INSPECTION SYSTEM AND METHOD FOR ANALYZING DEFECTS

    公开(公告)号:US20240035983A1

    公开(公告)日:2024-02-01

    申请号:US18221043

    申请日:2023-07-12

    Applicant: WiTrins s.r.o.

    Inventor: Pavel Linhart

    Abstract: An inspection system and a method for analyzing defects in a product, in particular a printed circuit board product, a semiconductor wafer or the like, the inspection system includes a projection device , an optical detection device , and a processing device, the projection device having an illuminating unit and a spectrometer member configured to split white light into its spectral components and project a multichromatic light beam thus formed from monochromatic light beams onto a product at an angle of incidence β, the optical detection device having a detection unit comprising a camera and an objective , the camera being configured to detect the multichromatic light beam reflected on the product in a detection plane of the detection unit, the detection plane being perpendicular, preferably orthogonal, to a product surface of the product, the illuminating unit having at least two light-emitting diodes disposed in a row and an exit aperture extending along the row.

    SMOKE DETECTOR WITH REGULATED CONSTANT-CURRENT CIRCUIT FOR DRIVING OPTICAL SOURCES
    125.
    发明申请
    SMOKE DETECTOR WITH REGULATED CONSTANT-CURRENT CIRCUIT FOR DRIVING OPTICAL SOURCES 有权
    具有用于驱动光源的调节恒流电路的烟雾探测器

    公开(公告)号:US20160345394A1

    公开(公告)日:2016-11-24

    申请号:US14717739

    申请日:2015-05-20

    Applicant: Google Inc.

    Abstract: Systems and methods for driving optical sources operating at different wavelengths within a smoke sensor are described herein. Multiple optical sources such as light emitting diodes may be used in a photoelectric smoke sensor to detect particles of different sizes. Photoelectric smoke sensors can operate by pulsing the LEDs and measuring a response in a light sensor. The signal measured at the light sensor changes based on the quantity of particles existing in a smoke chamber. Each optical source may have different operational characteristics and thus require different drive currents to operate. LED driving circuitry according to embodiments discussed herein provide a consistent and reliable drive current to each optical source, while maximizing efficiency of power consumption across a range of possible voltages provided by different power sources.

    Abstract translation: 这里描述了用于驱动在烟雾传感器内以不同波长工作的光源的系统和方法。 多个光源(例如发光二极管)可用于光电烟雾传感器中以检测不同尺寸的颗粒。 光电烟雾传感器可以通过脉冲发光二极管和测量光传感器中的响应来进行操作。 在光传感器处测量的信号根据烟室中存在的粒子数量而变化。 每个光源可以具有不同的操作特性,因此需要不同的驱动电流来操作。 根据本文讨论的实施例的LED驱动电路为每个光源提供一致和可靠的驱动电流,同时在由不同电源提供的可能电压的范围内最大化功率消耗的效率。

    OPTICAL ANALYZER
    126.
    发明申请
    OPTICAL ANALYZER 审中-公开
    光学分析仪

    公开(公告)号:US20160313248A1

    公开(公告)日:2016-10-27

    申请号:US15135626

    申请日:2016-04-22

    CPC classification number: G01N21/645 G01N21/255 G01N2021/641 G01N2201/06153

    Abstract: Light emitted from a light casting unit 1 including an LED as its light source is cast into a sample cell 2, and a photodetector 3 is placed at a position where the resultant passing light can be detected. The LED is driven to blink, and a data extracting section 71 extracts data obtained in a period in which the LED is turned on, as data (absorbance data) in which absorption of light by the sample solution is reflected. Moreover, in the case where a fluorescent component is contained in the sample solution, fluorescent light is emitted by the cast light serving as excitation light. Even after the excitation light ceases, the emission of the fluorescent light continues for a short time, and hence the data extracting section 71 extracts data obtained immediately after the LED is turned off, as data (fluorescence data) in which the fluorescent light is reflected. An absorbance computing section 72 calculates absorbance based on the absorbance data, and a fluorescence computing section 73 calculates fluorescence intensity based on the fluorescence data. Accordingly, it is possible to simultaneously perform an absorbance measurement and a fluorescence measurement on one sample while using one photodetector and thus simplifying the configuration of an optical system.

    Abstract translation: 从包括LED作为其光源的光铸造单元1发射的光被投射到样品池2中,并且将光电检测器3放置在可以检测所得到的通过光的位置。 LED被驱动闪烁,并且数据提取部71提取在LED被接通的时段中获得的数据作为反映样品溶液的光吸收的数据(吸光度数据)。 此外,在样品溶液中含有荧光成分的情况下,作为激发光的投射光发出荧光。 即使在激发光停止之后,荧光的发射持续很短的时间,因此数据提取部71提取在关闭LED之后立即获得的数据作为反射荧光的数据(荧光数据) 。 吸光度计算部72基于吸光度数据计算吸光度,荧光运算部73基于荧光数据计算荧光强度。 因此,可以在使用一个光电检测器的同时对一个样品进行吸光度测量和荧光测量,从而简化了光学系统的结构。

    Method and an apparatus for detecting leaded pieces of glass
    129.
    发明授权
    Method and an apparatus for detecting leaded pieces of glass 有权
    用于检测铅玻璃片的方法和装置

    公开(公告)号:US08803020B2

    公开(公告)日:2014-08-12

    申请号:US13390970

    申请日:2010-02-26

    Abstract: The invention relates to a method and an apparatus for detecting leaded pieces of glass in a single-layer material flow of objects composed predominantly of waste glass, with the objects being irradiated with substantially monochromatic UV light (3) and the fluorescent light resulting therefrom being detected.It is provided therein that the object is additionally irradiated with visible or infrared light (4); the transmission light of the visible or infrared light (4) is detected after the passage through the object; and an object is defined as containing lead if both the fluorescent light for at least one predetermined wavelength range corresponding to the fluorescence of leaded glasses is present in a predetermined intensity range and also transmission light in a predetermined intensity range with an intensity of larger zero.

    Abstract translation: 本发明涉及一种用于检测主要由废玻璃组成的物体的单层材料流中的铅玻璃的方法和装置,其中物体被基本上单色的紫外光(3)照射,并且由此产生的荧光是 检测到。 在其中设置物体另外用可见光或红外光(4)照射; 在通过物体之后检测可见光或红外光(4)的透射光; 并且如果对应于铅玻璃的荧光的至少一个预定波长范围的荧光灯存在于预定强度范围内,并且还具有强度大于零的预定强度范围内的透射光,则物体被定义为含有铅。

    APPARATUS, SYSTEM AND METHOD FOR DETECTING DEFECTS OF METALLIC LIDS
    130.
    发明申请
    APPARATUS, SYSTEM AND METHOD FOR DETECTING DEFECTS OF METALLIC LIDS 有权
    用于检测金属层缺陷的装置,系统和方法

    公开(公告)号:US20120268733A1

    公开(公告)日:2012-10-25

    申请号:US13508038

    申请日:2010-10-25

    Inventor: Massimo Balducci

    Abstract: An apparatus for detecting defects of elements to be subjected to examination, particularly metallic lids, with means for lighting an element to be subjected to examination, an image acquisition unit, and a unit for processing images acquired by said image acquisition unit is described.

    Abstract translation: 描述用于检测要检查的元件的缺陷的装置,特别是金属盖,具有用于点亮被检查元件的装置,图像获取单元和用于处理由所述图像获取单元获取的图像的单元。

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