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    Echelle spectrometer with a shaped oriented slit
    161.
    发明授权
    Echelle spectrometer with a shaped oriented slit 失效
    Echelle光谱仪具有成形定向的狭缝

    公开(公告)号：US5719672A

    公开(公告)日：1998-02-17

    申请号：US721148

    申请日：1996-09-26

    Applicant: Ring-Ling Chien

    Inventor： Ring-Ling Chien

    IPC: G21K1/06 ,  G01J3/18 ,  G02B5/18 ,  G01J3/04

    CPC classification number: G01J3/1809 ,  G01J3/189

    Abstract: An improved echelle spectrometer comprises a slit in light blocking plate, an echelle grating, and a detector array. The slit is shaped and oriented to align an image of a light beam projected through the slit, onto the echelle grating and onto the detector in a desired orientation and shape relative to the detector array. Precise adjustment of the shape and orientation of the slit is dependent on the orientation of the detector with respect to the dispersion direction of the echelle grating. The echelle spectrometer provides high detector resolution with reduced read-out time.

    Abstract translation: 改进的电子光谱仪包括遮光板中的狭缝，梯形光栅和检测器阵列。 狭缝被成形并定向成使得通过狭缝投射的光束的图像以相对于检测器阵列的期望的取向和形状对准到梯形光栅并且到达检测器上。 狭缝的形状和取向的精确调整取决于检测器相对于梯形光栅的色散方向的取向。 梯形光谱仪提供高检测器分辨率，减少读出时间。

    Continuum source atomic absorption spectrometry
    162.
    发明授权
    Continuum source atomic absorption spectrometry 失效
    连续原子吸收光谱法

    公开(公告)号：US5018856A

    公开(公告)日：1991-05-28

    申请号：US428529

    申请日：1989-10-30

    Applicant: James M. Harnly ,  Gary P. Moulton ,  Thomas C. O'Haver

    Inventor： James M. Harnly ,  Gary P. Moulton ,  Thomas C. O'Haver

    IPC: G01J3/20 ,  G01J3/28 ,  G01J3/42 ,  G01N21/31 ,  G01N21/74

    CPC classification number: G01J3/1809 ,  G01J3/20 ,  G01J3/42 ,  G01N21/3103 ,  G01J3/2803 ,  G01N21/74

    Abstract: The instant invention relates to a process and apparatus for atomic absorption analysis, utilizing: atomization of a sample (containing one or more elements), illuminating the atomized sample with a continuum light source to produce a resultant light, directing the resultant light through a light dispersing means, detection of light at the focal plane of the light dispersing means using an integrating array detector (e.g. linear photodiode array) for converting the incident light into amplified electrical signals, blocking the incident light from striking the detector means and during this blocking utilizing the detector means to convert integrated intensities into amplified electrical signals, and deriving from these signals a value proportional to concentration. The present invention permits the aforementioned analysis to be performed at a very high rate i.e. at least 40 times per second.

    Abstract translation: 本发明涉及用于原子吸收分析的方法和装置，其利用：样品的雾化（含有一种或多种元素），用连续光源照射雾化样品以产生所得光，将所得光引导通过光 分散装置，使用用于将入射光转换成放大的电信号的积分阵列检测器（例如线性光电二极管阵列）检测光分散装置的焦平面处的光，阻止入射光撞击检测器装置，并在该阻挡期间利用 检测器意味着将集成的强度转换成放大的电信号，并从这些信号中得出与浓度成比例的值。 本发明允许以非常高的速率进行上述分析，即每秒至少40次。

    Device for the investigation of highly resolved partial spectra of an echelle spectrum
    163.
    发明授权
    Device for the investigation of highly resolved partial spectra of an echelle spectrum 失效
    用于调查échelle光谱的高度分辨的部分光谱的装置

    公开(公告)号：US4940325A

    公开(公告)日：1990-07-10

    申请号：US320674

    申请日：1989-03-08

    Applicant: Helmut Becker-Ross ,  Stefan Florek ,  Reinhard Tischendorf ,  Klaus-Eberhard Engel ,  Wolf-Ekkehard Matzke ,  Susanne Engel

    Inventor： Helmut Becker-Ross ,  Stefan Florek ,  Reinhard Tischendorf ,  Klaus-Eberhard Engel ,  Wolf-Ekkehard Matzke ,  Susanne Engel

    IPC: G01J3/18 ,  G01J3/28

    CPC classification number: G01J3/1809 ,  G01J3/2803

    Abstract: The invention refers to a device for investigating highly resolved partial spectra of an echelle spectrum, being applicable to the simultaneous determination of the intensities of different spectral elements of a radiation spectrum produced by an echelle spectrometer. The device consists of a position-resolving photoelectric detector including several photosensors arranged on an IC chip, where said photosensors are arranged on the chip surface discretely at the positions of preselected spectral lines, each of the photosensors consisting of a CCD sensor row and a logic circuit which, depending on activation levels, enables supply potentials and clock signals to be connected and output signals to be transferred to a common output signal line; the areas of the individual sensor elements of the CCD sensor rows being matched to the spectral elements of the echelle spectrum and extending successively in the direction of dispersion of the echelle grating; the total number of sensor elements of all CCD sensor rows on the chip being smaller than the number of spectral elements in the echelle spectrum; and a digital logic circuit enabling, by means of the activation levels managed by it, the serial readout of the signals from a selsotable subset of all CCD sensor rows in a selectable order of succession, via the common output signal line, depending on external control signals.

    Abstract translation: 本发明涉及一种用于研究échelle光谱的高度分辨的部分光谱的装置，其适用于同时确定由échelle光谱仪产生的辐射光谱的不同光谱元素的强度。 该装置包括位置分辨光电检测器，其包括布置在IC芯片上的几个光电传感器，其中所述光电传感器分散地布置在芯片表面上的预选光谱线的位置处，每个光电传感器由CCD传感器行和逻辑 取决于激活电平使得电源电位和时钟信号被连接并且输出信号被传送到公共输出信号线的电路; CCD传感器行的各个传感器元件的区域与échelle光谱的光谱元件匹配并且沿着échelle光栅的色散方向连续延伸; 芯片上所有CCD传感器行的传感器元件的总数小于échelle光谱中的光谱元素的数量; 以及数字逻辑电路，通过其所管理的激活电平，可以根据外部控制通过公共输出信号线从所有CCD传感器行的可控子集以可选择的顺序读取信号 信号。

    Beam combining apparatus
    164.
    发明授权
    Beam combining apparatus 失效
    光束组合装置

    公开(公告)号：US4135820A

    公开(公告)日：1979-01-23

    申请号：US846509

    申请日：1977-10-28

    Applicant: Udo W. Drews ,  Norman Shifrin

    Inventor： Udo W. Drews ,  Norman Shifrin

    IPC: G01J3/08 ,  G01J3/18 ,  G01J3/42 ,  G02B27/14 ,  G01J3/02

    CPC classification number: G02B27/147 ,  G01J3/42 ,  G02B27/1006 ,  G02B27/143 ,  G01J3/08 ,  G01J3/1809

    Abstract: A pair of optical beams of radiant energy from separate paths in a spectrophotometer are coaxially merged into a single composite beam with an optical member which resembles a coarse echelette grating. A reflective surface which includes the surfaces of sidewalls within a plurality of parallel grooves is disposed on the optical member. The grooves are arranged in a lateral array and are generally V-shaped cross-sectionally. The beams to be combined are directed upon the sidewalls and the composite beam is emitted therefrom in accordance with the law of reflection. When the beams to be combined include non-collimated rays, shadowing is provided by the portion of the optical member between adjoining sidewalls of adjacent grooves to reduce flare. Furthermore, image aberrations as caused by off-axis operation due to use of a spherical mirror in the beam combining arrangement, are substantially corrected by the optical member.

    Abstract translation: 在分光光度计中的来自分离路径的一对辐射能量的光束被同轴地合并成单个复合束，其具有类似于粗小行星光栅的光学构件。 包括在多个平行凹槽内的侧壁表面的反射表面设置在光学构件上。 凹槽布置成横向阵列，并且横截面通常为V形。 要组合的光束被引导到侧壁上，并且根据反射定律从其发射合成光束。 当待组合的光束包括非准直射线时，光学构件的部分在相邻凹槽的相邻侧壁之间提供阴影以减少耀斑。 此外，由于在光束组合装置中使用球面镜由离轴操作引起的图像像差被光学构件基本上校正。

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