Abstract:
An apparatus for obtaining information regarding a biological structure(s) can include, for example a light guiding arrangement which can include a fiber through which an electromagnetic radiation(s) can be propagated, where the electromagnetic radiation can be provided to or from the structure. An at least partially reflective arrangement can have multiple surfaces, where the reflecting arrangement can be situated with respect to the optical arrangement such that the surfaces thereof each can receive a(s) beam of the electromagnetic radiations instantaneously, and a receiving arrangement(s) which can be configured to receive the reflected radiation from the surfaces which include speckle patterns.
Abstract:
The embodiments herein relate to a system (100) for analyzing a fluid (103). The system (100) comprises a light source (110) configured to emit light for transmission through a first optical transmission means (107a) to a measurement device (105). The measurement device (105) comprises at least a part of the fluid (103) and is configured to be illuminated by the emitted light. The system comprises a second optical transmission means (107b) configured to transmit shadowed or reflected light from the fluid (103) when the measurement device (105) is illuminated to an image capturing device. The image capturing device (113) is configured to capture an image of the fluid (103) in the measurement device (105) based on the transmitted information about the fluid (103). The light source (110) and the one or more image capturing device (113) are remotely arranged from the at least one measurement device (105).
Abstract:
An analytical instrument may have multiple distinct channels. Such may include one or more illumination sources and sensors. Illumination may be delivered to specific locations of a specimen holder, and returned illumination may be delivered to specific locations of a sensor array. Illumination may first pass a specimen, and a mirror or reflector may then return the illumination past the specimen. Optical splitters may be employed to couple pairs of fiber optics proximate a specimen holder. Such channels may further include a plurality of illumination sources positioned on one side of a specimen holder and a plurality of sensors on the other side. The plurality of sensor may capture image of a specimen and a spectrophotometer may concurrently scan the specimen. A plurality of specimens may be imaged and scanned in a single pass of a plurality of passes. Spherical or ball lenses may be placed in an optical path of the illumination to achieve a desired illumination pattern.
Abstract:
Photovoltaic thin film quality control is obtained where the thin film is supported by a support and a section of the film is illuminated by a polychromatic illumination source. The source forms on the thin film a continuous illuminated line. Discrete sampled points located on the illuminated line are imaged onto a two dimensional optical switch. A concordance look-up-table between the coordinates of the above sampled points on the thin film and their coordinates on the two dimensional optical switch are generated. The spectral composition of the illumination reflected by the sampled points is determined and photovoltaic thin film parameters applicable to the quality control are derived from the spectral composition of reflected or transmitted by the photovoltaic thin film illumination.
Abstract:
A device (1) for imaging the interior of an optically turbid medium is provided. The device comprises a receptacle (3; 103) structured to accommodate an optically turbid medium for examination and an optically matching medium filling a space between an inner surface (6; 106) of the receptacle (3; 103) and the optically turbid medium. The device comprises at least one light source generating light to be coupled into the receptacle (3; 103) and at least one detector for detecting light emanating from the receptacle (3; 103). A coupling surface (10; 110) optically coupled to the inner surface (6; 106) of the receptacle and a coupling member (11; 111) optically coupled to the light source and the detector are provided. The coupling surface (10; 110) and the coupling member (11; 111) are movable to a plurality of different positions relative to each other and structured to establish an optical connection from the light source to the inner surface (6; 106) of the receptacle and from the inner surface (6; 106) of the receptacle to the at least one detector in the plurality of different positions.
Abstract:
A system and method for measuring fluorescence lifetimes utilizing a light source modulated with a code sequence to interrogate a sample of interest. The system is useful for studying the interaction of chemicals, biomolecules, and other substances. The fluorescence lifetime is used as an indicator of chemical binding and chemical environment. A system and method for measuring photons. The system produces an estimate of the distribution of flight times for photons traveling from the source to the detector. A system and method for optical lymph node mapping. A correlation of a photo-detector signal and a digital code sequence, used to modulated light signal, is calculated to produce an estimate of the distribution of flight times for photons traveling from a given source to a given detector. These distributions are used along with the measured amplitudes to reconstruct a map of contrast agent location within the tissue.
Abstract:
The claimed method and system uses a hand-held based optical process to image large tissue volumes using a flexible probe head, increased data acquisition using multi-source illumination and multi-detector sensing, and tomographic reconstruction of sub-surface structures of a target object using ultrasonic tracking facilities.
Abstract:
The present invention is directed to solving the problems associated with the detection of surface defects on metal bars as well as the problems associated with applying metal flat inspection systems to metal bars for non-destructive surface defects detection. A specially designed imaging system, which is comprised of a computing unit, line lights and high data rate line scan cameras, is developed for the aforementioned purpose. The target application is the metal bars (1) that have a circumference/cross-section-area ratio equal to or smaller than 4.25 when the cross section area is unity for the given shape, (2) whose cross-sections are round, oval, or in the shape of a polygon, and (3) are manufactured by mechanically cross-section reduction processes. The said metal can be steel, stainless steel, aluminum, copper, bronze, titanium, nickel, and so forth, and/or their alloys. The said metal bars can be at the temperature when they are being manufactured. A removable cassette includes various mirrors. A protection tube isolates the moving metal bar from the line light assembly and image acquisition camera. assembly and image acquisition camera. A contaminant reduction mechanism applies a vacuum to remove airborne contaminants.
Abstract:
Fast on-line electro-optical detection of wafer defects by illuminating with a short light pulse from a repetitively pulsed laser, a section of the wafer while it is moved across the field of view of an imaging system, and imaging the moving wafer onto a focal plane assembly, optically forming a continuous surface of photo-detectors at the focal plane of the optical imaging system. The continuously moving wafer is illuminated by a laser pulse of duration significantly shorter than the pixel dwell time, such that there is effectively no image smear during the wafer motion. The laser pulse has sufficient energy and brightness to impart the necessary illumination to each sequentially inspected field of view required for creating an image of the inspected wafer die. A novel fiber optical illumination delivery system, which is effective in reducing the effects of source coherence is described. Other novel aspects of the system include a system for compensating for variations in the pulse energy of a Q-switched laser output, methods for autofocussing of the wafer imaging system, and novel methods for removal of repetitive features of the image by means of Fourier plane filtering, to enable easier detection of wafer defects.