公开(公告)号：US11923267B2

公开(公告)日：2024-03-05

申请号：US16831076

申请日：2020-03-26

Applicant: Intel Corporation

Inventor： Debendra Mallik ,  Je-Young Chang ,  Ram Viswanath ,  Elah Bozorg-Grayeli ,  Ahmad Al Mohammad

IPC: H01L23/367 ,  H01L23/373 ,  H01L23/495

CPC classification number: H01L23/3672 ,  H01L23/373 ,  H01L23/49568

Abstract: Thermal heat spreaders and/or an IC die with solderable thermal structures may be assembled together with a solder array thermal interconnects. A thermal heat spreader may include a non-metallic material and one or more metallized surfaces suitable for bonding to a solder alloy employed as thermal interface material between the heat spreader and an IC die. An IC die may include a metallized back-side surface similarly suitable for bonding to a thermal interconnect comprising a solder alloy. Metallization on the IC die and/or heat spreader may comprise a plurality of solderable structures. A multi-chip package may include multiple IC die having different die thickness that are accommodated by a z-height thickness variation in the thermal interconnects and/or the solderable structures of the IC die or heat spreader.

公开(公告)号：US20240063179A1

公开(公告)日：2024-02-22

申请号：US17821009

申请日：2022-08-19

Applicant: Intel Corporation

Inventor： Adel A. Elsherbini ,  Krishna Vasanth Valavala ,  Kimin Jun ,  Shawna M. Liff ,  Johanna M. Swan ,  Debendra Mallik ,  Feras Eid ,  Xavier Francois Brun ,  Bhaskar Jyoti Krishnatreya

IPC: H01L25/065 ,  H01L25/00 ,  H01L23/00 ,  H01L21/56

CPC classification number: H01L25/0652 ,  H01L25/50 ,  H01L24/20 ,  H01L24/08 ,  H01L21/568 ,  H01L24/19 ,  H01L24/06 ,  H01L2224/221 ,  H01L2224/211 ,  H01L2224/08225 ,  H01L2224/19 ,  H01L2224/0612 ,  H01L2224/06181 ,  H01L24/13 ,  H01L2224/13025 ,  H01L24/16 ,  H01L2224/16227 ,  H01L2924/381

Abstract: Microelectronic assemblies, related devices and methods, are disclosed herein. In some embodiments, a microelectronic assembly may include a dielectric layer having one or more conductive traces and a surface; a microelectronic subassembly on the surface of the dielectric layer, the microelectronic subassembly including a first die and a through-dielectric via (TDV) surrounded by a dielectric material, wherein the first die is at the surface of the dielectric layer; a second die and a third die on the first die and electrically coupled to the first die by interconnects having a pitch of less than 10 microns, and wherein the TDV is electrically coupled at a first end to the dielectric layer and at an opposing second end to the second die; and a substrate on and coupled to the second and third dies; and an insulating material on the surface of the dielectric layer and around the microelectronic subassembly.

公开(公告)号：US20240063120A1

公开(公告)日：2024-02-22

申请号：US17820961

申请日：2022-08-19

Applicant: Intel Corporation

Inventor： Adel A. Elsherbini ,  Shawna M. Liff ,  Debendra Mallik ,  Christopher M. Pelto ,  Kimin Jun ,  Johanna M. Swan ,  Lei Jiang ,  Feras Eid ,  Krishna Vasanth Valavala ,  Henning Braunisch ,  Patrick Morrow ,  William J. Lambert

IPC: H01L23/528 ,  H01L23/00 ,  H01L25/065 ,  H01L23/48 ,  H01L23/498 ,  H01L23/522 ,  H01L21/48

CPC classification number: H01L23/5286 ,  H01L24/08 ,  H01L24/05 ,  H01L24/16 ,  H01L25/0652 ,  H01L23/481 ,  H01L23/49811 ,  H01L23/49822 ,  H01L23/49833 ,  H01L23/49838 ,  H01L23/5283 ,  H01L23/5226 ,  H01L24/80 ,  H01L21/4853 ,  H01L21/4857 ,  H01L2924/37001 ,  H01L2924/3841 ,  H01L2924/3512 ,  H01L2224/80895 ,  H01L2224/80896 ,  H01L2224/05647 ,  H01L2224/05687 ,  H01L2224/08121 ,  H01L2224/08145 ,  H01L2224/08225 ,  H01L2224/16225

Abstract: Embodiments of a microelectronic assembly comprise: a plurality of layers of integrated circuit (IC) dies, each layer coupled to adjacent layers by first interconnects having a pitch of less than 10 micrometers between adjacent first interconnects; an end layer in the plurality of layers proximate to a first side of the plurality of layers comprises a dielectric material around IC dies in the end layer and a through-dielectric via (TDV) in the dielectric material of the end layer; a support structure coupled to the first side of the plurality of layers, the support structure comprising a structurally stiff base with conductive traces proximate to the end layer, the conductive traces coupled to the end layer by second interconnects; and a package substrate coupled to a second side of the plurality of layers, the second side being opposite to the first side.

公开(公告)号：US20240004129A1

公开(公告)日：2024-01-04

申请号：US17853732

申请日：2022-06-29

Applicant: Intel Corporation

Inventor： Sagar Suthram ,  Debendra Mallik ,  John Heck ,  Pushkar Sharad Ranade ,  Ravindranath Vithal Mahajan ,  Thomas Liljeberg ,  Wilfred Gomes ,  Abhishek A. Sharma ,  Tahir Ghani

IPC: G02B6/12 ,  G02B6/13 ,  H01L25/16 ,  H01L23/00

CPC classification number: G02B6/12002 ,  G02B6/12004 ,  G02B6/13 ,  H01L25/167 ,  H01L24/08 ,  H01L24/80 ,  H01L2224/08145 ,  H01L2224/80895 ,  H01L2224/80896

Abstract: Embodiments of a microelectronic assembly comprise: a plurality of microelectronic sub-assemblies arranged in an array; and a plurality of photonic integrated circuit (PIC) dies, each PIC die having waveguides. Adjacent microelectronic sub-assemblies are coupled to one of the PIC dies by interconnects such that any one PIC die is coupled to more than two adjacent microelectronic sub-assemblies, and the microelectronic sub-assemblies coupled to each PIC die in the plurality of PIC dies are communicatively coupled by the waveguides in the PIC die. Each microelectronic sub-assembly comprises: an interposer integrated circuit (IC) die comprising one or more electrical controller circuit proximate to at least one edge of the interposer IC die; a first plurality of IC dies coupled to a first surface of the interposer IC die; and a second plurality of IC dies coupled to an opposing second surface of the interposer IC die.

公开(公告)号：US20230387074A1

公开(公告)日：2023-11-30

申请号：US17825350

申请日：2022-05-26

Applicant: Intel Corporation

Inventor： Debendra Mallik ,  Nitin Deshpande ,  Satish Damaraju ,  Scott Siers ,  Kai-Chiang Wu

IPC: H01L25/065 ,  H01L23/498 ,  H01L23/31 ,  H01L23/538 ,  H01L23/00

CPC classification number: H01L25/0652 ,  H01L23/49816 ,  H01L23/3128 ,  H01L23/5385 ,  H01L24/16 ,  H01L2224/16146 ,  H01L2224/16227 ,  H01L2225/06513

Abstract: An integrated circuit assembly may be formed having a first level structure that comprises a monolithic substrate with a first reticle zone including integrated circuitry and a second reticle zone including integrated circuitry, and a second level structure comprising at least one integrated circuit device electrically attached to the integrated circuitry of the first reticle zone of the first level structure and a bridge electrically attaching the integrated circuitry of the first reticle zone of the first level structure and the integrated circuitry of the second reticle zone of the first level structure.

公开(公告)号：US11824018B2

公开(公告)日：2023-11-21

申请号：US18089227

申请日：2022-12-27

Applicant: Intel Corporation

Inventor： Debendra Mallik ,  Ravindranath Mahajan ,  Robert Sankman ,  Shawna Liff ,  Srinivas Pietambaram ,  Bharat Penmecha

IPC: H01L23/00 ,  H01L21/48 ,  H01L21/56 ,  H01L23/31 ,  H01L23/538

CPC classification number: H01L23/562 ,  H01L21/486 ,  H01L21/4853 ,  H01L21/4857 ,  H01L21/565 ,  H01L21/568 ,  H01L23/3128 ,  H01L23/5381 ,  H01L23/5384 ,  H01L23/5385 ,  H01L23/5386 ,  H01L24/16 ,  H01L2224/16227 ,  H01L2924/3511

Abstract: Embodiments disclosed herein include electronic packages and methods of fabricating electronic packages. In an embodiment, an electronic package comprises an interposer, where a cavity passes through the interposer, and a nested component in the cavity. In an embodiment, the electronic package further comprises a die coupled to the interposer by a first interconnect and coupled to the nested component by a second interconnect. In an embodiment, the first and second interconnects comprise a first bump, a bump pad over the first bump, and a second bump over the bump pad.

公开(公告)号：US20230207428A1

公开(公告)日：2023-06-29

申请号：US17560915

申请日：2021-12-23

Applicant: Intel Corporation

Inventor： Surhud Khare ,  Shigeki Tomishima ,  Debendra Mallik

IPC: H01L23/48 ,  H01L23/528 ,  H01L21/768 ,  H01L25/065

CPC classification number: H01L23/481 ,  H01L21/76898 ,  H01L23/528 ,  H01L25/0657

Abstract: Techniques and mechanisms for incorporating an integrated circuit (IC) die into a die stack. In an embodiment, the die comprises multiple interconnects extending vertically through the die. The multiple interconnects comprise first interconnects which participate in communications via a first channel, second interconnects which participate in communications via a second channel, and third interconnects which are locally insulated from any transmitter or receiver circuitry of the die. Along a direction within a horizontal plane, the third interconnects are in an alternating arrangement with the first interconnects and the second interconnects, wherein the first interconnects and the second interconnects are on opposite sides of a line which is orthogonal to the direction. In another embodiment, along the direction, the first interconnects are successively arranged to correspond to successively greater levels of bit significance, and the second interconnects are successively arranged to correspond to successively lesser levels of bit significance.

公开(公告)号：US11557541B2

公开(公告)日：2023-01-17

申请号：US16235879

申请日：2018-12-28

Applicant: Intel Corporation

Inventor： Md Altaf Hossain ,  Ankireddy Nalamalpu ,  Dheeraj Subbareddy ,  Robert Sankman ,  Ravindranath V. Mahajan ,  Debendra Mallik ,  Ram S. Viswanath ,  Sandeep B. Sane ,  Sriram Srinivasan ,  Rajat Agarwal ,  Aravind Dasu ,  Scott Weber ,  Ravi Gutala

IPC: H01L23/538 ,  H01L25/18 ,  H01L23/00 ,  H01L23/48

Abstract: Embodiments disclosed herein include electronic packages. In an embodiment, the electronic package comprises, a package substrate, an interposer on the package substrate, a first die cube and a second die cube on the interposer, wherein the interposer includes conductive traces for electrically coupling the first die cube to the second die cube, a die on the package substrate, and an embedded multi-die interconnect bridge (EMIB) in the package substrate, wherein the EMIB electrically couples the interposer to the die.

公开(公告)号：US11552035B2

公开(公告)日：2023-01-10

申请号：US17392598

申请日：2021-08-03

Applicant: Intel Corporation

Inventor： Zhaozhi Li ,  Sanka Ganesan ,  Debendra Mallik ,  Gregory Perry ,  Kuan H. Lu ,  Omkar Karhade ,  Shawna M. Liff

IPC: H01L23/00 ,  H01L23/498

Abstract: An electronic package and method includes a substrate including a plurality of pads on a major surface. An electronic component including a plurality of pads on a major surface facing the major surface of the substrate. A stud bump electrically couples one of the plurality of pads of the substrate to one of the plurality of pads of the electronic component.

公开(公告)号：US20210391268A1

公开(公告)日：2021-12-16

申请号：US16902910

申请日：2020-06-16

Applicant: Intel Corporation

Inventor： Omkar G. Karhade ,  Nitin A. Deshpande ,  Mohit Bhatia ,  Debendra Mallik

IPC: H01L23/538 ,  H01L25/18 ,  H01L25/065 ,  H01L23/498 ,  H01L23/00 ,  H01L21/48

Abstract: Disclosed herein are microelectronic structures including bridges, as well as related assemblies and methods. In some embodiments, a microelectronic structure may include a substrate and a bridge.