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    SIMULTANEOUS OVERLAPPING ORDER SPECTRAL IMAGER AND METHOD
    4.
    发明申请
    SIMULTANEOUS OVERLAPPING ORDER SPECTRAL IMAGER AND METHOD 审中-公开
    同时重叠阶谱成像仪与方法

    公开(公告)号：WO2018057093A1

    公开(公告)日：2018-03-29

    申请号：PCT/US2017/042850

    申请日：2017-07-19

    Applicant: RAYTHEON COMPANY

    Inventor： SILNY, John, F. ,  FLANDERS, Bradley, A.

    IPC: G01J3/18 ,  G01J3/28 ,  G01J3/12

    CPC classification number: G01J3/2823 ,  G01J3/18 ,  G01J3/2803 ,  G01J2003/1204 ,  G01J2003/1273 ,  G01J2003/2826

    Abstract: An imaging spectrometer and method are provided. In one example, the imaging spectrometer includes foreoptics positioned to receive electromagnetic radiation from a scene, a diffraction grating positioned to receive the electromagnetic radiation from the foreoptics and configured to disperse the electromagnetic radiation into a plurality of spectral bands, each spectral band corresponding to a diffraction grating order of the diffraction grating, and a single- band focal plane array configured to simultaneously receive from the diffraction grating overlapping spectra corresponding to at least two diffraction grating orders.

    Abstract translation: 提供了一种成像光谱仪和方法。 在一个示例中，成像光谱仪包括定位成接收来自场景的电磁辐射的前视镜，定位成接收来自前视镜的电磁辐射并且被配置成将电磁辐射分散成多个光谱带的衍射光栅，每个光谱带对应于 衍射光栅的衍射光栅阶数和配置成同时从衍射光栅接收对应于至少两个衍射光栅阶数的重叠光谱的单波段焦平面阵列。

    TECHNIQUE AND APPARATUS FOR SPECTROPHOTOMETRY USING BROADBAND FILTERS
    5.
    发明公开
    TECHNIQUE AND APPARATUS FOR SPECTROPHOTOMETRY USING BROADBAND FILTERS 审中-公开

    公开(公告)号：EP3356774A1

    公开(公告)日：2018-08-08

    申请号：EP16886644.0

    申请日：2016-12-01

    Applicant: Iism Inc.

    Inventor： JIN, Seung Min ,  YANG, Il Seung ,  BAE, Yun Mi ,  PARK, Seong Oak ,  KIM, Yu Sic ,  CHOI, Du Cheon ,  HAN, Mu Hyeop

    IPC: G01J3/02 ,  G01J3/12

    CPC classification number: G01J3/2803 ,  G01J3/0208 ,  G01J3/0218 ,  G01J3/0289 ,  G01J3/12 ,  G01J2003/1204

    Abstract: A spectrophotometer is provided, which comprises a receiving part diffusing an incident light, a first broadband filter group, and a detector detecting the light having passed through the first broadband filter group, in order to easily select and detect a plurality of lights having specific wavelengths, wherein the first broadband filter group comprises a first broadband filter arranged to have a first angle with respect to an incident direction of light to enable the incident light to pass through a first wavelength band, a second broadband filter arranged to have a second angle, which is different from the first angle, with respect to an incident direction of light to enable the light having passed through the first broadband filter to pass through a second wavelength band, and a first path compensation means for adjusting a path of the light having passed through the second broadband filter to be identical to a path of the light having passed through the first broadband filter, wherein the first broadband filter, the second broadband filter and the first path compensation means are arranged in series with respect to the incident direction of light. Accordingly, it is possible to increase the efficiency of the outputted light compared to the incident light, and to detect a plurality of lights having the desired specific wavelengths at the same time.

    KONFOKALES SPEKTROMETER UND VERFAHREN ZUR BILDGEBUNG IN EINEM KONFOKALEN SPEKTROMETER
    7.
    发明公开
    KONFOKALES SPEKTROMETER UND VERFAHREN ZUR BILDGEBUNG IN EINEM KONFOKALEN SPEKTROMETER 审中-公开
    共焦光谱仪和方法成像共焦光谱仪

    公开(公告)号：EP2764336A1

    公开(公告)日：2014-08-13

    申请号：EP12769970.0

    申请日：2012-09-06

    Applicant: Siemens Aktiengesellschaft

    Inventor： SCHICK, Anton

    IPC: G01J3/28 ,  G02B21/00

    CPC classification number: G01J3/2803 ,  G01J3/2823 ,  G01J2003/1204 ,  G01J2003/1208 ,  G02B21/0044

    Abstract: The invention relates to a confocal spectrometer comprising a broadband light source, a first aperture device arranged rotatably in front of the light source and having a structured arrangement of a plurality of through holes, which is designed to illuminate by means of the light source the visual field of an object to be imaged, an imaging optical system that is designed to focus an image of the structured arrangement of the plurality of through holes onto the object, a dispersion element that is designed to spectrally disperse the light reflected by the object along a dispersion axis perpendicular to the optical axis of the imaging optical system, and a detector device that is designed to capture the spectrally dispersed reflected light for producing a spectrally resolved image of the object.

    APPARATUS FOR CARRYING OUT SPECTRAL ANALYSIS OF AN OPTICAL LIGHT SOURCE USING IMAGE DETECTION AND SEPARATION OF SPECIAL SPECTRAL ORDERS
    9.
    发明公开
    APPARATUS FOR CARRYING OUT SPECTRAL ANALYSIS OF AN OPTICAL LIGHT SOURCE USING IMAGE DETECTION AND SEPARATION OF SPECIAL SPECTRAL ORDERS 失效
    一种用于执行光学光谱光源使用特定的光谱系统的照片，并分离

    公开(公告)号：EP0764262A1

    公开(公告)日：1997-03-26

    申请号：EP95919724.0

    申请日：1995-05-15

    Applicant: LINDBLOM, Peter

    Inventor： LINDBLOM, Peter

    IPC: G01J3

    CPC classification number: G01J3/16 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/18 ,  G01J3/24 ,  G01J2003/1204 ,  G01J2003/1828

    Abstract: An apparatus for carrying out spectral analysis of optical radiation emitted from a light source (11) comprises a spectral detector (1) having an entrance aperture (10) for the radiation from thelight source (11), a first imaging optical component (12), a diffraction grating (14) for wavelength dispersion of the radiation, order sorting means (131, 132) for separation of the spectral orders of the diffraction grating (14), a second imaging optical component (15), and a detecting unit (16) for registration of the light source spectrum divided into order spectra through the order sorting means (131, 132). The order sorting means (131, 132) comprise at least two refractive optical components manufactured from different material. The two refractive optical components (131 and 132) together with the diffraction grating (14) and the imaging optical components (12 and 15) produce a substantially uniform distribution of the order spectra on the detector unit (16). Favourably the order sorting means (131, 132), the diffraction grating (14) and the imaging optical components (12, 15) also co-act to produce a substantially stigmatic image of the entrance aperture (10) in at least one point on the detector unit (16).

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