Photodiode array for spectrometric measurements and spectrometric measurement system
    142.
    发明授权
    Photodiode array for spectrometric measurements and spectrometric measurement system 有权
    用于光谱测量和光谱测量系统的光电二极管阵列

    公开(公告)号:US09429471B2

    公开(公告)日:2016-08-30

    申请号:US14388567

    申请日:2013-03-26

    Abstract: A plurality of photodiodes arrayed in a one-dimensional form are divided into a plurality of groups. The structure of an antireflection coating is changed for each group so that all the surfaces of the photodiodes belonging to each group are covered with an antireflection coating having a transmittance characteristic which shows a maximum transmittance within a range of wavelengths of light to be received by those photodiodes. In particular, a SiO2 coating layer on the silicon substrate and an Al2O3 coating layer are common to all the photodiodes, while the structure of the upper layers are modified with respect to the wavelength. Within an ultraviolet wavelength region, the coating structure is more finely changed with respect to the wavelength. By such a design, the transmittance can be improved while making the best efforts to avoid a complex manufacturing process.

    Abstract translation: 以一维形式排列的多个光电二极管被分成多个组。 对于每组,改变抗反射涂层的结构,使得属于每个组的光电二极管的所有表面被具有透射特性的抗反射涂层覆盖,所述透射特性在其所接收的光的波长范围内显示最大透射率 光电二极管 特别地,硅衬底上的SiO 2涂层和Al 2 O 3涂层对于所有光电二极管是共同的,而上层的结构相对于波长被修饰。 在紫外线波长区域内,涂层结构相对于波长更细微地变化。 通过这样的设计,可以在尽量避免复杂的制造过程的同时,提高透射率。

    Measuring probe, an apparatus and a method for label free attenuated reflection infrared spectroscopy
    143.
    发明申请
    Measuring probe, an apparatus and a method for label free attenuated reflection infrared spectroscopy 审中-公开
    测量探针,无标签衰减反射红外光谱仪的设备和方法

    公开(公告)号:US20160143539A1

    公开(公告)日:2016-05-26

    申请号:US14936048

    申请日:2015-11-09

    Abstract: Disclosed herein is a measuring probe, an apparatus, and a method for infrared spectroscopy. In some embodiments the measuring probe may have an elongated form with a first end for coupling and decoupling infrared light into and out of the measuring probe and a second end. In other embodiments, the measuring probe may comprise an attenuated total reflection (ATR) prism arranged at the second end of the measuring probe. The ATR prism may include at least a first surface having at least one measuring portion configured to be brought in optical contact with a measured object. The ATR prism may include at least a second surface having at least one reflective portion. In some embodiments, the ATR prism may include a cutting portion for cutting through the measured object.

    Abstract translation: 本文公开了一种用于红外光谱的测量探针,装置和方法。 在一些实施例中,测量探针可以具有细长形式,其具有第一端,用于将红外光耦合和分离出测量探针和从测量探针和第二端分离。 在其他实施例中,测量探针可以包括布置在测量探针的第二端处的衰减全反射(ATR)棱镜。 ATR棱镜可以包括至少一个第一表面,该第一表面具有至少一个测量部分,该测量部分被配置为与测量对象进行光学接触。 ATR棱镜可以包括具有至少一个反射部分的至少第二表面。 在一些实施例中,ATR棱镜可以包括用于切割被测物体的切割部分。

    SPECTRAL IMAGE ACQUISITION APPARATUS AND LIGHT RECEPTION WAVELENGTH ACQUISITION METHOD
    144.
    发明申请
    SPECTRAL IMAGE ACQUISITION APPARATUS AND LIGHT RECEPTION WAVELENGTH ACQUISITION METHOD 有权
    光谱图像获取装置和光接收波长采集方法

    公开(公告)号:US20160037141A1

    公开(公告)日:2016-02-04

    申请号:US14813472

    申请日:2015-07-30

    Abstract: A spectral camera includes a wavelength variable interference filter, an imaging unit having a plurality of light receiving elements arranged in a two-dimensional array configuration, and a wavelength acquisition unit which acquires center wavelengths of light beams received by the light receiving elements in accordance with signal values output from the light receiving elements when reference light is received by the imaging unit. Light amounts of the reference light corresponding to different wavelength components in a certain wavelength range are uniform in a plane, and different signal values are acquired when light beams of the different wavelength components are received by the light receiving elements.

    Abstract translation: 光谱相机包括波长可变干涉滤光器,具有以二维阵列配置布置的多个光接收元件的成像单元和波长获取单元,其获取由光接收元件接收的光束的中心波长 当由成像单元接收参考光时从光接收元件输出的信号值。 对应于一定波长范围的不同波长分量的参考光的光量在平面内是均匀的,并且当由光接收元件接收不同波长分量的光束时,获得不同的信号值。

    PHOTODIODE ARRAY FOR SPECTROMETRIC MEASUREMENTS AND SPECTROMETRIC MEASUREMENT SYSTEM
    146.
    发明申请
    PHOTODIODE ARRAY FOR SPECTROMETRIC MEASUREMENTS AND SPECTROMETRIC MEASUREMENT SYSTEM 有权
    用于光谱测量和光谱测量系统的光电子阵列

    公开(公告)号:US20150048239A1

    公开(公告)日:2015-02-19

    申请号:US14388567

    申请日:2013-03-26

    Abstract: A plurality of photodiodes arrayed in a one-dimensional form are divided into a plurality of groups. The structure of an antireflection coating is changed for each group so that all the surfaces of the photodiodes belonging to each group are covered with an antireflection coating having a transmittance characteristic which shows a maximum transmittance within a range of wavelengths of light to be received by those photodiodes. In particular, a SiO2 coating layer on the silicon substrate and an Al2O3 coating layer are common to all the photodiodes, while the structure of the upper layers are modified with respect to the wavelength. Within an ultraviolet wavelength region, the coating structure is more finely changed with respect to the wavelength. By such a design, the transmittance can be improved while making the best efforts to avoid a complex manufacturing process.

    Abstract translation: 以一维形式排列的多个光电二极管被分成多个组。 对于每组,改变抗反射涂层的结构,使得属于每个组的光电二极管的所有表面被具有透射特性的抗反射涂层覆盖,所述透射特性在其所接收的光的波长范围内显示最大透射率 光电二极管 特别地,硅衬底上的SiO 2涂层和Al 2 O 3涂层对于所有光电二极管是共同的,而上层的结构相对于波长被修饰。 在紫外线波长区域内,涂层结构相对于波长更细微地变化。 通过这样的设计,可以在尽量避免复杂的制造过程的同时,提高透射率。

    Raman apparatus and method for real time calibration thereof
    147.
    发明授权
    Raman apparatus and method for real time calibration thereof 有权
    拉曼装置及其实时校准方法

    公开(公告)号:US08873040B2

    公开(公告)日:2014-10-28

    申请号:US13743457

    申请日:2013-01-17

    CPC classification number: G01J3/44 G01J3/0213 G01J3/28

    Abstract: A Raman spectrometer optically separates an optical signal scattered by a sample from an incident excitation light beam into an unshifted return component at a first wavelength and one or more Raman scattered components at shifted wavelengths characteristic of the sample. The unshifted return component—but not the Raman scattered components—is attenuated prior to impinging on an optical detector. The unshifted return then serves as the basis for real-time calibration to account for fluctuations in optical intensity, wavelength shift, and/or spectral peak width, based on a comparison of the unshifted return peak to a reference standard for stable reflectance.

    Abstract translation: 拉曼光谱仪将由样品散射的光信号与入射的激发光束光学分离成第一波长的未移位的返回分量和在样品特性移动波长处的一个或多个拉曼散射分量。 未移动的返回分量 - 而不是拉曼散射分量 - 在撞击光学检测器之前被衰减。 基于未固定的返回峰与稳定反射率的参考标准的比较,该无移位的返回值用作实时校准的基础,以考虑光强度,波长漂移和/或光谱峰值宽度的波动。

    TILT STRUCTURE
    148.
    发明申请
    TILT STRUCTURE 审中-公开
    倾斜结构

    公开(公告)号:US20140312213A1

    公开(公告)日:2014-10-23

    申请号:US14320935

    申请日:2014-07-01

    Abstract: A tilt structure includes a shaft section formed on a substrate section, a tilt structure film having one end formed on an upper surface of the shaft section, and the other end bonded to the substrate section, and a thin film section provided to the tilt structure film, located on a corner section composed of the upper surface of the shaft section and a side surface of the shaft section, and having a film thickness thinner than the tilt structure film, the tilt structure film is bent in the thin film section, and an acute angle is formed by the substrate section and the tilt structure film.

    Abstract translation: 倾斜结构包括形成在基板部分上的轴部分,倾斜结构膜,其一端形成在轴部分的上表面上,另一端接合到基板部分;以及薄膜部分,设置在倾斜结构 薄膜,位于由所述轴部的上表面构成的角部和所述轴部的侧面之间,并且具有比所述倾斜结构膜更薄的膜厚,所述倾斜结构膜在所述薄膜部弯曲,并且 由基板部和倾斜结构膜形成锐角。

    Echelle spectrometer arrangement using internal predispersion
    149.
    发明授权
    Echelle spectrometer arrangement using internal predispersion 有权
    Echelle光谱仪布置使用内部预分散

    公开(公告)号:US08681329B2

    公开(公告)日:2014-03-25

    申请号:US13147190

    申请日:2010-01-25

    Abstract: An Echelle spectrometer arrangement (10) with internal order separation contains an Echelle grating (34) and a dispersing element (38) for order separation so that a two-dimensional spectrum having a plurality of separate orders (56) can be generated, an imagine optical system (18, 22, 28, 46), a flat-panel detector (16), and predispersion means (20) for predispersing the radiation into the direction of traverse dispersion of the dispersion element (38). The arrangement is characterized in that the predispersion means (20) comprise a predispersion element which is arranged along the optical path behind the inlet spacing (12) inside the spectrometer arrangement. The imaging optical system is designed in such a manner that the predispersed radiation can be imaged onto an additional image plane (24) which does not have any boundaries in the predispersion direction and which is arranged along the optical path between the predispersion element (20) and the echelle grating (34). Optical means (20, 68) in the area of the predispersed spectrum are arranged to influence the spatial and/or the spectral beam density distribution on the detector (16).

    Abstract translation: 具有内部顺序分离的Echelle光谱仪装置(10)包含Echelle光栅(34)和分散元件(38),用于顺序分离,使得可以产生具有多个分开的阶数(56)的二维光谱, 光学系统(18,22,28,46),平板检测器(16)和用于将辐射预分散到分散元件(38)的横向分散方向的预分散装置(20)。 该装置的特征在于,预分散装置(20)包括预分散元件,该预分散元件沿着光谱仪装置内的入口间隔(12)的光路布置。 成像光学系统被设计成使得预分散的辐射可以被成像到在预分散方向上没有任何边界并且沿着预分散元件(20)之间的光路布置的附加图像平面(24)上, 和梯形光栅(34)。 在预分散频谱的区域中的光学装置(20,68)被布置成影响检测器(16)上的空间和/或光谱光束密度分布。

    Spectrometer Devices
    150.
    发明申请
    Spectrometer Devices 审中-公开
    光谱仪器

    公开(公告)号:US20140061486A1

    公开(公告)日:2014-03-06

    申请号:US13773108

    申请日:2013-02-21

    Abstract: A spectrometer can include a plurality of semiconductor nanocrystals. Wavelength discrimination in the spectrometer can be achieved by differing light absorption and emission characteristics of different populations of semiconductor nanocrystals (e.g., populations of different materials, sizes or both). The spectrometer therefore can operate without the need for a grating, prism, or a similar optical component. A personal UV exposure tracking device can be portable, rugged, and inexpensive, and include a semiconductor nanocrystal spectrometer for recording a user's exposure to UV radiation. Other applications include a personal device (e.g. a smartphone) or a medical device where a semiconductor nanocrystal spectrometer is integrated.

    Abstract translation: 光谱仪可以包括多个半导体纳米晶体。 可以通过不同的半导体纳米晶体群体(例如不同材料,大小或两者的群体)的不同的光吸收和发射特性来实现光谱仪中的波长鉴别。 因此,光谱仪可以在不需要光栅,棱镜或类似的光学部件的情况下操作。 个人UV曝光跟踪装置可以便携,坚固且便宜,并且包括用于记录用户暴露于紫外线辐射的半导体纳米晶体光谱仪。 其他应用包括集成了半导体纳米晶体光谱仪的个人设备(例如,智能电话机)或医疗设备。

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