公开(公告)号：EP3236242A1

公开(公告)日：2017-10-25

申请号：EP15869789.6

申请日：2015-12-01

Applicant: Konica Minolta, Inc.

Inventor： NAKAMURA, Yukito ,  NAGAE, Kosuke ,  KAYA, Takatoshi

IPC: G01N21/64

CPC classification number: G01N21/648 ,  G01J3/0202 ,  G01J3/0224 ,  G01J3/0237 ,  G01J3/18 ,  G01N21/6428 ,  G01N21/6445 ,  G01N33/54373 ,  G01N2021/6439 ,  G01N2021/6463 ,  G01N2201/0683

Abstract: The surface plasmon-enhanced fluorescence measurement device has: a light source that irradiates the diffraction grating with a linearly polarized excitation light; a rotating part that changes the direction of the optical axis of the excitation light with respect to the diffraction grating when seen in plan view, or changes the polarization direction of the excitation light with respect to the diffraction grating; a polarizer that extracts linearly polarized light from the fluorescence emitted from the fluorescent substance; and a light detection unit that detects the linearly polarized light extracted by the polarizer.

Abstract translation: 该表面等离子体增强荧光测量装置具有：光源，其用线偏振激发光照射衍射光栅; 旋转部分，其在平面图中观察时改变激发光的光轴相对于衍射光栅的方向，或者改变激发光相对于衍射光栅的偏振方向; 偏振器，其从荧光物质发出的荧光中提取线性偏振光; 以及检测由起偏器提取的线偏振光的光检测单元。

公开(公告)号：EP3066455A4

公开(公告)日：2017-07-05

申请号：EP14858305

申请日：2014-11-04

Applicant: AGENCY SCIENCE TECH & RES

Inventor： WONG CHI LOK ,  OLIVO MALINI

IPC: G01N21/552 ,  G01N21/21

CPC classification number: G01N21/553 ,  G01N21/21 ,  G01N2201/0683 ,  G01N2201/12

Abstract: An optical sensing device is provided, including a first polarizer, a second polarizer, wherein the first polarizer and the second polarizer have respective transmission axes aligned in orthogonal directions, an SPR sensor arrangement including an SPR sensing surface, the SPR sensor arrangement arranged to receive an incident light beam passed through a polarizer to be reflected at the SPR sensing surface and transmitted through a second polarizer to provide a transmitted light beam, a detector arrangement configured to detect the transmitted light beam, the transmitted light beam including a sensing signal and a reference signal, and a processor electrically coupled to the detector arrangement, the processor configured to perform a subtraction operation between the sensing signal and the reference signal. The optical sensing is based on a differential measurement scheme. The subtraction between the sensing signal and the reference signal cancels the common path noise and enhances the sensor resolution.

Abstract translation: 提供了一种光学感测设备，其包括第一偏振器，第二偏振器，其中第一偏振器和第二偏振器具有在正交方向上对准的相应透射轴，包括SPR感测表面的SPR传感器布置，SPR传感器布置被布置为接收 入射光束穿过偏振器以在SPR感测表面处反射并透射通过第二偏振器以提供透射光束;检测器装置，配置为检测透射光束;透射光束包括感测信号;和 参考信号以及电耦合到所述检测器装置的处理器，所述处理器被配置为执行所述感测信号和所述参考信号之间的减法操作。 光学传感基于差分测量方案。 感测信号和参考信号之间的相减抵消了公共路径噪声并提高了传感器分辨率。

公开(公告)号：EP3153843A1

公开(公告)日：2017-04-12

申请号：EP15802877.9

申请日：2015-06-03

Applicant: University of Tsukuba

Inventor： YASUNO, Yoshiaki ,  KASARAGOD, Deepa Kamath

IPC: G01N21/17 ,  G01N21/21

CPC classification number: G01N21/21 ,  A61B3/102 ,  G01B9/02044 ,  G01B9/02083 ,  G01B9/02091 ,  G01B2290/70 ,  G01N21/17 ,  G01N21/4795 ,  G01N2201/0683 ,  G01N2201/12

Abstract: Polarization-sensitive optical image measurement is subject to a non-negligible bias, and consequent deviation in birefringence, in a surrounding range of low SN ratios (signal-to-noise ratios) and low signal strengths; however, this deviation in birefringence is removed to make accurate quantitative measurement possible. Noise-containing OCT signals obtained by polarization OCT are processed using a birefringence calculation algorithm, to obtain measured birefringence, after which noise is statistically adjusted to simulate a measured birefringence distribution and determine the noise characteristics of the measured birefringence values, and then Monte Carlo calculations are repeated by assuming different values for the noise level and the true birefringence value, respectively, to form three-dimensional histogram of combinations of true birefringence values, SN ratios, and measured birefringence values, after which specified measured birefringence values and SN ratios are assumed from the three-dimensional histogram information to obtain a true birefringence probability density distribution, and true birefringence values are estimated from the true birefringence probability density distribution.

Abstract translation: 在低SN比（信噪比）和低信号强度的周围范围内，极化敏感的光学图像测量受到不可忽视的偏差和双折射的偏差， 然而，这种双折射偏差被去除以使得可以进行准确的定量测量。 使用双折射计算算法处理通过偏振OCT获得的含噪声的OCT信号，以获得测量的双折射，之后统计地调整噪声以模拟测量的双折射分布并确定测量的双折射值的噪声特性，然后进行蒙特卡洛计算 通过分别假设噪声水平和真实双折射值的不同值来重复，以形成真双折射值，SN比和测量的双折射值的组合的三维直方图，之后假设指定的测量双折射值和SN比 从三维直方图信息获得真正的双折射概率密度分布，并且从真双折射概率密度分布估计真正的双折射值。

公开(公告)号：EP3081163A3

公开(公告)日：2017-03-15

申请号：EP16164562.7

申请日：2016-04-08

Applicant: Taiwan Biophotonic Corporation

Inventor： LI, YU-TANG ,  CHU, CHANG-SHENG ,  HO, KUAN-JUI ,  HO, PEI-CHENG ,  CHUNG, SHUANG-CHAO ,  FAN, CHIH-HSUN ,  CHEN, JYH-CHERN

IPC: A61B5/145 ,  A61B5/1455 ,  A61B5/00 ,  A61B3/10 ,  G01N21/64

CPC classification number: G01N21/21 ,  A61B3/10 ,  A61B3/152 ,  A61B5/1455 ,  G01B11/272 ,  G01N33/483 ,  G01N2201/0633 ,  G01N2201/0683 ,  G01N2201/126

Abstract: The present disclosure generally relates to an optical measurement module, an optical measurement device, and a method for optical measurement. The optical measurement module provides optical architecture to measure the optical properties of an analyte. The optical measurement device comprising the optical measurement module is configured to measure the optical properties of an analyte. The method for the optical measurement provides steps for optical measurement.

Abstract translation: 本公开一般涉及光学测量模块，光学测量装置和用于光学测量的方法。 光学测量模块提供光学架构来测量分析物的光学性质。 包括光学测量模块的光学测量装置被配置为测量分析物的光学性质。 光学测量的方法提供光学测量的步骤。

公开(公告)号：EP3023771A4

公开(公告)日：2017-03-01

申请号：EP13889511

申请日：2013-11-28

Applicant: SHENYANG INST OF AUTOMATION OF THE CHINESE ACAD OF SCIENCES

Inventor： SUN LANXIANG ,  YU HAIBIN ,  XIN YONG ,  QI LIFENG ,  LI YANG ,  CONG ZHIBO

IPC: G01N21/63 ,  G01B11/14 ,  G01N21/21 ,  G01N21/69 ,  G01N21/71 ,  G01N21/85 ,  G01N33/20

CPC classification number: G01N21/63 ,  G01B11/14 ,  G01N21/21 ,  G01N21/718 ,  G01N21/8507 ,  G01N33/206 ,  G01N2021/695 ,  G01N2201/06113 ,  G01N2201/0636 ,  G01N2201/0683 ,  G01N2201/088

Abstract: An in-situ on-line detection device and detection method for a long-distance metallurgical liquid metal component. The detection device comprises a front-end high-temperature resistant probe (18), a middle-end optical sensing device (19) and a back-end control platform (24), wherein the head of the front-end high-temperature resistant probe (18) is placed in a liquid metal (22), the tail thereof is coaxially connected to the middle-end optical sensing device (19), and an optical window (15) is arranged in the connection position; and the middle-end optical sensing device (19) is connected to the back-end control platform (24) through a signal line (25). The detection device and detection method can provide a timely and valid message for quality control and a melting end, so that the detection time is greatly shortened, the detection distance can be adjusted extensively, the measurement result is accurate, and it can be achieved to measure components that are difficult to measure, such as C, S, P, etc.

公开(公告)号：EP3130914A1

公开(公告)日：2017-02-15

申请号：EP14889152.6

申请日：2014-04-08

Applicant: Konica Minolta, Inc.

Inventor： NAKAMURA, Yukito ,  KAYA, Takatoshi ,  NAGAE, Kosuke ,  NOZAKI, Akitoshi ,  NAGAI, Fumio ,  ISHIKAWA, Ryouta ,  NAMATAME, Akiyuki

IPC: G01N21/64

CPC classification number: G01N21/648 ,  G01J3/0224 ,  G01J3/4406 ,  G01N21/6428 ,  G01N21/6445 ,  G01N33/54373 ,  G01N2021/6439 ,  G01N2021/6463 ,  G01N2201/0612 ,  G01N2201/0683

Abstract: The present invention pertains to a surface plasmon enhanced fluorescence analysis device and a surface plasmon enhanced fluorescence measurement method which use GC-SPFS and make it possible to detect a substance to be detected with high sensitivity. This surface plasmon enhanced fluorescence measurement device has: a light source for irradiating the diffraction grating of a chip with excited light; a polarizer for removing linearly polarized light from fluorescent light emitted from a fluorescent substance on the diffraction grating; and a photodetector for detecting the linearly polarized light removed by the polarizer.

Abstract translation: 本发明涉及一种表面等离子体增强荧光分析装置和使用GC SPFS并使其能够检测的物质以高灵敏度检测表面等离子体增强荧光测量方法。 该表面等离子体增强荧光测量装置具有：用于照射激发光的芯片的衍射光栅的光源; 用于去除从荧光从所述衍射光栅的荧光物质发射的直线偏振光透过的偏振器; 和用于检测由所述偏振器除去直线偏振光的光电检测器。

公开(公告)号：EP3120134A1

公开(公告)日：2017-01-25

申请号：EP15709113.3

申请日：2015-02-18

Applicant: Centre National de la Recherche Scientifique (C.N.R.S.) ,  Ecole Polytechnique

Inventor： PAGNOUX, Dominique ,  VIZET, Jérémy ,  MANHAS, Sandeep ,  VANEL, Jean-Charles ,  DEBY, Stanislas ,  DE MARTTINO, Antonello

IPC: G01N21/21

CPC classification number: G01N21/21 ,  A61B1/07 ,  G01N2201/0636 ,  G01N2201/0683 ,  G01N2201/08 ,  G01N2201/12

Abstract: According to one aspect, the invention relates to a device (100) for remote polarimetric characterisation of a sample (S). It comprises a source (10) for emitting at least one incident light wave at at least one first wavelength (λ
Ε ); a monomode optical fibre (30) in which the incident light wave is intended to propagate; a polarisation state generator (PSG) arranged on the proximal side of the optical fibre; a reflector (40) intended to be arranged on the distal side of the optical fibre; a polarisation state analyser (PSA) arranged on the proximal side of the optical fibre and allowing, for each probe state of the incident wave generated by the polarisation state generator, the polarisation of the light wave obtained after propagation of the incident wave in the optical fibre (30), reflection from the distal side of the optical fibre and reverse propagation in the optical fibre (30), to be analysed. Processing means (70) make it possible to determine, from a first polarimetric characterisation of the optical fibre, a Mueller matrix (M
F ) associated with the optical fibre, and, from a second polarimetric characterisation of the assembly comprising the optical fibre and the sample, a Mueller matrix (Μ
T ) associated with said assembly. The Mueller matrix (Μ
o ) associated with the sample is determined from the Mueller matrices associated with the optical fibre and the assembly comprising the optical fibre and the sample, respectively.

Abstract translation: 根据一个方面，本发明涉及用于样本（S）的远程极化表征的装置（100）。 它包括用于以至少一个第一波长（λE）发射至少一个入射光波的光源（10）; 单模光纤（30），其中入射光波意图传播; 布置在光纤的近侧上的偏振态发生器（PSG） 旨在布置在光纤的远侧上的反射器（40）; 偏振状态分析仪（PSA），布置在光纤的近侧，并且对于由偏振状态发生器产生的入射波的每个探测状态，允许在入射波在光学中传播之后获得的光波的偏振 光纤（30），来自光纤远端的反射和光纤（30）中的反向传播。 处理装置（70）使得可以从光纤的第一极化表征确定与光纤相关联的穆勒矩阵（MF），并且根据包括光纤和样本的组件的第二极化表征 ，与所述组件相关联的穆勒矩阵（M T）。 与样品相关联的穆勒矩阵（M o）由与光纤相关联的穆勒矩阵和分别包括光纤和样品的组件确定。

公开(公告)号：EP3066455A1

公开(公告)日：2016-09-14

申请号：EP14858305.7

申请日：2014-11-04

Applicant: Agency for Science, Technology and Research

Inventor： WONG, Chi Lok ,  OLIVO, Malini

IPC: G01N21/55

CPC classification number: G01N21/553 ,  G01N21/21 ,  G01N2201/0683 ,  G01N2201/12

Abstract: An optical sensing device is provided, including a first polariser, a second polariser, wherein the first polariser and the second polariser have respective transmission axes aligned in orthogonal directions, an SPR sensor arrangement including an SPR sensing surface, the SPR sensor arrangement arranged to receive an incident light beam passed through a polariser to be reflected at the SPR sensing surface and transmitted through a second polariser to provide a transmitted light beam, a detector arrangement configured to detect the transmitted light beam, the transmitted light beam including a sensing signal and a reference signal, and a processor electrically coupled to the detector arrangement, the processor configured to perform a subtraction operation between the sensing signal and the reference signal. The optical sensing is based on a differential measurement scheme. The subtraction between the sensing signal and the reference signal cancels the common path noise and enhances the sensor resolution.

Abstract translation: 光学传感装置被提供，其包括第一偏振器，第二偏振器，worin所述第一偏振器和第二偏振器已经respectivement透射轴正交方向SPR传感器装置包括SPR传感表面对准，设置在SPR传感器装置接收 通过偏振器的入射光束的在所述SPR传感表面被反射和反式通过第二偏振器mitted，以提供反mitted光束，被配置为检测跨mitted光束，反式mitted光束包括一感测信号和一个检测器装置 参考信号，并且处理器，其电耦合到所述检测器装置，经配置以执行所述感测信号与参考信号之间的业务减法处理器。 光学感测是基于差分测量方案。 该感测信号与参考信号之间的相减抵消公共路径噪声并且增强了传感器的分辨率。

公开(公告)号：EP3030881A2

公开(公告)日：2016-06-15

申请号：EP13895463.1

申请日：2013-10-16

Applicant: Halliburton Energy Services, Inc.

Inventor： PRICE, James M. ,  PERKINS, David L.

IPC: G01N21/17 ,  G01J4/02 ,  G02B1/02

CPC classification number: G01V8/20 ,  E21B49/081 ,  G01J4/02 ,  G01N21/21 ,  G01N2201/0683 ,  G01N2201/12 ,  G02B1/02 ,  G02B5/3025

Abstract: An intensity-independent optical computing device and method for performing multivariate optical computing based on changes in polarization of the reflected and/or transmitted electromagnetic radiation to thereby determine sample characteristics.

Abstract translation: 一种强度无关的光学计算装置和方法，用于基于反射和/或发射的电磁辐射的极化的变化来执行多变量光学计算，从而确定样本特性。

公开(公告)号：EP2976674A2

公开(公告)日：2016-01-27

申请号：EP13886749.4

申请日：2013-06-12

Applicant: Halliburton Energy Services, Inc.

Inventor： SKINNER, Neal, Gregory ,  PERKINS, David, L.

IPC: G02B27/28 ,  G01N21/21

CPC classification number: G01N21/23 ,  G01B11/0625 ,  G01N21/314 ,  G01N2201/0683 ,  G02B5/3083

Abstract: Disclosed are optical computing devices that employ birefringent optical elements configured for use in optical computing devices. One optical computing device includes a polarizer configured to generate at least x polarized light and y polarized light, a birefringent integrated computational element configured to optically interact with a substance and the polarizer, thereby generating optically interacted light, and at least one detector arranged to receive the optically interacted light and generate an output signal corresponding to a characteristic of the substance.

Abstract translation: 公开了使用配置用于光学计算设备的双折射光学元件的光学计算设备。 一种光学计算装置包括配置成产生至少x个偏振光和y个偏振光的偏振器，被配置为与物质和偏振器光学相互作用从而产生光学相互作用的光的双折射集成计算元件，以及布置成接收 光学相互作用的光并产生对应于物质特性的输出信号。