and determining, based on the lithographic model incorporating the calculated wavefront phase effects, parameters for use in an imaging operation using the lithographic projection system.
Abstract:
Vorrichtung zur automatisierten Durchführung von Rückseitenvorbelichtung, Hauptbelichtung sowie Entwickeln digital bebilderbarer Flexodruckelemente sowie Verfahren zur Herstellung von Flexodruckplatten ausgehend von digital bebilderten Flexodruckelementen unter Verwendung der besagten Apparatur.
Abstract:
본 발명은 지지롤 및 상기지지 롤의 적어도 일면을 감싸도록 구비되고, 요철부를 갖는 플롁서블 (flexible) 기재를 포함하며, 상기지지 롤과 상기 플롁서블 기재 사이에 다공성 시트가 구비된 것인 클리쉐, 클리쉐의 제조방법 및 클리쉐를 이용한 인쇄방법을 제공한다.