Abstract:
The invention relates to a method for the 3-dimensional measurement of a sample with a measuring system having a 3-dimensional measuring space and comprising a laser scanning microscope, characterised by—providing the measuring system with a 3-dimensional virtual reality device,—creating the 3-dimensional virtual space of the measuring space using the 3-dimensional virtual reality device,—allowing for selecting an operation in the virtual space,—providing real-time unidirectional or bidirectional connection between the measuring space and the virtual space such that an operation selected in the virtual space is performed in the measuring space and data measured in the measuring space is displayed in the virtual space. The invention further relates to a measuring system for the 3-dimensional measurement of a sample, the measuring system having a 3-dimensional measuring space and comprising a laser scanning microscope, characterised by further comprising a 3-dimensional virtual reality device for displaying a 3-dimensional virtual space of the measuring space, and a real-time unidirectional or bidirectional connection is provided between the laser scanning microscope and the 3-dimensional virtual reality device.
Abstract:
The invention relates to a method for carrying out measurements on at least one region of interest within a sample via a laser scanning microscope having focusing means for focusing a laser beam and having electro-mechano-optic deflector for deflecting the laser beam, the method comprising: - providing a scanning trajectory for the at least one region of interest; - providing a sequence of measurements and the corresponding scanning trajectories; - providing cross-over trajectories between the scanning trajectories of two consecutive measurements; - deflecting the laser beam via the electro-mechano-optic means for moving a focus spot of the focused laser beam along a scanning trajectory at an average scanning speed; and - deflecting the laser beam via the electro-mechano-optic means for moving the focus spot of the laser beam along a cross-over trajectory at a cross-over speed having a maximum, the maximum of the cross-over speed being higher than the average scanning speed. The invention further relates to a measuring system for implementing the method according to the invention
Abstract:
The object of the invention relates to a method for scanning with an optical beam (50) using a first acousto-optic deflector (15, 15') having an optical axis along a Z-axis and at least one acousto-optic crystal layer (14), involving directing the optical beam (50) in the first acousto-optic deflector (15, 15'), and deflecting the optical beam (50) along an X-axis perpendicular to the Z-axis by means of the first acousto-optic deflector (15, 15'), during which generating a plurality of acoustic chirp signals (30) in the at least one acousto-optic crystal layer (14) of the acousto-optic deflector (15, 15') by - generating a first acoustic chirp signal (30a) having a duration of t in the acousto-optic crystal layer (14), then - generating a second acoustic chirp signal (30b) in the acousto-optic crystal layer (14) within a t period of time counted from the start of the generation of the first acoustic chirp signal (30a).
Abstract:
The invention relates to a method for scanning along a substantially straight line (3D line) lying at an arbitrary direction in a 3D space with a given speed using a 3D laser scanning microscope having a first pair of acousto-optic deflectors deflecting a laser beam in the x-z plane (x axis deflectors) and a second pair of acousto-optic deflectors deflecting the laser beam in the y-z plane (y axis deflectors) for focusing the laser beam in 3D. The invention further relates to a method for scanning a region of interest with a 3D laser scanning microscope having acousto-optic deflectors for focusing a laser beam within a 3D space defined by an optical axis (Z) of the microscope and X, Y axes that are perpendicular to the optical axis and to each other.
Abstract:
The invention relates to a method for scanning along a continuous scanning trajectory with a scanner system (100) comprising a first pair of acousto-optic deflectors (10) for deflecting a focal spot of an electromagnetic beam generated by a consecutive lens system (200) defining an optical axis (z) in an x-z plane, and a second pair of acousto-optic deflectors (20) for deflecting the focal spot in a y-z plane being substantially perpendicular to the x-z plane, characterised by changing the acoustic frequency sweeps with time continuously in the deflectors (12, 12') of the first pair of deflectors (10) and in the deflectors (22, 22') of the second pair of deflectors (20) so as to cause the focal spot to move continuously along the scanning trajectory.