101.
    发明专利
    未知

    公开(公告)号:DE60032049D1

    公开(公告)日:2007-01-11

    申请号:DE60032049

    申请日:2000-04-06

    Inventor: WUIDART LUC

    Abstract: The distance between a smart card and terminal is measured by a circuit that compares the level of rectified (D) voltage in transponder when its receiver circuit (L2,C'2) is set to resonate at the terminal frequency with the rectified voltage when a capacitor (C3) is switched (K1) into the circuit to shift the transponder resonant frequency away from the excitation frequency.

    102.
    发明专利
    未知

    公开(公告)号:DE69835328D1

    公开(公告)日:2006-09-07

    申请号:DE69835328

    申请日:1998-11-20

    Abstract: The fluorescent lamp (T) has a bridge rectifier (10) for the incoming low frequency mains supply. The rectifier output (11, 12) is bridged by a switch (M) driven at high frequency to provide a chopped current. Inductors (40, 41) are connected in series in two arms of the bridge and are connected by a switch (36, 37, 38) to form an energy recovery circuit.

    CIRCUIT D'ALIMENTATION ADAPTABLE
    103.
    发明专利

    公开(公告)号:FR2873243A1

    公开(公告)日:2006-01-20

    申请号:FR0451511

    申请日:2004-07-13

    Inventor: WUIDART LUC

    Abstract: L'invention concerne un circuit d'alimentation et un transpondeur comportant un circuit de redressement (13') d'une tension alternative (VE) et deux éléments de stockage d'énergie (C3, C4), le circuit de redressement fournissant une tension redressée à au moins un des éléments de stockage et une tension de sortie (VS) étant fournie par au moins un des éléments de stockage, et au moins un élément de commutation (S1) pour basculer le fonctionnement du circuit entre un état de fourniture d'une tension relativement élevée et un état de fourniture d'une tension relativement faible, le deuxième état configurant le circuit de redressement en fonctionnement mono-alternance.

    104.
    发明专利
    未知

    公开(公告)号:DE60102509T2

    公开(公告)日:2005-01-05

    申请号:DE60102509

    申请日:2001-05-11

    Inventor: WUIDART LUC

    Abstract: A terminal for generating an electromagnetic field adapted to communicating with at least one transponder, and a method for controlling such a terminal including: an oscillating circuit adapted to being excited by a remote supply signal of the transponder; a phase demodulator for detecting possible data transmitted by the transponder; circuitry for regulating the signal phase in the terminal's oscillating circuit on a reference value; circuitry for measuring variables linked to the current in the oscillating circuit and to the voltage thereacross; and circuitry for comparing current values of these variables with predetermined values, to determine the presence of a transponder.

    Memory cell with three states, two programmable and one non-programmed state, comprises pre-read stages and programming stages with resistors of polycrystalline silicon

    公开(公告)号:FR2846776A1

    公开(公告)日:2004-05-07

    申请号:FR0213615

    申请日:2002-10-30

    Abstract: The memory cell (1) comprises at least one, in particular two branches (2,3) connected between two terminals (4,5) where the read voltage (Vr) is applied; each branch comprises two stages connected in series, that is a pre-read stage (6,7) each with two switchable resistors (Rg1,Rg2;Rg3,Rg4) connected in parallel, and a programming stage (8,9) containing a programmable resistor (Rp1,Rp2) of polycrystalline silicon, where the programmable resistors terminals (14,15) are accessible to a proper programming circuit to implement an irreversible decrease of each programmable resistance. The decrease (delta)Rp of the value of the programmable resistance (Rp1,Rp2) is predetermined and chosen to be greater than the difference (delta)Rg between two resistances (Rg1,Rg2;Rg3,Rg4) in the pair of each pre-read stage (6,7). The memory cell also comprises interrupters (K10,K11) for isolating the pre-read stages (6,7) from the programming stages (8,9). The programming stages comprise switches (K14,K15) for aplying the programming voltage (Vp) which is higher than the read voltage (Vr) to the terminals of the programmable resistors (Rp1,Rp2). The reading of the cell state is effected in two successive steps in the course of which the switchable resistors (Rg1,Rg2,Rg3,Rg4) of the pre-read stages are alternatingly selected. Each programmable resistor (Rp1,Rp2) is connected to the lower supply voltage terminal, in particular the ground (5) by a transistor (MN1,MN2) connected as a bistable with the transistor of the other branch. The switchable resistors (Rg1,Rg2;Rg3,Rg4) of the two branches (2,3) are simultaneously controlled so that the values of the selected resistances in each branch are inverted. The irreversible decrease (delta) Rp of the programmable resistances is greater than the difference (E) of the nominal values of the programmable resistances in the non-programmed state. In a variant of the memory cell, the terminal of the programmable resistor is the read terminal which is connectable to the first input of an amplifier whose second input is connected to a reference potential which is chosen at a level intermediate between the voltage levels at the read terminal in the two read phases when the programmable resistance is in the non-programmed state. A method (claimed) for reading the memory cell (claimed) consists in effecting two successive read steps in the course of which the switchable resistances of the pre-read stage are selected.

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