Abstract:
In an information storage system having at least a storage medium which includes a plurality of storage areas. Each storage area is associated with one logical drive. Using a control device and in conjunction with an I/O control device and a memory, the system can process coexisting code and image information to permit a designated logical drive to access an area of the storage areas that corresponds to the designated logical drive according to correspondence relation information.
Abstract:
An image data transferring system interfaces an image processor and an image scanner by utilization of signal input and output ports of a common printer connector mounted on the image processor without using a specific dedicated interface to rationally transfer a multiple-bit image data signal from the image scanner. The image processor and said image scanner can share the signal input and output ports by classifying said ports into an output port block for feeding out a command signal from the image processor, an image data input port block for transferring the image data signal from the image scanner, and a control port block for issuing a control signal to be given to the image scanner. The effective transfer ports can be recognized by comparing a check signal to be given to the image scanner and its echo signal sent back from the image scanner.
Abstract:
Disclosed are high electrical charge density entities, generated in electrical discharge production. Apparatus for isolating the high charge density entities, selecting them and manipulating them by various guide techniques are disclosed. Utilizing such apparatus, the paths followed by the entities may be switched, or selectively varied in length, for example, whereby the entities may be extensively manipulated. Additional devices are disclosed for the manipulation and exploitation of these entities, including their use with a camera and also in an oscilloscope.
Abstract:
A charged particle beam apparatus in which a beam of charged particles emitted from a beam source is focussed on a target in a predetermined size and shape through a plurality of aperture members. Each of the aperture members is combined with a respective deflecting unit which effects a two-dimensional scan with the charged particle beam in response to a scan signal supplied thereto. The center axis of the aperture formed in the aperture member is arithmetically determined on the basis of time-based variation in the quantity of the charged particles trapped by the aperture member during the scan operation. Further, deviation of the arithmetically determined center axis of the aperture from a reference axis is determined. The aperture member is slided on a plane extending perpendicularly to the center axis of the aperture to cancel out the deviation.
Abstract:
In electron beam lithography, a beam of incident electrons exposes a preselected circuit pattern in a thin resist layer deposited on top of a substrate to be etched. Some of the electrons scatter from the substrate back into the resist layer producing an undesired exposure which produces variable resolution of features. In accordance with the disclosed technique, the region of the resist which is complementary to the desired circuit pattern is also exposed by an electron beam which has been adjusted to produce an exposure approximating that due to backscattering. This additional exposure removes the spatial variability in resolution attainable by the electron beam lithography.
Abstract:
Die Erfindung bezieht sich auf ein Verfahren zum Messen einer Spannung (8) mit den Verfahrensschritten: a) Erzeugen von Ionen eines Elements in einer Ionenquelle (1) und Formen eines gerichteten Ionenstrahls (2), b) Markieren einer Geschwindigkeitsklasse der Ionen durch Anregung mittels eines ersten Lasers (5) in einer ersten Kammer (3) und Bestimmen der Laserwellenlänge/Frequenz des ersten Lasers (5), c) Beschleunigen der Ionen mit der an eine zweite Kammer (4) angelegten Spannung (8), d) Messen einer durch die Spannung (8) verschobenen Resonanzfrequenz der Ionen der markierten Geschwindigkeitsklasse mittels eines zweiten Lasers (6) in der zweiten Kammer (4) und mittels eines Detektors zum Detektieren von Fluoreszenzstrahlung, e) Bestimmen der Spannung (8) aus der in d) gemessenen Resonanzfrequenz. Weiterhin bezieht sich die Erfindung auf eine Vorrichtung zum Durchführen des erfindungsgemäßen Verfahrens, umfassend A) eine Ionenquelle (1) zum Erzeugen eines Ionenstrahls (2) eines Elements, B) eine erste Kammer (3) und einen ersten Laser (5) zum Markieren einer Geschwindigkeitsklasse der Ionen durch Anregung mittels des ersten Lasers (5) in der ersten Kammer (3), C) eine Beschleunigungsstrecke zwischen der ersten Kammer (3) und einer zweiten Kammer (4), wobei zum Beschleunigen der Ionen die zu messende Spannung (8) zwischen der ersten Kammer (3) und der zweiten Kammer (4) anlegbar ist und D) einen zweiten Laser (6) und einer Anordnung zum Messen einer durch die Spannung verschobenen Resonanzfrequenz der Ionen der markierten Geschwindigkeitsklasse in der zweiten Kammer (4).
Abstract:
A system for distributing electric power from a wind farm generating medium to high voltage AC electricity to multiple electrolyser modules for producing hydrogen. A system for distributing electric power from a wind farm generating medium voltage DC electricity to multiple electrolyser modules for producing hydrogen.