Abstract:
분광 측색 장치는 측벽을 포함하는 하우징을 포함한다. 측벽의 외측 면은 리니어 센서를 조정면에 부착한 상태에서, 이동됨으로써 리니어 센서의 위치를 조정할 수 있는 조정면이다. 리니어 센서는 조정면에 맞닿은 상태에서 하우징의 측벽에 의해 지지되고, 오목면 반사형 회절 소자에 의해 분광되어 개구부를 통과하는 광속을 수광한다. 조정면은 오목면 반사형 회절 소자의 로우랜드 원 중 리니어 센서가 수광하는 광속이 통과하는 부분에 있어서의 접선과 평행한다.
Abstract in simplified Chinese:一种光学设备包括:一影像形成光学系统,其形成来自一对象之光之一影像;一成像单元,其接收借由该影像形成光学系统形成之该影像之光;一反射分光设备,其覆盖该成像单元之一成像区域中之一给定区域;及一光谱侦测单元,其侦测借由该反射分光设备反射之光的一分光光谱。
Abstract in simplified Chinese:本发明提供一种显微光谱设备,可用于连接于一取像模块上,该取像模块用以将外界影像之光线转为电信号,该显微光谱设备包含一显微镜组、一光谱分析模块,以及一分光组件。该显微镜组可用以将外界影像之光线传递给该取像模块并放大该外界影像。该光谱分析模块设置于该显微镜组之一侧。该分光组件设置于该显微镜组及该取像模块之间,用以将部分该显微镜组取得之外界影像之光线导入该光谱分析模块中。此外,本发明更提供一种以上述显微光谱设备为基础之显微光谱取像设备。
Abstract:
Apparatus and methods are described for performing tear film structure measurement on a tear film of an eye of a subject. A broadband light source (100) is configured to generate broadband light. A spectrometer (250) is configured to measure a spectrum of light of the broadband light that is reflected from at least one spot on the tear film, the spot having a diameter of between 100 microns and 240 microns. A computer processor (28) is coupled to the spectrometer and configured to determine a characteristic of the tear film based upon the spectrum of light measured by the spectrometer. Other applications are also described.
Abstract:
A method for comprehensively analyzing and/or evaluating cigarette burning quality index is disclosed. The steps include collecting cigarette burning quality index data, filtering the cigarette burning quality index data, standardizing cigarette data, and measuring cigarette burning quality. The importance of the cigarette burning quality indicators can also be evaluated. The method for comprehensively analyzing and/or evaluating cigarette burning quality indicators can reflect general laws more accurately by maintaining the sample distribution through a singularity detection method, and analyzing correlations of each index with cigarette performance from multiple perspectives, to fuse them into a comprehensive measurement value. The importance ranking and weight of indicators can be obtained more completely and stably.
Abstract:
Abstract: Systems and methods for metrology of workpieces such as wafers, using spectrometry of multi- spot- arrays formed over a test area of the tester workpiece, for optically measuring characteristics of the tested workpiece, where the optical metrology system is configured such that the distribution of energy density or flux of the multi-spot-array over the test area of the tested workpiece is such that prevents affecting the workpiece during its testing.
Abstract:
A method for setting, within an observed image of a sample, an analysis target region that is a region on which an analysis is to be performed by an analyzer, the method including displaying the observed image of the sample on the display, dividing the observed image into a plurality of divisional areas, calculating a predetermined image characteristic quantity in each of the plurality of divisional areas, designating at least two of the divisional areas of the observed image displayed on the display, calculating a distribution of the values of the image characteristic quantity of the designated divisional areas, determining a value range of the image characteristic quantity for the divisional areas to be extracted as the analysis target region, based on the calculated distribution, and extracting from the observed image each of the plurality of divisional areas having a value of the image characteristic quantity within the value range.
Abstract:
Wide spectrum optical systems and devices are provided for use in multispectral imaging systems and applications, and in particular, wide spectrum optical assemblies are provided which are implemented using low cost, first surface mirrors in an optical framework that enables real-time viewing of an image in multiple spectral bands simultaneously over the same optical centerline with one main optical element.