Abstract:
An improved spectrometer comprises a slit in light blocking plate, an echelle grating, and a detector array. The slit is shaped and oriented to align an image of a light beam projected through the slit, onto the echelle grating and onto the detector in a desired orientation and shape relative to the detector array. Precise adjustment of the shape and orientation of the slit is dependent on the orientation of the detector with respect to the dispersion direction of the echelle grating. The spectrometer provides high detector resolution with reduced read-out time.
Abstract:
An x-y coordinate is set on the surface of diffraction grating 3 with non-uniformly spaced grooves and expressed by the following series expansion which is a groove function describing a point (w,l) on the nth groove from the origin: 1 n = 1 null null null i , j null n i null null null j null w i null l j null null null ( i + j null 1 ) The focal length (r0null) and the expansion coefficient nij in this series expansion are so determined that all expanded terms Fij in the following optical path function are zero at a desired wavelength: 2 F = null i , j null F i null null null j null w i null l j = null i , j null [ M i null null null j + ( m null null null null null ) null n i null null null j ] null w i null l j null null null ( i + j > 0 ) the optical path being for the light that passes through entrance slit 1 to be reflected by concave mirror 2 and diffracted at a point (w,l) on the surface of diffraction grating 3 before it reaches exit slit 4. The positions of two point light sources C5 and D6 in a holographic recording system are so determined as to realize the required value of nij.
Abstract:
The invention relates to an optical spectrometer that has an astigmatic aberration and contains a grating for the dispersion in a first dispersion direction and a second dispersing element for the dispersion in a second dispersion direction which, together with the first dispersion direction, forms an angle. A collimating mirror, a camera mirror and an entrance slit arrangement are provided. A first entrance slit and a second entrance slit are provided for defining bundles. The entrance slits are arranged in such a way that the sagittal image of the first entrance slit and the meridional image of the second entrance slit coincide in an image plane of the spectrometer. The grating can be illuminated at an off-plane angle and the first and the second entrance slits are arranged on the optical axis, whereby said slits enclose an angle that is different from 90 DEG C. The first and the second distances from the entrance slits to the collimating mirror and the angle of the first entrance slit around the optical axis can be selected in such a way that the sagittal image points for all bundles which extend through the first entrance slit are essentially represented in a line in the image plane of the spectrometer. Said line extends in a basically vertical manner in relation to the first dispersion direction.
Abstract:
Methods and systems for performing simultaneous spectroscopic measurements of semiconductor structures over a broad range of angles of incidence (AOI), azimuth angles, or both, are presented herein. Spectra including two or more sub-ranges of angles of incidence, azimuth angles, or both, are simultaneously measured over different sensor areas at high throughput. Collected light is linearly dispersed across different photosensitive areas of one or more detectors according to wavelength for each subrange of AOIs, azimuth angles, or both. Each different photosensitive area is arranged on the one or more detectors to perform a separate spectroscopic measurement for each different range of AOIs, azimuth angles, or both. In this manner, a broad range of AOIs, azimuth angles, or both, are detected with high signal to noise ratio, simultaneously. This approach enables high throughput measurements of high aspect ratio structures with high throughput, precision, and accuracy.
Abstract:
An improved echelle spectrometer comprises a slit in light blocking plate, an echelle grating, and a detector array. The slit is shaped and oriented to align an image of a light beam projected through the slit, onto the echelle grating and onto the detector in a desired orientation and shape relative to the detector array. Precise adjustment of the shape and orientation of the slit is dependent on the orientation of the detector with respect to the dispersion direction of the echelle grating. The echelle spectrometer provides high detector resolution with reduced read-out time.
Abstract:
A constant deviation monochromator with a holographically formed concave grating and entrance and exit slits positioned on opposite sides of the plane including the Rowland circle of the grating, wherein the grating has been formed by using two coherent light sources positioned on the same side of the Rowland plane, whereby aberrations and stray light are substantially reduced.